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1.发明授权公开(公告)号：US07933441B2
公开(公告)日：2011-04-26
申请号：US11259251
申请日：2005-10-27
Applicant: Shouhei Numata , Tarou Takagi , Noriyuki Sadaoka
Inventor： Shouhei Numata , Tarou Takagi , Noriyuki Sadaoka
IPC: G06K9/00
CPC classification number: G06T7/0004 , G01N23/046 , G01N2223/419 , G06T7/66 , G06T2207/30164
Abstract: It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.
Abstract translation: 可以使用诸如X射线CT数据的空间离散数据进行内部缺陷检查，具有更高的精度。 一种用于通过使用空间元素来描述物体的空间形状和结构的空间离散数据来检查物体内部缺陷的内部缺陷检查方法包括以下步骤：通过使用内部空间从空间离散数据中提取内部缺陷 缺陷提取单元，通过使用相关的元素收集单元收集包含在邻近范围内的元素，其作为相关元素以围绕由内部缺陷提取单元提取的内部缺陷的预定分布设置; 并且通过使用特征量测量单元，基于由相关元件收集单元收集的相关元素来测量诸如内部缺陷的重心的大小和位置的特征量。
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公开(公告)号：US20050104904A1
公开(公告)日：2005-05-19
申请号：US10998715
申请日：2004-11-30
Applicant: Shouhei Numata , Tarou Takagi
Inventor： Shouhei Numata , Tarou Takagi
CPC classification number: G06T3/00 , G01N23/04 , G06F3/1415 , G06T15/00 , G09G5/39 , G09G2340/0407 , Y10S378/901
Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.
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公开(公告)号：US07394922B2
公开(公告)日：2008-07-01
申请号：US11714200
申请日：2007-03-06
Applicant: Shouhei Numata , Tarou Takagi
Inventor： Shouhei Numata , Tarou Takagi
IPC: G06K9/00
CPC classification number: G06T3/00 , G01N23/04 , G06F3/1415 , G06T15/00 , G09G5/39 , G09G2340/0407 , Y10S378/901
Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.
Abstract translation: 一种数据处理装置，包括用于显示数据的显示装置; 用于记录大容量位图数据的第一记录装置; 所述第二记录装置记录形成为通过渲染大容量位图数据而获得的二维图像的索引数据; 所述第一数据处理装置用于从所述第一记录装置读取大容量位图数据，并将所述图像处理应用于所述大容量位图数据; 第二数据处理装置，用于从第一记录装置读取大容量位图数据，通过渲染大容量位图数据并将图像数据传送到显示装置，形成二维图像数据; 所述第三数据处理装置用于将所述索引数据发送到所述显示装置; 以及用于将指令发送到第一，第二和第三数据处理设备的输入设备。
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公开(公告)号：US07228254B2
公开(公告)日：2007-06-05
申请号：US11206929
申请日：2005-08-19
Applicant: Shouhei Numata , Noriyuki Sadaoka , Tarou Takagi
Inventor： Shouhei Numata , Noriyuki Sadaoka , Tarou Takagi
IPC: G06F15/00
CPC classification number: G06T7/55 , G06T17/10 , G06T2207/10081 , G06T2207/30164
Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.
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5.发明授权X-ray sensor signal processor and X-ray computed tomography system using the same 有权X射线传感器信号处理器和X射线计算机断层摄影系统使用相同公开(公告)号：US06975700B2
公开(公告)日：2005-12-13
申请号：US10864641
申请日：2004-06-10
Applicant: Hiroshi Kamimura , Shigeru Izumi , Hiroshi Kitaguchi , Atsushi Yamagoshi , Katsutoshi Satoh , Noriyuki Sadaoka , Tarou Takagi , Kouji Kuwabara , Shouhei Numata
Inventor： Hiroshi Kamimura , Shigeru Izumi , Hiroshi Kitaguchi , Atsushi Yamagoshi , Katsutoshi Satoh , Noriyuki Sadaoka , Tarou Takagi , Kouji Kuwabara , Shouhei Numata
CPC classification number: H04N5/32 , G01N23/046 , G01N2223/419 , G06F19/00 , G06Q50/22 , G06Q50/24 , H04N5/361 , Y10S378/901
Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor, and an integration circuit for integrating the output signal of the X-ray sensor from which the DC component is removed by the filter.
Abstract translation: 一种X射线CT装置，具有用于将X射线照射到待检查对象的X射线照射器，用于检测通过被检查物体的X射线的X射线传感器，X射线传感器信号处理 用于处理来自X射线传感器的输出信号的电路，以及CT控制装置，用于根据通过X射线传感器信号处理处理的X射线传感器的输出信号重建被检查物体的图像 电路。 X射线传感器信号处理电路包括用于从X射线传感器的输出信号中去除DC分量的滤波器，以及积分电路，用于对从其中除去DC分量的X射线传感器的输出信号进行积分， 过滤器。
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Patent Agency Ranking
公开(公告)号：US20070014465A1
公开(公告)日：2007-01-18
申请号：US11525843
申请日：2006-09-25
Applicant: Shouhei Numata , Tarou Takagi
Inventor： Shouhei Numata , Tarou Takagi
CPC classification number: G06T3/00 , G01N23/04 , G06F3/1415 , G06T15/00 , G09G5/39 , G09G2340/0407 , Y10S378/901
Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.
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7.发明申请X-ray sensor signal processor and X-ray computed tomography system using the same 有权X射线传感器信号处理器和X射线计算机断层摄影系统使用相同公开(公告)号：US20070009082A1
公开(公告)日：2007-01-11
申请号：US11519876
申请日：2006-09-13
Applicant: Hiroshi Kamimura , Shigeru Izumi , Hiroshi Kitaguchi , Atsushi Yamagoshi , Katsutoshi Satoh , Noriyuki Sadaoka , Tarou Takagi , Kouji Kuwabara , Shouhei Numata
Inventor： Hiroshi Kamimura , Shigeru Izumi , Hiroshi Kitaguchi , Atsushi Yamagoshi , Katsutoshi Satoh , Noriyuki Sadaoka , Tarou Takagi , Kouji Kuwabara , Shouhei Numata
CPC classification number: H04N5/32 , G01N23/046 , G01N2223/419 , G06F19/00 , G06Q50/22 , G06Q50/24 , H04N5/361 , Y10S378/901
Abstract: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first condenser having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first condenser, and an integrator having a second resistor and a second condenser each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first condenser are returned to a steady state after irradiation of the pulsed X-ray.
Abstract translation: 一种用于处理半导体X射线传感器的输出信号的工业X射线CT装置的X射线传感器信号处理电路和方法，该半导体X射线传感器检测从加速器发出的脉冲X射线并通过待检查物体 。 该电路包括：第一电阻器，其一端连接到X射线传感器，另一端连接到地;第一电容器，其一端连接到X射线传感器和第一电阻的连接点，运算放大器 具有连接到第一电容器的另一个端子的反相输入端和具有并联连接到运算放大器的第二电阻器和第二电容器的积分器。 电路被配置为使得至少在X射线照射之后X射线传感器和第一冷凝器的偏置状态恢复到稳定状态。
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公开(公告)号：US07142702B2
公开(公告)日：2006-11-28
申请号：US10998715
申请日：2004-11-30
Applicant: Shouhei Numata , Tarou Takagi
Inventor： Shouhei Numata , Tarou Takagi
IPC: G06K9/00
CPC classification number: G06T3/00 , G01N23/04 , G06F3/1415 , G06T15/00 , G09G5/39 , G09G2340/0407 , Y10S378/901
Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.
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9.发明授权X-ray sensor signal processor and X-ray computed tomography system using the same 有权X射线传感器信号处理器和X射线计算机断层摄影系统使用相同公开(公告)号：US06925143B2
公开(公告)日：2005-08-02
申请号：US10864782
申请日：2004-06-10
Applicant: Hiroshi Kamimura , Shigeru Izumi , Hiroshi Kitaguchi , Atsushi Yamagoshi , Katsutoshi Satoh , Noriyuki Sadaoka , Tarou Takagi , Kouji Kuwabara , Shouhei Numata
Inventor： Hiroshi Kamimura , Shigeru Izumi , Hiroshi Kitaguchi , Atsushi Yamagoshi , Katsutoshi Satoh , Noriyuki Sadaoka , Tarou Takagi , Kouji Kuwabara , Shouhei Numata
CPC classification number: H04N5/32 , G01N23/046 , G01N2223/419 , G06F19/00 , G06Q50/22 , G06Q50/24 , H04N5/361 , Y10S378/901
Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray semiconductor sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray semiconductor sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray semiconductor sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray semiconductor sensor, and an integration circuit for integrating an output signal of the X-ray semiconductor sensor from which the DC component is removed by the filter.
Abstract translation: 一种X射线CT装置，具有用于将X射线照射到待检查对象的X射线照射器，X射线半导体传感器，用于检测通过被检查物体的X射线，X射线传感器信号 用于处理来自X射线半导体传感器的输出信号的处理电路，以及CT控制装置，用于根据通过X射线处理的X射线半导体传感器的输出信号重建被检查物体的图像 传感器信号处理电路。 X射线传感器信号处理电路包括用于从X射线半导体传感器的输出信号中去除DC分量的滤波器，以及积分电路，用于对直流成分为直流成分的X射线半导体传感器的输出信号进行积分 由过滤器去除。
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公开(公告)号：US06668036B2
公开(公告)日：2003-12-23
申请号：US10347433
申请日：2003-01-21
Applicant: Shouhei Numata , Tarou Takagi
Inventor： Shouhei Numata , Tarou Takagi
IPC: A61B603
CPC classification number: G01N23/046 , G01N2223/419 , G06T15/00 , Y10S378/901
Abstract: A method and an apparatus for processing data enables to display a preview image rapidly in case of processing large volume of data. Index data are generated by rendering the large amount of bit map data and stored in addition to the three-dimensional bit map data. By means that the two-dimensional image resulted from the rendering process is made prepared in advance before accepting the user's command for display and edit, the preview of the content of the data can be displayed rapidly at real-time when the user issues the command interactively.
Abstract translation: 用于处理数据的方法和装置使得能够在处理大量数据的情况下快速地显示预览图像。 索引数据是通过渲染大量位图数据并存储在三维位图数据之外而生成的。 通过在接受用户的显示和编辑命令之前，预先准备由渲染处理产生的二维图像，当用户发出命令时，可以实时地快速显示数据内容的预览 交互式地
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