METROLOGY APPARATUS WITH RADIATION SOURCE HAVING MULTIPLE BROADBAND OUTPUTS

    公开(公告)号:US20210240088A1

    公开(公告)日:2021-08-05

    申请号:US17213983

    申请日:2021-03-26

    IPC分类号: G03F7/20

    摘要: Disclosed is a metrology apparatus for use in a lithographic manufacturing process. The metrology apparatus comprises a radiation source comprising a drive laser having an output split into a plurality of optical paths, each comprising a respective broadband light generator. The metrology apparatus further comprises illumination optics for illuminating a structure, at least one detection system for detecting scattered radiation, having been scattered by the structure and a processor for determining a parameter of interest of the structure from the scattered radiation.

    ASSEMBLY FOR COLLIMATING BROADBAND RADIATION

    公开(公告)号:US20210063900A1

    公开(公告)日:2021-03-04

    申请号:US16995993

    申请日:2020-08-18

    IPC分类号: G03F9/00 G03F7/20

    摘要: An assembly for collimating broadband radiation, the assembly including: a convex refractive singlet lens having a first spherical surface for coupling the broadband radiation into the lens and a second spherical surface for coupling the broadband radiation out of the lens, wherein the first and second spherical surfaces have a common center; and a mount for holding the convex refractive singlet lens at a plurality of contact points having a centroid coinciding with the common center.

    Metrology Apparatus with Radiation Source Having Multiple Broadband Outputs

    公开(公告)号:US20200264521A1

    公开(公告)日:2020-08-20

    申请号:US16789816

    申请日:2020-02-13

    IPC分类号: G03F7/20

    摘要: Disclosed is a metrology apparatus for use in a lithographic manufacturing process. The metrology apparatus comprises a radiation source comprising a drive laser having an output split into a plurality of optical paths, each comprising a respective broadband light generator. The metrology apparatus further comprises illumination optics for illuminating a structure, at least one detection system for detecting scattered radiation, having been scattered by the structure and a processor for determining a parameter of interest of the structure from the scattered radiation.

    TOPOGRAPHY MEASUREMENT SYSTEM
    6.
    发明申请

    公开(公告)号:US20180373171A1

    公开(公告)日:2018-12-27

    申请号:US16061947

    申请日:2016-11-30

    IPC分类号: G03F9/00 G01B11/25

    摘要: A topography measurement system includes a radiation source; a first grating; imaging optics; a movement mechanism; detection optics; a second grating; and a detector. The radiation source is configured to generate a radiation beam and includes a light emitting diode to produce to the radiation. The first grating is configured to pattern the radiation beam. The imaging optics is configured to form a first image of the first grating at a target location on a substrate. The movement mechanism is operable to move the substrate relative to the image of the first grating such that the target location moves relative to the substrate. The detection optics is configured to receive radiation from the target location of the substrate and form an image of the first image at the second grating. The detector is configured to receive radiation transmitted through the second grating and produce an output signal.

    WAVELENGTH COMBINING OF MULTIPLE SOURCE
    9.
    发明申请

    公开(公告)号:US20190049864A1

    公开(公告)日:2019-02-14

    申请号:US16078699

    申请日:2017-02-07

    摘要: A light combiner (500) for use in a metrology tool includes a plurality of light sources (LED 1, LED 2, LED 3, LED 4, LED 5), a first filter (502), and a second filter (504). The first filter is designed to substantially reflect light generated from a first source of the plurality of light sources, and to substantially transmit light generated from a second source of the plurality of light sources. The second filter is designed to substantially reflect light generated from the first source and the second source of the plurality of light sources, and to substantially transmit light generated from a third source of the plurality of light sources. An angle of incidence of the light generated from the first source on a surface of the first filter is less than 30 degrees.