POWER SEMICONDUCTOR DEVICE WITH ACTIVE SHORT CIRCUIT FAILURE MODE

    公开(公告)号:US20190355633A1

    公开(公告)日:2019-11-21

    申请号:US16528791

    申请日:2019-08-01

    Applicant: ABB Schweiz AG

    Abstract: A power semiconductor device includes a Si chip providing a Si switch and a wide bandgap material chip providing a wide bandgap material switch, wherein the Si switch and the wide bandgap material switch are electrically connected in parallel. A method for controlling a power semiconductor device includes: during a normal operation mode, controlling at least the wide bandgap material switch for switching a current through the power semiconductor device by applying corresponding gate signals to at least the wide bandgap material switch; sensing a failure in the power semiconductor device; and, in the case of a sensed failure, controlling the Si switch by applying a gate signal, such that a current is generated in the Si chip heating the Si chip to a temperature forming a permanent conducting path through the Si chip.

    POWER SEMICONDUCTOR MODULE WITH SHORT CIRCUIT FAILURE MODE

    公开(公告)号:US20190355634A1

    公开(公告)日:2019-11-21

    申请号:US16529295

    申请日:2019-08-01

    Applicant: ABB Schweiz AG

    Abstract: A power semiconductor device includes a base plate; a Si chip including a Si substrate, the Si chip attached to the base plate; a first metal preform pressed with a first press pin against the Si chip; a wide bandgap material chip comprising a wide bandgap substrate and a semiconductor switch provided in the wide bandgap substrate, the wide bandgap material chip attached to the base plate; and a second metal preform pressed with a second press pin against the wide bandgap material chip; the Si chip and the wide bandgap material chip are connected in parallel via the base plate and via the first press pin and the second press pin; the first metal preform is adapted for forming a conducting path through the Si chip, when heated by an overcurrent; and the second metal preform is adapted for forming an temporary conducting path through the wide bandgap material chip or an open circuit, when heated by an overcurrent.

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