公开(公告)号：US20110095001A1

公开(公告)日：2011-04-28

申请号：US12910226

申请日：2010-10-22

申请人： Thorsten Loewer ,  Juergen Fath

发明人： Thorsten Loewer ,  Juergen Fath

IPC分类号： B23K15/00

CPC分类号： B23K15/0053 ,  B23K15/0013 ,  B23K15/02 ,  H01J37/3005 ,  H01J37/3045 ,  H01J2237/3104

摘要： A thermal material-processing method wherein between the working spot of an electron beam and a workpiece a relative motion is brought about. Prior to the actual thermal treatment an effective processing contour is ascertained, in that the working spot of the electron beam executes, in accordance with the stored data of an ideal processing contour, a relative motion in relation to the workpiece, and on this relative motion a scan motion is superimposed which is directed transversely to the ideal processing contour. In this manner, both geometrical and magnetically conditioned deviations of the points of incidence of the electron beam on the workpiece can be compensated.

摘要翻译： 一种热物质处理方法，其中在电子束的工作点和工件之间产生相对运动。 在实际热处理之前，确定了有效的加工轮廓，因为电子束的工作点根据存储的理想加工轮廓的数据执行相对于工件的相对运动，并且在该相对运动 叠加了横向于理想加工轮廓的扫描运动。 以这种方式，可以补偿电子束在工件上的入射点的几何和磁调节偏差。

公开(公告)号：US20090323895A1

公开(公告)日：2009-12-31

申请号：US12307453

申请日：2007-05-30

申请人： Alois Friedberger ,  Thorsten Loewer ,  Soeren Fricke ,  Ulrich Schmid

发明人： Alois Friedberger ,  Thorsten Loewer ,  Soeren Fricke ,  Ulrich Schmid

IPC分类号： G01B15/02 ,  H01J37/305 ,  H01J37/304

CPC分类号： H01J37/3056 ,  H01J37/244 ,  H01J37/256 ,  H01J37/3045 ,  H01J2237/2561 ,  H01J2237/2807 ,  H01J2237/30466

摘要： An electron beam is used to generate x-ray radiation in a workpiece, which radiation emerges on the workpiece back at sufficiently thin points of the workpiece and is detected by means of an x-ray radiation detector. Based on the x-ray radiation intensity and the momentary beaming-in position of the electron beam, the surface structure on both sides as well as the local material thickness can be determined. Based on such values, workpieces and/or workpiece treating systems can be adjusted, and vertical material removal in a material-removing workpiece treating system can be controlled.

摘要翻译： 电子束用于在工件中产生x射线辐射，该辐射在工件的足够薄的点处在工件上回放，并通过X射线辐射检测器进行检测。 基于X射线辐射强度和电子束的瞬时射入位置，可以确定两侧的表面结构以及局部材料厚度。 基于这样的值，可以调整工件和/或工件处理系统，并且可以控制在材料去除工件处理系统中的垂直材料去除。

公开(公告)号：US08314358B2

公开(公告)日：2012-11-20

申请号：US12910226

申请日：2010-10-22

申请人： Thorsten Loewer ,  Juergen Fath

发明人： Thorsten Loewer ,  Juergen Fath

IPC分类号： G01N27/00 ,  B23K15/00 ,  H01J37/315

CPC分类号： B23K15/0053 ,  B23K15/0013 ,  B23K15/02 ,  H01J37/3005 ,  H01J37/3045 ,  H01J2237/3104

摘要： A thermal material-processing method wherein between the working spot of an electron beam and a workpiece a relative motion is brought about. Prior to the actual thermal treatment an effective processing contour is ascertained, in that the working spot of the electron beam executes, in accordance with the stored data of an ideal processing contour, a relative motion in relation to the workpiece, and on this relative motion a scan motion is superimposed which is directed transversely to the ideal processing contour. In this manner, both geometrical and magnetically conditioned deviations of the points of incidence of the electron beam on the workpiece can be compensated.

摘要翻译： 一种热物质处理方法，其中在电子束的工作点和工件之间产生相对运动。 在实际热处理之前，确定了有效的加工轮廓，因为电子束的工作点根据存储的理想加工轮廓的数据执行相对于工件的相对运动，并且在该相对运动 叠加了横向于理想加工轮廓的扫描运动。 以这种方式，可以补偿电子束在工件上的入射点的几何和磁调节偏差。