Gate driving method and circuit for liquid crystal display
    2.
    发明授权
    Gate driving method and circuit for liquid crystal display 有权
    门驱动方法和液晶显示电路

    公开(公告)号:US08502764B2

    公开(公告)日:2013-08-06

    申请号:US13017985

    申请日:2011-01-31

    IPC分类号: G09G3/36

    摘要: A gate driving method for a liquid crystal display (LCD) and a gate driver thereof are provided. The LCD has a plurality of scan lines. The method starts by generating a gate driving signal. A correction signal is superposed to the gate driving signal to generate a corrected gate driving signal and to reduce a high voltage level of the gate driving signal, wherein a polarity of the correction signal is opposite to a polarity of the gate driving signal. The corrected gate driving signal is then outputted to drive one of the corresponding scan lines.

    摘要翻译: 提供了一种用于液晶显示器(LCD)的栅极驱动方法及其栅极驱动器。 LCD具有多条扫描线。 该方法通过产生栅极驱动信号开始。 校正信号与栅极驱动信号叠加以产生校正的栅极驱动信号并降低栅极驱动信号的高电压电平,其中校正信号的极性与栅极驱动信号的极性相反。 然后输出校正的门驱动信号,驱动相应的扫描线之一。

    Circuit for amplifying a display signal to be transmitted to a repair line by using a non-inverting amplifier and LCD device using the same
    3.
    发明授权
    Circuit for amplifying a display signal to be transmitted to a repair line by using a non-inverting amplifier and LCD device using the same 有权
    用于通过使用同相放大器和使用其的LCD装置放大要发送到修复线的显示信号的电路

    公开(公告)号:US08334828B2

    公开(公告)日:2012-12-18

    申请号:US13182637

    申请日:2011-07-14

    IPC分类号: G09G3/36

    摘要: A circuit for amplifying a display signal transmitted to a repair line by using a non-inverting amplifier is disclosed, which comprises a voltage follower, a non-inverting amplifier, a repair line, a thin film transistor (TFT) and a liquid crystal (LC) capacitor. The voltage follower is electrically connected to a data driver chip to thereby provide a display signal to the non-inverting amplifier. The non-inverting amplifier amplifies the display signal to thus obtain an amplified display signal, and transmits the amplified display signal to the TFT and the LC capacitor through the repair line. The amplified display signal is kept at a desired voltage level when the LC capacitor receives the amplified display signal.

    摘要翻译: 公开了一种用于放大通过使用非反相放大器传输到维修线的显示信号的电路,其包括电压跟随器,非反相放大器,修复线,薄膜晶体管(TFT)和液晶( LC)电容器。 电压跟随器电连接到数据驱动器芯片,从而向非反相放大器提供显示信号。 非反相放大器放大显示信号,从而获得放大的显示信号,并通过修复线将放大的显示信号发送到TFT和LC电容器。 当LC电容器接收放大的显示信号时,放大的显示信号保持在期望的电压电平。

    CIRCUIT FOR AMPLIFYING A DISPLAY SIGNAL TO BE TRANSMITTED TO A REPAIR LINE BY USING A NON-INVERTING AMPLIFIER AND LCD DEVICE USING THE SAME
    4.
    发明申请
    CIRCUIT FOR AMPLIFYING A DISPLAY SIGNAL TO BE TRANSMITTED TO A REPAIR LINE BY USING A NON-INVERTING AMPLIFIER AND LCD DEVICE USING THE SAME 有权
    用于通过使用非反相放大器和使用其的LCD装置来放大要传输到维修线的显示信号的电路

    公开(公告)号:US20110279440A1

    公开(公告)日:2011-11-17

    申请号:US13182637

    申请日:2011-07-14

    IPC分类号: G09G5/00

    摘要: A circuit for amplifying a display signal transmitted to a repair line by using a non-inverting amplifier is disclosed, which comprises a voltage follower, a non-inverting amplifier, a repair line, a thin film transistor (TFT) and a liquid crystal (LC) capacitor. The voltage follower is electrically connected to a data driver chip to thereby provide a display signal to the non-inverting amplifier. The non-inverting amplifier amplifies the display signal to thus obtain an amplified display signal, and transmits the amplified display signal to the TFT and the LC capacitor through the repair line. The amplified display signal is kept at a desired voltage level when the LC capacitor receives the amplified display signal.

    摘要翻译: 公开了一种用于放大通过使用非反相放大器传输到维修线的显示信号的电路,其包括电压跟随器,非反相放大器,修复线,薄膜晶体管(TFT)和液晶( LC)电容器。 电压跟随器电连接到数据驱动器芯片,从而向非反相放大器提供显示信号。 非反相放大器放大显示信号,从而获得放大的显示信号,并通过修复线将放大的显示信号发送到TFT和LC电容器。 当LC电容器接收放大的显示信号时,放大的显示信号保持在期望的电压电平。

    Device and A Method Thereof for Producing A Patterned Plate
    5.
    发明申请
    Device and A Method Thereof for Producing A Patterned Plate 审中-公开
    用于生产图案板的装置及其方法

    公开(公告)号:US20100139070A1

    公开(公告)日:2010-06-10

    申请号:US12345808

    申请日:2008-12-30

    IPC分类号: B23P17/00 B21D26/02

    CPC分类号: B21D26/14 Y10T29/49803

    摘要: A device for producing a patterned plate from a tubular work piece is disclosed wherein walls of the tubular work piece comprise at least one forming surface. The device comprises a die and an electromagnetic actuator, wherein the die comprises a patterned surface with a pattern formed thereon and a fracturing part. The tubular work piece is disposed between the die and the electromagnetic actuator such that the walls of the tubular work piece correspond to walls of the die, and the forming surface corresponds to the patterned surface. When the electromagnetic actuator is supplied with a current pulse, an eddy current is induced in the tubular work piece, generating a repulsive force between the electromagnetic actuator and the tubular work piece. Therefore, the tubular work piece impacts the die, and the forming surface is deformed against the patterned surface and the fracturing part, thus replicating the pattern of the patterned surface onto the forming surface. At the same time, the tubular work piece is fractured at the position corresponding to the fracturing part. A method for producing a patterned plate from a tubular work piece is also disclosed.

    摘要翻译: 公开了一种用于从管状工件制造图案化板的装置,其中管状工件的壁包括至少一个成形表面。 该装置包括模具和电磁致动器,其中模具包括其上形成有图案的图案化表面和压裂部分。 管状工件设置在模具和电磁致动器之间,使得管状工件的壁对应于模具的壁,并且成形表面对应于图案化表面。 当向电磁致动器提供电流脉冲时,在管状工件中产生涡流,在电磁致动器和管状工件之间产生排斥力。 因此,管状工件撞击模具,并且成形表面相对图案化表面和压裂部分变形,从而将图案化表面的图案复制到成形表面上。 同时,管状工件在与压裂部对应的位置断裂。 还公开了一种从管状工件制造图案化板的方法。

    Method for improving the EMI performance of an LCD device
    6.
    发明申请
    Method for improving the EMI performance of an LCD device 有权
    提高LCD设备EMI性能的方法

    公开(公告)号:US20080252623A1

    公开(公告)日:2008-10-16

    申请号:US12000694

    申请日:2007-12-17

    申请人: Chien-Yu Yi

    发明人: Chien-Yu Yi

    IPC分类号: G09G5/00

    摘要: A method for improving the EMI performance of an LCD device is disclosed, adapting for a point-to-point transistor transistor logic interface of the LCD device. The disclosed method comprises the following steps: receiving a plurality of image data based on a fifth CLK signal; providing a first CLK signal and a second CLK signal to a plurality of source drivers by a timing controller, wherein the frequencies of the first CLK signal and the second CLK signal are smaller than the frequency of the fifth CLK signal, the phase of the first CLK signal is different from the phase of the second CLK signal; and the timing controller transmitting a plurality of first image data to the plurality of source drivers based on the first CLK signal, and the timing controller transmitting a plurality of second image data to the plurality of source drivers based on the second CLK signal.

    摘要翻译: 公开了一种用于改善LCD装置的EMI性能的方法,适用于LCD装置的点对点晶体管晶体管逻辑接口。 所公开的方法包括以下步骤:基于第五个CLK信号接收多个图像数据; 通过定时控制器向多个源极驱动器提供第一CLK信号和第二CLK信号,其中第一CLK信号和第二CLK信号的频率小于第五CLK信号的频率,第一 CLK信号与第二CLK信号的相位不同; 并且所述定时控制器基于所述第一CLK信号向所述多个源驱动器发送多个第一图像数据,并且所述定时控制器基于所述第二CLK信号向所述多个源驱动器发送多个第二图像数据。

    NANO-INDENTATION ULTRASONIC DETECTING SYSTEM AND METHOD THEREOF
    7.
    发明申请
    NANO-INDENTATION ULTRASONIC DETECTING SYSTEM AND METHOD THEREOF 有权
    纳米超声检测系统及其方法

    公开(公告)号:US20070151340A1

    公开(公告)日:2007-07-05

    申请号:US11552118

    申请日:2006-10-23

    IPC分类号: G01N29/04 G01N3/40 G01N29/46

    摘要: A nano-indentation ultrasonic detecting system for detecting mechanical properties of a target material. An indentation device, disposed on a surface of the target material, generates an indentation on the surface, obtaining the relation between the Young's modulus and the Poisson's ratio of the target material. An ultrasonic generator is movably disposed on the surface of the target material, generating at least two different ultrasonic signals thereon. An ultrasonic receiver is disposed on the surface of the target material and separated from the ultrasonic generator, receiving the ultrasonic signals. The result of a nano-indentation experiment are applied in the ultrasonic theory and iterated by the ultrasonic experimental data and theory, obtaining the Young's modulus of the target material. The obtained Young's modulus of the target material is substituted back in the result of the nano-indentation experiment, obtaining the Poisson's ratio of the target material.

    摘要翻译: 一种用于检测目标材料的机械性能的纳米压痕超声波检测系统。 设置在目标材料的表面上的压痕装置在表面上产生压痕,获得杨氏模量与目标材料的泊松比之间的关系。 超声波发生器可移动地设置在目标材料的表面上,在其上产生至少两个不同的超声波信号。 超声波接收器设置在目标材料的表面上并与超声波发生器分离,接收超声波信号。 纳米压痕实验的结果应用于超声波理论,并通过超声波实验数据和理论迭代,获得目标材料的杨氏模量。 在纳米压痕实验的结果中,将所得到的材料的杨氏模量取代,得到目标材料的泊松比。

    Display device with point-to-point transmitting technology
    8.
    发明申请
    Display device with point-to-point transmitting technology 审中-公开
    具有点对点传输技术的显示设备

    公开(公告)号:US20070132791A1

    公开(公告)日:2007-06-14

    申请号:US11441941

    申请日:2006-05-25

    申请人: Chien-Yu Yi

    发明人: Chien-Yu Yi

    IPC分类号: G09G5/10

    摘要: A display device with point-to-point transmitting technology is provided. The display device comprises a smart panel and a image processor. Wherein, the smart panel comprises a plurality of source drivers ICs that are coupled to a pixel array for transmitting an image data to the pixel array to drive a plurality of pixels in the pixel array. In addition, the image processor couples to the source driver ICs through a plurality of image data buses, respectively. Each of the image data buses corresponds to one of the source driver ICs.

    摘要翻译: 提供具有点对点传输技术的显示设备。 显示装置包括智能面板和图像处理器。 其中,智能面板包括耦合到像素阵列的多个源极驱动器IC,用于将图像数据传输到像素阵列以驱动像素阵列中的多个像素。 此外,图像处理器分别通过多个图像数据总线耦合到源极驱动器IC。 每个图像数据总线对应于源驱动器IC之一。

    Chamber wafer detection
    10.
    发明授权
    Chamber wafer detection 失效
    室晶片检测

    公开(公告)号:US06938505B2

    公开(公告)日:2005-09-06

    申请号:US10217508

    申请日:2002-08-13

    摘要: An apparatus and method for detecting in chamber wafer position and process status are disclosed. A chamber includes a processing pedestal and plurality of lift pins. Each lift pin has an associated load cell for measuring the load exerted by the wafer on the lift pins. Mispositioned wafers or broken wafers will result in load measurements outside of expected ranges. Position of the wafer may be determined from the load distribution sensed on the lift pins.

    摘要翻译: 公开了一种用于检测室晶片位置和工艺状态的装置和方法。 腔室包括处理基座和多个提升销。 每个提升销具有相关联的称重传感器,用于测量由晶片在提升销上施加的负载。 微小的晶片或破碎的晶片将导致超出预期范围的负载测量。 晶片的位置可以从提升销上感测到的载荷分布确定。