摘要:
The present invention relates to a surgical microscopy system, comprising a surgical microscope, a stand comprising a base and a plurality of pivotally connected arms, the surgical microscope being mounted to one of the arms, wherein the pivotally connected arms are arranged to be movable with respect to each other such that the surgical microscope is movable relative to the base, and wherein a conventionally provided lead is replaced by one or more leads fulfilling the function of the single lead together. The present invention also relates to a surgical microscopy system, wherein data or/and energy is transmitted to the surgical microscope by wireless transmission.
摘要:
The present invention relates to a surgical microscopy system, comprising a surgical microscope, a stand comprising a base and a plurality of pivotally connected arms, the surgical microscope being mounted to one of the arms, wherein the pivotally connected arms are arranged to be movable with respect to each other such that the surgical microscope is movable relative to the base, and wherein a conventionally provided lead is replaced by one or more leads fulfilling the function of the single lead together. The present invention also relates to a surgical microscopy system, wherein data or/and energy is transmitted to the surgical microscope by wireless transmission.
摘要:
The present invention relates to a surgical microscopy system, comprising a surgical microscope, a stand comprising a base and a plurality of pivotally connected arms, the surgical microscope being mounted to one of the arms, wherein the pivotally connected arms are arranged to be movable with respect to each other such that the surgical microscope is movable relative to the base, and wherein a conventionally provided lead is replaced by one or more leads fulfilling the function of the single lead together. The present invention also relates to a surgical microscopy system, wherein data or/and energy is transmitted to the surgical microscope by wireless transmission.
摘要:
An apparatus for optically inspecting an at least partially reflecting surface of an object includes first and second transverse carriers (12, 14) defining respective substantially circular segment-shaped cutouts (32). The transverse carriers (12, 14) are disposed at a longitudinal distance (D) from one another and the longitudinal distance (D) defines a longitudinal direction (17). A plurality of longitudinal members are configured to hold the first and second transverse carriers at the longitudinal distance (D). The longitudinal members are arranged at a defined radial distance to the circular segment-shaped cutouts. A translucent diffusing screen is held in the circular segment-shaped cutouts by the transverse carriers to form a tunnel-shaped inspection space. A multiplicity of light sources are arranged outside of the tunnel-shaped inspection space behind the diffusing screen. The light sources are configured to be controlled individually or in small groups to generate variable light-dark patterns on the diffusing screen. A workpiece receptacle is configured for accommodating the object in the tunnel-shaped inspection space. At least one camera is directed into the tunnel-shaped inspection space. An evaluation and control unit is configured to control the light sources and the camera to generate various light-dark patterns on the diffusing screen and to record and evaluate a plurality of images of the object in dependence on the light-dark patterns.
摘要:
The focusing operation of a microscope, control rotary knobs which receive the motion of fingers or hand of an operator to change the focus position relative to a sample under observation. Two of the control rotary knobs are on a common shaft and coaxial with one another and rotationally fixed with respect to one another, and are connected to a position encoder. A toggle switch which is connected to the control circuit and can be actuated by touching or moving one or both rotary control knobs. Whereby the drive circuit is configured such that it generates, as a function of the rotation of the two rotary knobs and as a function of the actuation or position of the toggle switch, a rough or fine adjustment of the focus position relative to the sample under observation.
摘要:
An apparatus for optically inspecting an at least partially reflecting surface of an object includes first and second transverse carriers (12, 14) defining respective substantially circular segment-shaped cutouts (32). The transverse carriers (12, 14) are disposed at a longitudinal distance (D) from one another and the longitudinal distance (D) defines a longitudinal direction (17). A plurality of longitudinal members are configured to hold the first and second transverse carriers at the longitudinal distance (D). The longitudinal members are arranged at a defined radial distance to the circular segment-shaped cutouts. A translucent diffusing screen is held in the circular segment-shaped cutouts by the transverse carriers to form a tunnel-shaped inspection space. A multiplicity of light sources are arranged outside of the tunnel-shaped inspection space behind the diffusing screen. The light sources are configured to be controlled individually or in small groups to generate variable light-dark patterns on the diffusing screen. A workpiece receptacle is configured for accommodating the object in the tunnel-shaped inspection space. At least one camera is directed into the tunnel-shaped inspection space. An evaluation and control unit is configured to control the light sources and the camera to generate various light-dark patterns on the diffusing screen and to record and evaluate a plurality of images of the object in dependence on the light-dark patterns.