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    X-ray sensor signal processor and X-ray computed tomography system using the same
    5.
    发明授权
    X-ray sensor signal processor and X-ray computed tomography system using the same 有权
    X射线传感器信号处理器和X射线计算机断层摄影系统使用相同

    公开(公告)号：US07260176B2

    公开(公告)日：2007-08-21

    申请号：US11519876

    申请日：2006-09-13

    申请人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

    发明人： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

    IPC分类号： A61B6/03

    CPC分类号： H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

    摘要： An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first capacitor having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first capacitor, and an integrator having a second resistor and a second capacitor each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first capacitor are returned to a steady state after irradiation of the pulsed X-ray.

    摘要翻译： 一种用于处理半导体X射线传感器的输出信号的工业X射线CT装置的X射线传感器信号处理电路和方法，该半导体X射线传感器检测从加速器发出的脉冲X射线并通过待检查物体 。 该电路包括：第一电阻器，其一端连接到X射线传感器，另一端连接到地;第一电容器，其一端连接到X射线传感器和第一电阻的连接点，运算放大器 具有连接到第一电容器的另一端的反相输入端和具有并联连接到运算放大器的第二电阻器和第二电容器的积分器。 电路被配置为使得至少在X射线照射之后X射线传感器和第一电容器的偏置条件恢复到稳定状态。

    Method of inspection for inner defects of an object and apparatus for same
    9.
    发明授权
    Method of inspection for inner defects of an object and apparatus for same 有权
    物体内部缺陷检查方法及其装置

    公开(公告)号：US07933441B2

    公开(公告)日：2011-04-26

    申请号：US11259251

    申请日：2005-10-27

    申请人： Shouhei Numata ,  Tarou Takagi ,  Noriyuki Sadaoka

    发明人： Shouhei Numata ,  Tarou Takagi ,  Noriyuki Sadaoka

    IPC分类号： G06K9/00

    CPC分类号： G06T7/0004 ,  G01N23/046 ,  G01N2223/419 ,  G06T7/66 ,  G06T2207/30164

    摘要： It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.

    摘要翻译： 可以使用诸如X射线CT数据的空间离散数据进行内部缺陷检查，具有更高的精度。 一种用于通过使用空间元素来描述物体的空间形状和结构的空间离散数据来检查物体内部缺陷的内部缺陷检查方法包括以下步骤：通过使用内部空间从空间离散数据中提取内部缺陷 缺陷提取单元，通过使用相关的元素收集单元收集包含在邻近范围内的元素，其作为相关元素以围绕由内部缺陷提取单元提取的内部缺陷的预定分布设置; 并且通过使用特征量测量单元，基于由相关元件收集单元收集的相关元素来测量诸如内部缺陷的重心的大小和位置的特征量。

    Shape model generation method and shape model generation system
    10.
    发明授权
    Shape model generation method and shape model generation system 有权

    公开(公告)号：US07228254B2

    公开(公告)日：2007-06-05

    申请号：US11206929

    申请日：2005-08-19

    申请人： Shouhei Numata ,  Noriyuki Sadaoka ,  Tarou Takagi

    发明人： Shouhei Numata ,  Noriyuki Sadaoka ,  Tarou Takagi

    IPC分类号： G06F15/00

    CPC分类号： G06T7/55 ,  G06T17/10 ,  G06T2207/10081 ,  G06T2207/30164

    摘要： A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.