Semiconducting element having improved voltage endurance properties
    1.
    发明授权
    Semiconducting element having improved voltage endurance properties 失效
    具有改善的耐压特性的半导体元件

    公开(公告)号:US3922709A

    公开(公告)日:1975-11-25

    申请号:US41666973

    申请日:1973-11-16

    Applicant: ASEA AB

    Abstract: A semiconductor of the kind comprising at least one pn-junction the doping of which in the p-region (n-region) increases continuously or gradually from the pn-junction, and also having an isolating surface layer at least at the marginal portion of said pn-junction. In this semiconductor a first portion of said surface layer is positioned outside the substantially p-doped (ndoped) region, and a second portion of said surface layer is positioned outside the n-doped (p-doped) region of said pnjunction, said first portion having a permanently negative (positive) surface charge relative to said second portion.

    Abstract translation: 一种包括至少一个pn结的半导体,其在p区(n区)中掺杂的至少一个pn结从pn结连续或逐渐增加,并且还具有隔离表面层至少在边界部分 说pn-junction。 在该半导体中,所述表面层的第一部分位于基本p掺杂(n掺杂)区域的外部,并且所述表面层的第二部分位于所述p掺杂(n掺杂)区域的n掺杂(p掺杂)区域的外部, 所述第一部分相对于所述第二部分具有永久的负(正)表面电荷。

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