Scanning apparatus with patterned probe light
    5.
    发明授权
    Scanning apparatus with patterned probe light 有权
    带图案探测灯的扫描仪

    公开(公告)号:US09019576B2

    公开(公告)日:2015-04-28

    申请号:US14310248

    申请日:2014-06-20

    Applicant: 3Shape A/S

    CPC classification number: G01B11/2527 G01B11/2513

    Abstract: A 3D scanner for recording the 3D topography of an object, the 3D scanner includes an illumination unit configured for providing probe light for illuminating the object, where the probe light includes a pattern of light rays; an image sensor for acquiring one or more 2D images of light rays returning from the illuminated object; an optical system including an optical element arranged such that the patterned probe light passes through it when propagating towards the object from the illumination unit along an optical path; and a device for changing the configuration of the optical system between a first and a second configuration, where the change in configuration comprises a change in orientation of the optical element between a first orientation and a second orientation relative to the optical path of the probe light.

    Abstract translation: 一种3D扫描器,用于记录物体的3D地形,所述3D扫描仪包括照明单元,其被配置为提供用于照射所述物体的探测光,其中所述探测光包括光线图案; 用于获取从被照射物体返回的光线的一个或多个2D图像的图像传感器; 一种光学系统,包括光学元件,所述光学元件布置成使得当沿着光路从所述照明单元传播朝向所述物体时,所述图案化的探测光穿过所述光学元件; 以及用于在第一和第二配置之间改变光学系​​统的配置的装置,其中配置的变化包括相对于探测光的光路在第一取向和第二取向之间的光学元件的取向的变化 。

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