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公开(公告)号：US20130294143A1
公开(公告)日：2013-11-07
申请号：US13936313
申请日：2013-07-08
Applicant: Analog Devices, Inc.
Inventor： James M. Lee , Howard R. Samuels , Thomas W. Kelly
CPC classification number: G11C29/021 , G11C17/14 , G11C17/18 , G11C29/02 , G11C29/027 , G11C29/50 , G11C29/50008 , G11C2029/5006
Abstract: An apparatus and method of testing one-time-programmable memory provides one-time-programmable memory having one or more memory locations for storing data and corresponding programming circuitry for each memory location. In addition, each programming circuitry has a circuit element configured to permanently change state to store the data in the memory. The method also reads each memory location to verify that the memory location is unprogrammed and activates the programming circuitry for each memory location, which applies a test current to the programming circuitry. The test current is less than a threshold current needed to permanently change the state of the circuit element. The method then determines whether the programming circuitry is functioning properly.
Abstract translation: 测试一次可编程存储器的装置和方法提供具有用于存储数据的一个或多个存储器位置的一次可编程存储器和用于每个存储器位置的对应编程电路。 此外，每个编程电路具有被配置为永久地改变状态以将数据存储在存储器中的电路元件。 该方法还读取每个存储器位置以验证存储器位置是否未编程，并激活每个存储器位置的编程电路，其将测试电流施加到编程电路。 测试电流小于永久改变电路元件状态所需的阈值电流。 然后该方法确定编程电路是否正常工作。
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Patent Agency Ranking
公开(公告)号：US20180041198A1
公开(公告)日：2018-02-08
申请号：US15230599
申请日：2016-08-08
Applicant: Analog Devices, Inc.
Inventor： Thomas W. Kelly , Ekin Yagmur Gonen
Abstract: Circuits and techniques are described for reducing the impact of environmental noise and interference on the output signal of a capacitive sensor. The output signal is sampled randomly in some situations by generating a random sampling instant within a fixed clock period. The sampling is performed by a sampling or demodulation circuit. The demodulation circuit may be part of a larger circuit with various components that operate based on a fixed period clock signal.
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公开(公告)号：US10070286B2
公开(公告)日：2018-09-04
申请号：US15166969
申请日：2016-05-27
Applicant: Analog Devices, Inc.
Inventor： Thomas W. Kelly
Abstract: A electronics control unit is in contemporaneous wireless power communication and wireless data communication with a network of sealed, sensors over a shared bidirectional power antenna. Sensors and sensor networks described below enable the development of networks that are secure and robust, and yet are lighter-weight and lower-cost than, for example, conventional automotive sensor networks.
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公开(公告)号：US10673416B2
公开(公告)日：2020-06-02
申请号：US15230599
申请日：2016-08-08
Applicant: Analog Devices, Inc.
Inventor： Thomas W. Kelly , Ekin Yagmur Gonen
Abstract: Circuits and techniques are described for reducing the impact of environmental noise and interference on the output signal of a capacitive sensor. The output signal is sampled randomly in some situations by generating a random sampling instant within a fixed clock period. The sampling is performed by a sampling or demodulation circuit. The demodulation circuit may be part of a larger circuit with various components that operate based on a fixed period clock signal.
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公开(公告)号：US20180041874A1
公开(公告)日：2018-02-08
申请号：US15166969
申请日：2016-05-27
Applicant: Analog Devices, Inc.
Inventor： Thomas W. Kelly
CPC classification number: H04W4/38 , G08C15/02 , G08C15/06 , H02J7/025 , H02J50/20 , H04B5/0031 , H04B5/0037 , H04Q9/00 , H04Q2209/40 , H04Q2209/86 , H04Q2209/88 , H04W84/18
Abstract: A electronics control unit is in contemporaneous wireless power communication and wireless data communication with a network of sealed, sensors over a shared bidirectional power antenna. Sensors and sensor networks described below enable the development of networks that are secure and robust, and yet are lighter-weight and lower-cost than, for example, conventional automotive sensor networks.
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公开(公告)号：US08665627B2
公开(公告)日：2014-03-04
申请号：US13936313
申请日：2013-07-08
Applicant: Analog Devices, Inc.
Inventor： James M. Lee , Howard R. Samuels , Thomas W. Kelly
IPC: G11C17/00
CPC classification number: G11C29/021 , G11C17/14 , G11C17/18 , G11C29/02 , G11C29/027 , G11C29/50 , G11C29/50008 , G11C2029/5006
Abstract: An apparatus and method of testing one-time-programmable memory provides one-time-programmable memory having one or more memory locations for storing data and corresponding programming circuitry for each memory location. In addition, each programming circuitry has a circuit element configured to permanently change state to store the data in the memory. The method also reads each memory location to verify that the memory location is unprogrammed and activates the programming circuitry for each memory location, which applies a test current to the programming circuitry. The test current is less than a threshold current needed to permanently change the state of the circuit element. The method then determines whether the programming circuitry is functioning properly.
Abstract translation: 测试一次可编程存储器的装置和方法提供具有用于存储数据的一个或多个存储器位置的一次可编程存储器和用于每个存储器位置的对应编程电路。 此外，每个编程电路具有被配置为永久地改变状态以将数据存储在存储器中的电路元件。 该方法还读取每个存储器位置以验证存储器位置是否未编程，并激活每个存储器位置的编程电路，其将测试电流施加到编程电路。 测试电流小于永久改变电路元件状态所需的阈值电流。 然后该方法确定编程电路是否正常工作。
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