公开(公告)号：US5020894A

公开(公告)日：1991-06-04

申请号：US557330

申请日：1990-07-23

申请人： Adolf Weyrauch ,  Bernd Dorband ,  Ferdinand Schlipf

发明人： Adolf Weyrauch ,  Bernd Dorband ,  Ferdinand Schlipf

IPC分类号： F41G1/38 ,  G02B23/16

CPC分类号： G02B23/16 ,  F41G1/383

摘要： Cover caps to protect the lens and eyepiece of a sighting telescope are resiliently connected by a pair of elastic bands. Each cap is provided with a pair of respective axially-oriented channels, each channel being larger at the end in proximity to the front of its respective cap, and the smaller end of each channel is proportioned to permit one end of one of the elastic bands to be threaded therethrough. Each end portion of each band is first threaded through a respective one of the channels, and then each end portion is folded over and secured to itself to form a thickened endpiece. Thereafter, each endpiece is retracted into its respective channel.

摘要翻译： 用于保护瞄准镜的镜头和目镜的盖帽通过一对弹性带弹性连接。 每个盖设置有一对相应的轴向定向通道，每个通道在其相应盖的前部附近的端部处较大，并且每个通道的较小端部成比例，以允许弹性带中的一个的一端 穿过其中。 每个带的每个端部首先穿过相应的一个通道，然后将每个端部折叠并固定到其自身以形成加厚的端件。 此后，每个端件被缩回到其相应的通道中。

公开(公告)号：US20080043247A1

公开(公告)日：2008-02-21

申请号：US11596187

申请日：2004-05-14

申请人： Ralf Arnold ,  Bernd Dorband ,  Frank Schillke ,  Susanne Beder

发明人： Ralf Arnold ,  Bernd Dorband ,  Frank Schillke ,  Susanne Beder

IPC分类号： G01B11/25

CPC分类号： G01B11/2441

摘要： A method of manufacturing an optical element includes testing the optical element by using an interferometer optics generating a beam of measuring light illuminating only a sub-aperture of the tested optical element. The interferometer optics comprises a hologram. Results of the sub-aperture measurement are stitched together to obtain a measuring result with respect to the full surface of the optical element. Further, a method of calibrating the interferometer optics includes performing an interferometric measurement using a calibrating optics having a hologram covering only a sub-aperture of the full cross section of the beam of measuring light generated by the interferometer optics and stitching together the sub-aperture measurements to obtain a result indicative for the full cross section of the interferometer optics.

摘要翻译： 制造光学元件的方法包括通过使用产生仅照射被测光学元件的子孔径的测量光束的干涉仪光学元件来测试光学元件。 干涉仪光学器件包括全息图。 子孔径测量的结果被缝合在一起以获得关于光学元件的整个表面的测量结果。 此外，校准干涉仪光学器件的方法包括使用校准光学器件执行干涉测量，所述校准光学器件具有仅覆盖由干涉仪光学器件产生的测量光束的全部横截面的子孔径并将子孔缝合在一起的全息图 测量以获得指示干涉仪光学器件的完整横截面的结果。