公开(公告)号：US20060292632A1

公开(公告)日：2006-12-28

申请号：US11374287

申请日：2006-04-20

申请人： Andreas Hecker

发明人： Andreas Hecker

IPC分类号： G01N33/53 ,  C12M1/34

CPC分类号： G01N21/6486 ,  G01N21/6458 ,  G01N21/648 ,  G02B21/16

摘要： A method of ascertaining the orientation of molecules in a biological specimen by total internal reflection includes focusing illuminating light through an objective in different positions in a plane of a pupil of the objective so as to generate a plurality of respective differently oriented evanescent fields in the specimen. Respective different fluorescence intensities resulting from the differently oriented evanescent fields are correlated with respective different orientations of molecules in the specimen.

摘要翻译： 通过全内反射来确定生物样品中分子的取向的方法包括将目标的照明光聚焦在物镜的瞳孔平面中的不同位置，以便在样本中产生多个相应的不同取向的渐逝场 。 由不同取向的消逝场产生的各自不同的荧光强度与样品中分子的各自不同取向相关。

公开(公告)号：US07746552B2

公开(公告)日：2010-06-29

申请号：US12435208

申请日：2009-05-04

申请人： Andreas Hecker ,  Werner Knebel ,  Kyra Moellmann ,  Heinrich Ulrich

发明人： Andreas Hecker ,  Werner Knebel ,  Kyra Moellmann ,  Heinrich Ulrich

IPC分类号： G02B21/06

CPC分类号： G02B21/06

摘要： A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.

摘要翻译： 具有产生用于渐逝照射样本的照明光束的光源的显微镜包括可以改变照明光束的偏振的调节机构。

公开(公告)号：US07405874B2

公开(公告)日：2008-07-29

申请号：US11499896

申请日：2006-08-07

申请人： Andreas Hecker

发明人： Andreas Hecker

IPC分类号： G02B21/02

CPC分类号： G02B21/18 ,  G02B21/084 ,  G02B21/16

摘要： The invention relates to a microscope for conventional fluorescence microscopy (Epi fluorescence) and for total internal reflection microscopy, including at least one light source (1) for the conventional fluorescence illumination and at least one light source (2) for the evanescent illumination, and including an objective (4), wherein the illuminating light coming from the light sources (1, 2) on different illumination paths (5, 6) enters the objective (4) via a beam combiner (7) and from there is passed to the sample (8), characterized in that the exit pupil of the objective (4) is imaged on the beam combiner (7) and the beam combiner is structured such that it guides the illuminating light used for the conventional fluorescence illumination and the illuminating light used for the evanescent illumination into the objective (4) along beam paths (5, 6) which are geometrically separate from one another, and preferably run parallel or coaxially to one another.

摘要翻译： 本发明涉及用于常规荧光显微镜（Epi荧光）和全内反射显微镜的显微镜，其包括用于常规荧光照明的至少一个光源（1）和用于ev逝照明的至少一个光源（2），以及 包括物镜（4），其中来自不同照明路径（5,6）上的光源（1,2）的照明光通过光束组合器（7）进入物镜（4），并从那里被传递到 样品（8），其特征在于物镜（4）的出射光瞳成像在光束组合器（7）上，并且光束组合器被构造成使得它引导用于常规荧光照明的照明光和所使用的照明光 用于沿着彼此几何分离的光束路径（5,6）沿着物镜（4）的渐逝照明，并且优选彼此平行或同轴地延伸。

公开(公告)号：US08771589B2

公开(公告)日：2014-07-08

申请号：US11577327

申请日：2005-11-14

申请人： Werner Menk ,  Rolf Rietzscher ,  Andreas Hecker ,  Torsten Rieck

发明人： Werner Menk ,  Rolf Rietzscher ,  Andreas Hecker ,  Torsten Rieck

IPC分类号： C22C37/04 ,  C22C37/06 ,  C22C37/10

CPC分类号： C22C37/04

摘要： A spheriodal cast alloy for producing cast iron products with great mechanical strength, high-wear resistance and a high degree of ductility. The alloy comprises the following as non-iron components: between 2.5 and 2.8 wt. % C, between 2.4 and 3.4 wt. % Si, between 0.02 and 0.08 wt. % P, between 0.02 and 0.06 wt. % Mg, between 0.01 and 0.05 wt. % Cr, between 0.002 and 0.02 wt. % Al, between 0.0005 and 0.015 wt. % S, between 0.0002 and 0.002 wt. % B and conventional impurities. The alloy contains between 3.0 and 3.7 wt. % C, between 2.6 and 3.4 wt. % Si, between 0.02 and 0.05 wt. % P, between 0.025 and 0.045 wt. % Mg, between 0.01 and 0.03 wt. % Cr, between 0.003 and 0.017 wt. % Al, between 0.0005 and 0.012 wt. % S and between 0.0004 and 0.002 wt. % B. The alloy is used for example to produce chassis parts or brake discs in the automobile industry.

摘要翻译： 用于生产具有很好的机械强度，高耐磨性和高延展性的铸铁产品的球状铸造合金。 该合金包括以下作为非铁组分：2.5至2.8重量％ ％C，2.4〜3.4wt。 ％Si，0.02〜0.08重量％ ％P，0.02〜0.06重量％ ％Mg，0.01〜0.05wt。 ％Cr，0.002至0.02重量％ ％Al，0.0005-0.015wt。 ％S，0.0002和0.002wt。 ％B和常规杂质。 该合金含有3.0至3.7wt。 ％C，2.6〜3.4wt。 ％Si，0.02-0.05wt。 ％P，0.025〜0.045重量％ ％Mg，0.01〜0.03wt。 ％Cr，0.003-0.017wt。 ％Al，0.0005至0.012wt。 ％S和0.0004和0.002重量％之间。 ％B。该合金用于例如在汽车工业中生产底盘部件或制动盘。

公开(公告)号：US08559103B2

公开(公告)日：2013-10-15

申请号：US12526777

申请日：2008-02-08

申请人： Andreas Hecker

发明人： Andreas Hecker

IPC分类号： G02B21/06 ,  G02B21/00 ,  G02B21/10 ,  G02B27/10

CPC分类号： G02B21/06 ,  G02B21/00 ,  G02B21/084 ,  G02B21/16 ,  G02B27/10

摘要： A microscope for conventional fluorescence microscopy (epi-fluorescence) and for total internal reflection microscopy is described. A first light source emits conventional fluorescent illumination light along a first illumination path and a second light source emitting evanescent illumination light along a second illumination path that differs from the first illumination path. An objective emits light onto an object to be viewed. A beam combiner directs the two lights into the objective while keeping their beam paths geometrically separated. The beam combiner comprises at least two spatially separated first zones for coupling in the conventional fluorescent illumination light and at least two spatially separated second zones for coupling in the evanescent illumination light. The first and second zones are adapted in their size and position to objective pupils of different objectives.

摘要翻译： 描述了常规荧光显微镜（epi-fluorescence）和全内反射显微镜的显微镜。 第一光源沿着第一照明路径发射常规荧光照明光，并沿着与第一照明路径不同的第二照明路径发射消逝照明光的第二光源。 物体将光照射到待观察的物体上。 光束组合器将两个光引导到物镜中，同时保持其光束路径几何分开。 光束组合器包括用于在常规荧光照明光中耦合的至少两个空间上分离的第一区域和用于在渐逝照明光中耦合的至少两个空间上分离的第二区域。 第一和第二区域的尺寸和位置适应不同目标的客观学生。

公开(公告)号：US20100118394A1

公开(公告)日：2010-05-13

申请号：US12526777

申请日：2008-02-08

申请人： Andreas Hecker

发明人： Andreas Hecker

IPC分类号： G02B21/06

CPC分类号： G02B21/06 ,  G02B21/00 ,  G02B21/084 ,  G02B21/16 ,  G02B27/10

摘要： A microscope for conventional fluorescence microscopy (epi-fluorescence) and for total internal reflection microscopy, comprising at least one light source (1) for the conventional fluorescent illumination and at least one light source (2) for the evanescent illumination, and comprising an objective (4), wherein the illumination light coming from the light sources (1, 2) on different illumination paths (5, 6) is passed via a beam combiner (7) into the objective (4) and from there to the specimen (8), the beam combiner (7) being structured such that it directs the illumination light used for the conventional fluorescent illumination and the illumination light used for the evanescent illumination into the objective (4) in geometrically separated beam paths (5, 6), is characterized in that the beam combiner (7) has at least two spatially separated zones (9, 10) for coupling in the illumination light used for the conventional fluorescent illumination and at least two spatially separated zones (11, 12) for coupling in the illumination light used for the evanescent illumination, the individual zones being adapted in their size and position to the objective pupils of different objectives (4).

摘要翻译： 用于常规荧光显微镜（epi-fluorescence）和全内反射显微镜的显微镜，包括用于常规荧光照明的至少一个光源（1）和用于ev逝照明的至少一个光源（2），并且包括物镜 （4），其中来自不同照明路径（5,6）上的光源（1,2）的照明光通过光束组合器（7）进入物镜（4）并从那里到达标本（8） ），所述光束组合器（7）被构造成使得其将用于常规荧光照明的照明光和用于ev逝照明的照明光引导到几何分离的光束路径（5,6）中的物镜（4）中，是 其特征在于，所述光束组合器（7）具有用于在用于常规荧光照明的照明光中耦合的至少两个空间上分离的区域（9,10）和至少两个空间分离的z （11,12），用于在用于ev逝照明的照明光中耦合，各个区域的大小和位置适应于不同目标（4）的目标瞳孔。

公开(公告)号：US07633622B2

公开(公告)日：2009-12-15

申请号：US11414905

申请日：2006-05-01

申请人： Andreas Hecker ,  Heinrich Ulrich ,  Werner Knebel ,  Kyra Moellmann

发明人： Andreas Hecker ,  Heinrich Ulrich ,  Werner Knebel ,  Kyra Moellmann

IPC分类号： G01N21/55

CPC分类号： G02B21/082 ,  G02B21/0032 ,  G02B21/008 ,  G02B21/02 ,  G02B21/06 ,  G02B21/08 ,  G02B21/16 ,  G02B21/32

摘要： A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.

摘要翻译： 公开了具有ev逝样品照明的显微镜和用于测试样品的方法。 产生在样品中呈现第一穿透深度的第一渐逝场和在样品中显示大于第一穿透深度的第二穿透深度的第二渐逝场。 提供一种检测器，其检测第一检测光，该第一检测光从第一消逝场照射的样品的一部分离开，并从其产生第一检测光数据，并且第二检测光从样品的一部分离开 具有第二消逝场，并且从其产生第二检测光数据。 此外，提供处理模块来处理第一和第二检测光数据。

公开(公告)号：US20090047164A1

公开(公告)日：2009-02-19

申请号：US11577327

申请日：2005-11-14

申请人： Werner Menk ,  Rolf Rietzscher ,  Andreas Hecker ,  Torsten Rieck

发明人： Werner Menk ,  Rolf Rietzscher ,  Andreas Hecker ,  Torsten Rieck

IPC分类号： C22C37/04 ,  B22D23/00

CPC分类号： C22C37/04

摘要： A spheriodal cast alloy for producing cast iron products with great mechanical strength, high-wear resistance and a high degree of ductility. The alloy comprises the following as non-iron components: between 2.5 and 2.8 wt. % C, between 2.4 and 3.4 wt. % Si, between 0.02 and 0.08 wt. % P, between 0.02 and 0.06 wt. % Mg, between 0.01 and 0.05 wt. % Cr, between 0.002 and 0.02 wt. % Al, between 0.0005 and 0.015 wt. % S, between 0.0002 and 0.002 wt. % B and conventional impurities. The alloy contains between 3.0 and 3.7 wt. % C, between 2.6 and 3.4 wt. % Si, between 0.02 and 0.05 wt. % P, between 0.025 and 0.045 wt. % Mg, between 0.01 and 0.03 wt. % Cr, between 0.003 and 0.017 wt. % Al, between 0.0005 and 0.012 wt. % S and between 0.0004 and 0.002 wt. % B. The alloy is used for example to produce chassis parts or brake discs in the automobile industry.

摘要翻译： 用于生产具有很好的机械强度，高耐磨性和高延展性的铸铁产品的球状铸造合金。 该合金包括以下作为非铁组分：2.5至2.8重量％ ％C，2.4〜3.4wt。 ％Si，0.02〜0.08重量％ ％P，0.02〜0.06重量％ ％Mg，0.01〜0.05wt。 ％Cr，0.002至0.02重量％ ％Al，0.0005-0.015wt。 ％S，0.0002和0.002wt。 ％B和常规杂质。 该合金含有3.0至3.7wt。 ％C，2.6〜3.4wt。 ％Si，0.02-0.05wt。 ％P，0.025〜0.045重量％ ％Mg，0.01〜0.03wt。 ％Cr，0.003-0.017wt。 ％Al，0.0005至0.012wt。 ％S和0.0004和0.002重量％之间。 ％B。该合金用于例如在汽车工业中生产底盘部件或制动盘。

公开(公告)号：US20080151226A1

公开(公告)日：2008-06-26

申请号：US11414905

申请日：2006-05-01

申请人： Andreas Hecker ,  Heinrich Ulrich ,  Werner Knebel ,  Kyra Moellmann

发明人： Andreas Hecker ,  Heinrich Ulrich ,  Werner Knebel ,  Kyra Moellmann

IPC分类号： G01N21/00

CPC分类号： G02B21/082 ,  G02B21/0032 ,  G02B21/008 ,  G02B21/02 ,  G02B21/06 ,  G02B21/08 ,  G02B21/16 ,  G02B21/32

摘要： A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.

摘要翻译： 公开了具有ev逝样品照明的显微镜和用于测试样品的方法。 产生在样品中呈现第一穿透深度的第一渐逝场和在样品中显示大于第一穿透深度的第二穿透深度的第二渐逝场。 提供一种检测器，其检测第一检测光，该第一检测光从第一消逝场照射的样品的一部分离开，并从其产生第一检测光数据，并且第二检测光从样品的一部分离开 具有第二消逝场，并且从其产生第二检测光数据。 此外，提供处理模块来处理第一和第二检测光数据。

公开(公告)号：US07948629B2

公开(公告)日：2011-05-24

申请号：US12063613

申请日：2006-08-11

申请人： Andreas Hecker

发明人： Andreas Hecker

IPC分类号： G01N21/55

CPC分类号： G02B21/10 ,  G02B21/084

摘要： A microscope for total internal reflection microscopy. The microscope includes at least one light source configured to provide an illumination light to an illumination beam path for an evanescent illumination of a specimen so as to reflect the illumination light at an interface to the specimen or a specimen cover so as to return reflection light into the illumination beam path, an objective through which the illumination light and detection light are directable, a detection device, and a coupling device. The coupling device includes a mirror disposed in the illumination beam path. The mirror has a reflecting surface and a hole, the hole being configured to pass the illumination light there through so as to couple the illumination light into the illumination beam path. The reflecting surface is configured to couple out at least a part of the reflection light and to direct the coupled-out reflection light to the detection devices so as to enable determination from a beam path of the coupled-out reflection light, at least one of a quantifiable parameter and a qualifiable parameter of at least one of the evanescent illumination and an evanescent field created in the specimen.

摘要翻译： 全内反射显微镜的显微镜。 所述显微镜包括至少一个光源，所述至少一个光源被配置为向照明光束路径提供照明光，用于对于所述样本的ev逝照明，以将所述照明光反射到与所述检体或样本盖的界面处，以将反射光返回 照明光束路径，照明光和检测光可以被定向的物体，检测装置和联接装置。 联接装置包括设置在照明光束路径中的反射镜。 反射镜具有反射表面和孔，该孔被配置为使照射光通过其中，以将照明光耦合到照明光束路径中。 反射表面被配置为耦合出至少一部分反射光并将耦合的反射光引导到检测装置，以便能够从耦合出的反射光的光束路径确定至少一个 在该样本中产生的渐逝照射和消逝场中的至少一个的可量化参数和可限定参数。