SURFACE EXAMINATION OF COMPONENTS
    1.
    发明申请
    SURFACE EXAMINATION OF COMPONENTS 审中-公开
    组件的表面检查

    公开(公告)号:US20160334377A1

    公开(公告)日:2016-11-17

    申请号:US15152230

    申请日:2016-05-11

    Abstract: An apparatus used for the surface examination of components. The apparatus comprises: a radiation source configured to convert at least one non-volatile substance at least partially into a gas by irradiating a sample surface of a component; and a detector unit configured to qualitatively and/or quantitatively detect the at least one substance converted into gas. A method provided for a surface examination of components. The method comprises irradiating a sample surface of a component with a radiation source configured to convert at least one non-volatile substance at least partially into a gas; and a qualitative and/or quantitative detection of the at least one substance converted into gas via a detector unit.

    Abstract translation: 用于表面检查部件的装置。 该装置包括:辐射源,被配置为通过照射部件的样品表面将至少一种非挥发性物质至少部分地转化成气体; 以及检测器单元,其被配置为定性和/或定量地检测转化为气体的至少一种物质。 一种用于组件表面检查的方法。 该方法包括用配置成将至少一种非挥发性物质至少部分地转化为气体的辐射源照射部件的样品表面; 以及通过检测器单元定性和/或定量地检测转化成气体的至少一种物质。

Patent Agency Ranking