EUV LIGHT SOURCE TARGET METROLOGY
    1.
    发明公开

    公开(公告)号:US20230300965A1

    公开(公告)日:2023-09-21

    申请号:US18016553

    申请日:2021-07-23

    Inventor: Robert Jay Rafac

    CPC classification number: H05G2/008 H05G2/003

    Abstract: Disclosed is an apparatus for and method of aligning a target composed of a target material and a conditioning beam provided to condition the target by changing the target’s shape, mass distribution, etc., in which the conditioning beam includes structured light in the form of an inhomogeneous distribution of a propagation mode such as a polarization mode across a spatial mode of the target.

    Reducing the effect of plasma on an object in an extreme ultraviolet light source

    公开(公告)号:US10904993B2

    公开(公告)日:2021-01-26

    申请号:US16418652

    申请日:2019-05-21

    Abstract: A first target is provided to an interior of a vacuum chamber, a first light beam is directed toward the first target to form a first plasma from target material of the first target, the first plasma being associated with a directional flux of particles and radiation emitted from the first target along a first emission direction, the first emission direction being determined by a position of the first target; a second target is provided to the interior of the vacuum chamber; and a second light beam is directed toward the second target to form a second plasma from target material of the second target, the second plasma being associated with a directional flux of particles and radiation emitted from the second target along a second emission direction, the second emission direction being determined by a position of the second target, the first and second emission directions being different.

    Target expansion rate control in an extreme ultraviolet light source

    公开(公告)号:US10674591B2

    公开(公告)日:2020-06-02

    申请号:US16391890

    申请日:2019-04-23

    Abstract: A method includes providing a target material that comprises a component that emits extreme ultraviolet (EUV) light when converted to plasma; directing a first beam of radiation toward the target material to deliver energy to the target material to modify a geometric distribution of the target material to form a modified target; directing a second beam of radiation toward the modified target, the second beam of radiation converting at least part of the modified target to plasma that emits EUV light; measuring one or more characteristics associated with one or more of the target material and the modified target relative to the first beam of radiation; and controlling an amount of radiant exposure delivered to the target material from the first beam of radiation based on the one or more measured characteristics to within a predetermined range of energies.

    REDUCING THE EFFECT OF PLASMA ON AN OBJECT IN AN EXTREME ULTRAVIOLET LIGHT SOURCE

    公开(公告)号:US20170311429A1

    公开(公告)日:2017-10-26

    申请号:US15137933

    申请日:2016-04-25

    CPC classification number: H05G2/008 H05G2/005 H05G2/006

    Abstract: A first target is provided to an interior of a vacuum chamber, a first light beam is directed toward the first target to form a first plasma from target material of the first target, the first plasma being associated with a directional flux of particles and radiation emitted from the first target along a first emission direction, the first emission direction being determined by a position of the first target; a second target is provided to the interior of the vacuum chamber; and a second light beam is directed toward the second target to form a second plasma from target material of the second target, the second plasma being associated with a directional flux of particles and radiation emitted from the second target along a second emission direction, the second emission direction being determined by a position of the second target, the first and second emission directions being different.

    Extreme ultraviolet light source
    7.
    发明授权

    公开(公告)号:US08866110B2

    公开(公告)日:2014-10-21

    申请号:US14199261

    申请日:2014-03-06

    CPC classification number: H05G2/003 H05G2/005 H05G2/008

    Abstract: Techniques are described that enhance power from an extreme ultraviolet light source with feedback from a target material that has been modified prior to entering a target location into a spatially-extended target distribution or expanded target. The feedback from the spatially-extended target distribution provides a nonresonant optical cavity because the geometry of the path over which feedback occurs, such as the round-trip length and direction, can change in time, or the shape of the spatially-extended target distribution may not provide a smooth enough reflectance. However, it may be possible that the feedback from the spatially-extended target distribution provides a resonant and coherent optical cavity if the geometric and physical constraints noted above are overcome. In any case, the feedback can be generated using spontaneously emitted light that is produced from a non-oscillator gain medium.

    EUV light source target metrology

    公开(公告)号:US12238848B2

    公开(公告)日:2025-02-25

    申请号:US18016553

    申请日:2021-07-23

    Inventor: Robert Jay Rafac

    Abstract: Disclosed is an apparatus for and method of aligning a target composed of a target material and a conditioning beam provided to condition the target by changing the target's shape, mass distribution, etc., in which the conditioning beam includes structured light in the form of an inhomogeneous distribution of a propagation mode such as a polarization mode across a spatial mode of the target.

    Determining moving properties of a target in an extreme ultraviolet light source

    公开(公告)号:US11758639B2

    公开(公告)日:2023-09-12

    申请号:US17416636

    申请日:2020-01-27

    Inventor: Robert Jay Rafac

    CPC classification number: H05G2/008 G01N21/6402 H05G2/006

    Abstract: An apparatus includes: a diagnostic system configured to diagnostically interact with a current target (110c) traveling along a trajectory (TR) and before the current target enters a target space; a first detection apparatus (120) configured to detect first light; a second detection apparatus (130) configured to detect second light; and a control system (150) in communication with the first and second detection apparatuses. The first light includes: light (140) produced from an interaction between the current target and the diagnostic system, and light (142) emitted from a plasma produced by a previous target. The second light includes the light (142) emitted from the plasma produced by the previous target. The control system (150) is configured to: produce an analysis signal based on first and second signals produced from respective outputs of the first and second detection apparatuses; and estimate a property of the current target based on the produced analysis signal.

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