公开(公告)号：US20250020736A1

公开(公告)日：2025-01-16

申请号：US18768417

申请日：2024-07-10

Applicant: ABB Schweiz AG

Inventor： Lorenzo Privitera ,  Kai Hencken ,  Gerd Schlottig ,  Elsi-Mari Borrelli ,  Wojciech Wysocki ,  Bartlomiej Adamczyk

IPC: G01R31/64 ,  H01G4/18

Abstract: A method for estimating a consumed lifetime of the energy storage device includes measuring a time-series of an environmental relative humidity and a related temperature of the energy storage device; and estimating, based on the time-series and on a moisture diffusion model of the energy storage device, the consumed lifetime of the energy storage device.

公开(公告)号：US20240384976A1

公开(公告)日：2024-11-21

申请号：US18663248

申请日：2024-05-14

Applicant: ABB Schweiz AG

Inventor： Gerd Schlottig ,  Lorenzo Privitera ,  Kai Hencken ,  Wojciech Wysocki ,  Bartlomiej Adamczyk

IPC: G01B7/16 ,  G01K1/143 ,  H01G4/33 ,  H01M10/48

Abstract: A method for estimating a present quality of the energy storage device comprises measuring a first length change of a first surface of the energy storage device; measuring a temperature and/or a second length change of a second surface of the energy storage device; and estimating the present quality of the energy storage device based on the first length change combined with the temperature and/or the second length change of the energy storage device.

公开(公告)号：US20240118333A1

公开(公告)日：2024-04-11

申请号：US18465207

申请日：2023-09-12

Applicant: ABB Schweiz AG

Inventor： Aleksi Vulli ,  Gerd Schlottig ,  Enea Bianda ,  Michal Orkisz ,  Marcin Firla

IPC: G01R31/26 ,  G01R31/27

CPC classification number: G01R31/2619 ,  G01R31/27

Abstract: An apparatus for performing the following. The apparatus maintains, in a memory, information on a computational model for thermal behavior of layers of an insulated-gate bipolar transistor, IGBT, module. The apparatus obtains measurements of the dissipated power at the semiconductors and the ambient temperature and determines one or more current values of one or more temperatures of the IGBT module based on a switching delay of the IGBT module. The apparatus calculates a current estimate of a joint state-parameter space of the computational model using a Bayesian filter and the computational model taking as inputs the dissipated power and the ambient temperature. The joint state-parameter space includes the one or more temperatures, one or more thermal loss parameters and one or more wear parameters. The one or more current values of the one or more temperatures are used as observations in the Bayesian filter.