-
公开(公告)号：US08797395B2
公开(公告)日：2014-08-05
申请号：US12972167
申请日：2010-12-17
CPC分类号： G01N21/84 , G01N2021/8444 , G02B21/365
摘要： An automated system for inspecting a porous substrate using a sample, comprising, a delivery device positioned to apply the sample to a target point on the porous substrate along a sample axis; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is offset from the sample axis, and have a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate.
摘要翻译： 一种用于使用样品检查多孔基材的自动化系统，包括：定位成沿着样品轴将样品施加到多孔基材上的目标点的递送装置; 成像装置和一个或多个透镜，其被定位成使得成像装置和透镜各自具有偏离样本轴线的焦点轴线，并且具有与目标点基本相同的观察焦点; 从所述输送装置偏移以照射所述表面目标的光源; 以及包括数据采集和控制系统的处理器，所述数据采集和控制系统协调所述传送和成像设备的定时和自动化，并且确定所述多孔基板的一个或多个特性。
-
公开(公告)号：US20120154560A1
公开(公告)日：2012-06-21
申请号：US12972167
申请日：2010-12-17
IPC分类号： H04N7/18
CPC分类号： G01N21/84 , G01N2021/8444 , G02B21/365
摘要： An automated system for inspecting a porous substrate using a sample, comprising, a delivery device positioned to apply the sample to a target point on the porous substrate along a sample axis; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is offset from the sample axis, and have a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate.
摘要翻译： 一种用于使用样品检查多孔基材的自动化系统，包括：定位成沿着样品轴将样品施加到多孔基材上的目标点的递送装置; 成像装置和一个或多个透镜，其被定位成使得成像装置和透镜各自具有偏离样本轴线的焦点轴线，并且具有与目标点基本相同的观察焦点; 从所述输送装置偏移以照射所述表面目标的光源; 以及包括数据采集和控制系统的处理器，所述数据采集和控制系统协调所述传送和成像设备的定时和自动化，并确定所述多孔基底的一个或多个特性。
-
公开(公告)号：US20120147383A1
公开(公告)日：2012-06-14
申请号：US13312423
申请日：2011-12-06
申请人： Li TAO , Guiju Song , Xinjun Wan , Kevin George Harding , Steven Robert Hayashi , James Joseph Hoffman , Charles Walter Muekmore , Yana Zhang Williams , Shukuan Xu
发明人： Li TAO , Guiju Song , Xinjun Wan , Kevin George Harding , Steven Robert Hayashi , James Joseph Hoffman , Charles Walter Muekmore , Yana Zhang Williams , Shukuan Xu
IPC分类号： G01B11/24
CPC分类号： G01B11/2513 , G01B11/2527 , G01S17/36 , G01S17/89
摘要： A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.
摘要翻译： 公开了一种包括光源单元，投影单元和光学单元的测量系统。 光源单元被配置为产生多个调制相移光束。 投影单元被配置为将调制的相移光束反射到物体表面上。 光学单元被配置为捕获来自物体表面的经调制的相移光束。 测量系统还包括光电检测器和处理器。 光电检测器被配置为从光学单元接收经调制的相移光束以产生电信号。 处理器被配置为基于来自光电检测器的电信号来检索物体表面的位置信息。 还提出了一种测量方法。
-
公开(公告)号：US08643849B2
公开(公告)日：2014-02-04
申请号：US13312423
申请日：2011-12-06
申请人： Li Tao , Guiju Song , Xinjun Wan , Kevin George Harding , Steven Robert Hayashi , James Joseph Hoffman , Charles Walter Muekmore , Yana Zhang Williams , Shukuan Xu
发明人： Li Tao , Guiju Song , Xinjun Wan , Kevin George Harding , Steven Robert Hayashi , James Joseph Hoffman , Charles Walter Muekmore , Yana Zhang Williams , Shukuan Xu
IPC分类号： G02B11/24
CPC分类号： G01B11/2513 , G01B11/2527 , G01S17/36 , G01S17/89
摘要： A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.
摘要翻译： 公开了一种包括光源单元，投影单元和光学单元的测量系统。 光源单元被配置为产生多个调制相移光束。 投影单元被配置为将调制的相移光束反射到物体表面上。 光学单元被配置为捕获来自物体表面的经调制的相移光束。 测量系统还包括光电检测器和处理器。 光电检测器被配置为从光学单元接收经调制的相移光束以产生电信号。 处理器被配置为基于来自光电检测器的电信号来检索物体表面的位置信息。 还提出了一种测量方法。
-
-
-
搜索结果
4 条记录 (耗时 0.01 秒)
