X-ray sensor signal processor and X-ray computed tomography system using the same
    5.
    发明授权
    X-ray sensor signal processor and X-ray computed tomography system using the same 有权
    X射线传感器信号处理器和X射线计算机断层摄影系统使用相同

    公开(公告)号:US07260176B2

    公开(公告)日:2007-08-21

    申请号:US11519876

    申请日:2006-09-13

    IPC分类号: A61B6/03

    摘要: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first capacitor having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first capacitor, and an integrator having a second resistor and a second capacitor each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first capacitor are returned to a steady state after irradiation of the pulsed X-ray.

    摘要翻译: 一种用于处理半导体X射线传感器的输出信号的工业X射线CT装置的X射线传感器信号处理电路和方法,该半导体X射线传感器检测从加速器发出的脉冲X射线并通过待检查物体 。 该电路包括:第一电阻器,其一端连接到X射线传感器,另一端连接到地;第一电容器,其一端连接到X射线传感器和第一电阻的连接点,运算放大器 具有连接到第一电容器的另一端的反相输入端和具有并联连接到运算放大器的第二电阻器和第二电容器的积分器。 电路被配置为使得至少在X射线照射之后X射线传感器和第一电容器的偏置条件恢复到稳定状态。

    X-ray sensor signal processor and X-ray computed tomography system using the same
    9.
    发明授权
    X-ray sensor signal processor and X-ray computed tomography system using the same 有权
    X射线传感器信号处理器和X射线计算机断层摄影系统使用相同

    公开(公告)号:US06366636B1

    公开(公告)日:2002-04-02

    申请号:US09517590

    申请日:2000-03-03

    IPC分类号: A61B600

    CPC分类号: G01N23/046 G01N2223/419

    摘要: An X-ray sensor signal processor including capacitors 114 for removing DC components (dark currents) from output signals of semiconductor sensors 21 to 2n detecting pulse-like X-rays passed through an object, and integrators (each of which is constituted by a combination of an operational amplifier 115, a resistor 116 and a capacitor 117) for integrating the output signals of the X-ray sensors after removal of the DC components by the capacitors 114. By this, a value proportional to the average number of photons in X-rays can be obtained even in the case where a small number of incident photons are given, and an X-ray CT system using the X-ray sensor signal processor.

    摘要翻译: 一种X射线传感器信号处理器,包括用于从半导体传感器21的输出信号到2n检测通过物体的脉冲状X射线的直流分量(暗电流)的电容器114和积分器(各由组合 运算放大器115,电阻器116和电容器117),用于在由电容器114去除DC分量之后对X射线传感器的输出信号进行积分。由此,与X中的光子的平均数成比例的值 即使在给出少量入射光子的情况下也可以获得射线,以及使用X射线传感器信号处理器的X射线CT系统。

    Radioactive gas measurement apparatus and failed fuel detection system
    10.
    发明授权
    Radioactive gas measurement apparatus and failed fuel detection system 有权
    放射性气体测量装置和故障燃料检测系统

    公开(公告)号:US07151262B1

    公开(公告)日:2006-12-19

    申请号:US10872449

    申请日:2004-06-22

    IPC分类号: G01T1/20 G01T1/24

    CPC分类号: G01T1/205

    摘要: To provide a radioactive gas measurement apparatus that is simply constructed and can efficiently measure Xe-133 in a radioactive gas on-line under the condition that the radioactive gas is mixed with interference N-13, an apparatus is provided for measuring a radiation emitted from Xe-133, including an anticoincidence counter circuit 13 that conducts counting if it receives an output of a main detector 1 when it does not receive outputs of scintillation detectors 2 and 9, and a gate circuit 14, a plate-shaped semiconductor detector is used as the main detector 1, and a material not emitting a characteristic X ray in the range from 70 to 90 keV is used for a shielding structure. In particular, the thickness of the semiconductor detector 1 is set to fall within a range from 2 mm to 7 mm, thereby improving the analysis precision.

    摘要翻译: 为了提供简单构造的放射性气体测量装置,并且可以在放射性气体与干扰N-13混合的条件下在线放射性气体中有效地测量Xe-133,提供了一种用于测量从 Xe-133,包括防错计数器电路13,如果在没有接收到闪烁检测器2和9的输出的情况下接收到主检测器1的输出,则接收计数;以及门电路14,使用板状半导体检测器 作为主检测器1,并且将不发射70至90keV范围内的特征X射线的材料用于屏蔽结构。 特别地,将半导体检测器1的厚度设定为2mm〜7mm的范围,提高分析精度。