公开(公告)号：US08451452B2

公开(公告)日：2013-05-28

申请号：US12764510

申请日：2010-04-21

Applicant: Adrian Podoleanu ,  Simon Tuohy

Inventor： Adrian Podoleanu ,  Simon Tuohy

IPC: G01B9/02 ,  G01B11/02

CPC classification number: G01B9/02004 ,  A61B3/1015 ,  A61B3/102 ,  A61B3/156 ,  G01B9/02002 ,  G01B9/0201 ,  G01B9/02027 ,  G01B9/02038 ,  G01B9/02063 ,  G01B9/02068 ,  G01B9/0209 ,  G01B9/02091 ,  G01B2290/45 ,  G01B2290/70

Abstract: Methods and devices are disclosed for acquiring depth resolved aberration information using principles of low coherence interferometry and perform coherence gated wavefront sensing (CG-WFS). The wavefront aberrations is collected using spectral domain low coherence interferometry (SD-LCI) or time domain low coherence interferometry (TD-LCI) principles. When using SD-LCI, chromatic aberrations can also be evaluated. Methods and devices are disclosed in using a wavefront corrector to compensate for the aberration information provided by CG-WFS, in a combined imaging system, that can use one or more channels from the class of (i) optical coherence tomography (OCT), (ii) scanning laser ophthalmoscopy, (iii) microscopy, such as confocal or phase microscopy, (iv) multiphoton microscopy, such as harmonic generation and multiphoton absorption. For some implementations, simultaneous and dynamic aberration measurements/correction with the imaging process is achieved. The methods and devices disclosed can provide wavefront sensing in the presence of stray reflections from optical interfaces.

Abstract translation: 公开了使用低相干干涉测量原理获取深度分辨像差信息并执行相干门控波前检测（CG-WFS）的方法和装置。 使用频域低相干干涉测量（SD-LCI）或时域低相干干涉测量（TD-LCI）原理收集波前像差。 当使用SD-LCI时，也可以评估色差。 在使用波前校正器来补偿在组合成像系统中由CG-WFS提供的像差信息的方法和装置被公开，该组合成像系统可以使用来自（i）光学相干断层扫描（OCT）的一个或多个通道， ii）扫描激光眼底镜检查，（iii）显微镜，如共焦或相位显微镜，（iv）多光子显微镜，如谐波产生和多光子吸收。 对于一些实施方案，实现了通过成像过程的同步和动态像差测量/校正。 所公开的方法和装置可以在存在来自光学接口的杂散反射的情况下提供波前感测。

公开(公告)号：US20110134436A1

公开(公告)日：2011-06-09

申请号：US12764510

申请日：2010-04-21

Applicant: Adrian Podoleanu ,  Simon Tuohy

Inventor： Adrian Podoleanu ,  Simon Tuohy

IPC: G01B11/02

CPC classification number: G01B9/02004 ,  A61B3/1015 ,  A61B3/102 ,  A61B3/156 ,  G01B9/02002 ,  G01B9/0201 ,  G01B9/02027 ,  G01B9/02038 ,  G01B9/02063 ,  G01B9/02068 ,  G01B9/0209 ,  G01B9/02091 ,  G01B2290/45 ,  G01B2290/70

Abstract: Methods and devices are disclosed for acquiring depth resolved aberration information using principles of low coherence interferometry and perform coherence gated wavefront sensing (CG-WFS). The wavefront aberrations is collected using spectral domain low coherence interferometry (SD-LCI) or time domain low coherence interferometry (TD-LCI) principles. When using SD-LCI, chromatic aberrations can also be evaluated. Methods and devices are disclosed in using a wavefront corrector to compensate for the aberration information provided by CG-WFS, in a combined imaging system, that can use one or more channels from the class of (i) optical coherence tomography (OCT), (ii) scanning laser ophthalmoscopy, (iii) microscopy, such as confocal or phase microscopy, (iv) multiphoton microscopy, such as harmonic generation and multiphoton absorption. In particular, a swept source (SS) is used that drives both an OCT channel and a coherence gated wavefront sensor, where: a) both channels operate according to SS-OCT principles; b) OCT channel integrates over at least one tuning scan of the swept source to provide a TD-OCT image of the object; c) CG-WFS integrates over at least one tuning scan of the swept source to provide an en-face TD-OCT mapping of the wavefront. For some implementations, simultaneous and dynamic aberration measurements/correction with the imaging process is achieved. The methods and devices for depth resolved aberrations disclosed, will find applications in wavefront sensing and adaptive optics imaging systems that are more tolerant to stray reflections from optical interfaces, such as reflections from the microscope objectives and cover slip in microscopy and when imaging the eye, the reflection from the cornea.

Abstract translation: 公开了使用低相干干涉测量原理获取深度分辨像差信息并执行相干门控波前检测（CG-WFS）的方法和装置。 使用频域低相干干涉测量（SD-LCI）或时域低相干干涉测量（TD-LCI）原理收集波前像差。 当使用SD-LCI时，也可以评估色差。 在使用波前校正器来补偿在组合成像系统中由CG-WFS提供的像差信息的方法和装置被公开，该组合成像系统可以使用来自（i）光学相干断层扫描（OCT）的一个或多个通道， ii）扫描激光眼底镜检查，（iii）显微镜，如共焦或相位显微镜，（iv）多光子显微镜，如谐波产生和多光子吸收。 特别地，使用驱动OCT通道和相干门控波前传感器的扫频源（SS），其中：a）两个通道根据SS-OCT原理操作; b）OCT信道在扫描源的至少一次调谐扫描上进行积分以提供对象的TD-OCT图像; c）CG-WFS集成了扫描源的至少一个调谐扫描，以提供波前的面向TD-OCT映射。 对于一些实施方案，实现了通过成像过程的同步和动态像差测量/校正。 所公开的用于深度分辨像差的方法和装置将会在波前感测和自适应光学成像系统中应用，这些系统对光学界面的杂散反射更为宽容，例如来自显微镜物镜的反射和显微镜下的盖滑动以及当成像眼睛时， 角膜的反射。