公开(公告)号：US07679321B2

公开(公告)日：2010-03-16

申请号：US11298213

申请日：2005-12-09

申请人： Junji Takeshita ,  Yasuhiro Tokumaru ,  Kouichirou Sakamoto

发明人： Junji Takeshita ,  Yasuhiro Tokumaru ,  Kouichirou Sakamoto

IPC分类号： H02J7/00

CPC分类号： G06F1/263

摘要： A power circuit is disclosed which is connected to a power source supplying different currents. The power circuit supplying driving power from the power source to a load includes a switching unit configured to switch the driving power supplied to the load in response to an external switching signal.

摘要翻译： 公开了连接到供应不同电流的电源的电源电路。 从电源向负载提供驱动电力的电源电路包括：开关单元，被配置为响应于外部开关信号切换提供给负载的驱动电力。

公开(公告)号：US20060209578A1

公开(公告)日：2006-09-21

申请号：US11298213

申请日：2005-12-09

申请人： Junji Takeshita ,  Yasuhiro Tokumaru ,  Kouichirou Sakamoto

发明人： Junji Takeshita ,  Yasuhiro Tokumaru ,  Kouichirou Sakamoto

IPC分类号： H02M7/02

CPC分类号： G06F1/263

摘要： A power circuit is disclosed which is connected to a power source supplying different currents. The power circuit supplying driving power from the power source to a load includes a switching unit configured to switch the driving power supplied to the load in response to an external switching signal.

摘要翻译： 公开了连接到供应不同电流的电源的电源电路。 从电源向负载提供驱动电力的电源电路包括：开关单元，被配置为响应于外部开关信号切换提供给负载的驱动电力。

公开(公告)号：US08457926B2

公开(公告)日：2013-06-04

申请号：US12841599

申请日：2010-07-22

申请人： Kenichi Shitara ,  Yasuhiro Tokumaru

发明人： Kenichi Shitara ,  Yasuhiro Tokumaru

IPC分类号： G01B5/20 ,  G01B21/20 ,  G06F19/00 ,  G06F17/40

CPC分类号： G11B20/10009 ,  G11B20/10046 ,  G11B20/10314 ,  G11B2220/2516

摘要： The present invention relates to a disk protrusion detection/flatness measurement circuit and a disk glide tester, in which protrusion detection and average value calculation can be performed without switching signal processing circuits of two systems, one for the protrusion detection of a disk and the other for the average value calculation with respect to a track or a sector of the disk. This also makes it possible to reduce the size of the measurement circuit. In the protrusion detection/flatness measurement circuit, a signal from a protrusion detection sensor is amplified and converted from an analog signal to a digital signal. The signal passes through a band-pass filter to obtain a digital signal with a predetermined bandwidth. Then, peak detection and average value calculation processes are applied in parallel to the obtained digital signal. Thus, pass/fail decision of the disk can be made based on the detected peak and average values.

摘要翻译： 盘突起检测/平坦度测量电路和盘滑动测试仪技术领域本发明涉及一种能够在不切换两个系统的信号处理电路的情况下执行突起检测和平均值计算的盘突起检测/平坦度测量电路和盘滑动测试仪，一个用于盘的突出检测和另一个 用于相对于盘的轨道或扇区的平均值计算。 这也可以减小测量电路的尺寸。 在突起检测/平坦度测量电路中，来自突起检测传感器的信号被放大并从模拟信号转换成数字信号。 信号通过带通滤波器以获得具有预定带宽的数字信号。 然后，与所获得的数字信号并行地应用峰值检测和平均值计算处理。 因此，可以基于检测到的峰值和平均值来进行盘的通过/失败判定。

公开(公告)号：US20110051580A1

公开(公告)日：2011-03-03

申请号：US12841599

申请日：2010-07-22

申请人： Kenichi SHITARA ,  Yasuhiro TOKUMARU

发明人： Kenichi SHITARA ,  Yasuhiro TOKUMARU

IPC分类号： G11B20/18

CPC分类号： G11B20/10009 ,  G11B20/10046 ,  G11B20/10314 ,  G11B2220/2516

摘要： The present invention relates to a disk protrusion detection/flatness measurement circuit and a disk glide tester, in which protrusion detection and average value calculation can be performed without switching signal processing circuits of two systems, one for the protrusion detection of a disk and the other for the average value calculation with respect to a track or a sector of the disk. This also makes it possible to reduce the size of the measurement circuit. In the protrusion detection/flatness measurement circuit, a signal from a protrusion detection sensor is amplified and converted from an analog signal to a digital signal. The signal passes through a band-pass filter to obtain a digital signal with a predetermined bandwidth. Then, peak detection and average value calculation processes are applied in parallel to the obtained digital signal. Thus, pass/fail decision of the disk can be made based on the detected peak and average values.

摘要翻译： 盘突起检测/平坦度测量电路和盘滑动测试仪技术领域本发明涉及一种能够在不切换两个系统的信号处理电路的情况下执行突起检测和平均值计算的盘突起检测/平坦度测量电路和盘滑动测试仪，一个用于盘的突出检测和另一个 用于相对于盘的轨道或扇区的平均值计算。 这也可以减小测量电路的尺寸。 在突起检测/平坦度测量电路中，来自突起检测传感器的信号被放大并从模拟信号转换成数字信号。 信号通过带通滤波器以获得具有预定带宽的数字信号。 然后，与所获得的数字信号并行地应用峰值检测和平均值计算处理。 因此，可以基于检测到的峰值和平均值来进行盘的通过/失败判定。

公开(公告)号：US20070271487A1

公开(公告)日：2007-11-22

申请号：US11751166

申请日：2007-05-21

申请人： Sumihiro Maeda ,  Yasuhiro Tokumaru

发明人： Sumihiro Maeda ,  Yasuhiro Tokumaru

IPC分类号： G06F11/00

CPC分类号： G11B20/18 ,  G11B7/00375 ,  G11B20/182 ,  G11B2020/10916 ,  G11B2020/1823 ,  G11B2220/2516

摘要： In the present invention, an inspection area for sampled defect data is set which has a predetermined width in the radial direction of a magnetic disk and a length round the circle of the magnetic disk in the circumferential direction thereof or a predetermined length in the circumferential direction thereof, and while limiting the defect data in the inspection area and shifting a narrow and long search frame within the area, continuing defects in the region of the search frame are followed up and detected, thereby, only curved line shaped continuing defects having comparatively large curvature near to the circle of the magnetic disk are selectively detected and acquired as circle shaped defects.

摘要翻译： 在本发明中，设定采样缺陷数据的检查区域，其在磁盘的径向上具有预定的宽度，在圆周方向上具有圆周的圆周或圆周的预定长度 并且在限制检查区域中的缺陷数据并移动该区域内的窄而长的搜索帧的同时，跟踪和检测搜索框区域中的缺陷，从而仅具有相对较大的曲线连续缺陷 作为圆形缺陷，选择性地检测并获取靠近磁盘圆的曲率。

公开(公告)号：US07903361B2

公开(公告)日：2011-03-08

申请号：US11751166

申请日：2007-05-21

申请人： Sumihiro Maeda ,  Yasuhiro Tokumaru

发明人： Sumihiro Maeda ,  Yasuhiro Tokumaru

IPC分类号： G11B5/09

CPC分类号： G11B20/18 ,  G11B7/00375 ,  G11B20/182 ,  G11B2020/10916 ,  G11B2020/1823 ,  G11B2220/2516

摘要： In the present invention, an inspection area for sampled defect data is set which has a predetermined width in the radial direction of a magnetic disk and a length round the circle of the magnetic disk in the circumferential direction thereof or a predetermined length in the circumferential direction thereof, and while limiting the defect data in the inspection area and shifting a narrow and long search frame within the area, continuing defects in the region of the search frame are followed up and detected, thereby, only curved line shaped continuing defects having comparatively large curvature near to the circle of the magnetic disk are selectively detected and acquired as circle shaped defects.

摘要翻译： 在本发明中，设定采样缺陷数据的检查区域，其在磁盘的径向上具有预定的宽度，在圆周方向上具有圆周的圆周或圆周的预定长度 并且在限制检查区域中的缺陷数据并移动该区域内的窄而长的搜索帧的同时，跟踪和检测搜索框区域中的缺陷，从而仅具有相对较大的曲线连续缺陷 作为圆形缺陷，选择性地检测并获取靠近磁盘圆的曲率。