公开(公告)号：US20170336323A1

公开(公告)日：2017-11-23

申请号：US15671869

申请日：2017-08-08

申请人： SubTeraNDT Limited

发明人： Christopher Mark MANN ,  Joseph Peter DUNNE

IPC分类号： G01N21/3581 ,  G01N17/04 ,  G01N21/3563 ,  G01N22/04 ,  G01N17/00 ,  G01N21/55 ,  G01N21/47 ,  G01N21/952 ,  G01N22/02 ,  G01N21/88 ,  G01N21/84

CPC分类号： G01N21/3581 ,  G01N17/006 ,  G01N17/04 ,  G01N21/3563 ,  G01N21/4738 ,  G01N21/55 ,  G01N21/952 ,  G01N22/02 ,  G01N22/04 ,  G01N2021/4764 ,  G01N2021/8427 ,  G01N2021/8812

摘要： Wide-angled incoherent millimetre or sub-millimetre electromagnetic waves from an extended active source are used to probe substrates and their protective coatings or outer layers, such as paint or thermal insulation. The incoherent waves provide dispersion and angular variation with respect to angular incidence to the substrate. Illumination of the substrate permits differentiation between un-corroded and corroded sections of the sample because reflectivity, emissivity and/or transmissivity from the substrate or protective coating various according to its homogeneousness. A detector/camera is arranged to identify and resolve differences in detected power within an observed frequency range of the area under test, with this contrast in power being relative to either adjacent areas or anticipated reference levels. The power differences therefore signify the presence or lack of corrosion or, indeed, the presence of anomalies within or on the substrate or in or under the protective coating or layer applied to the substrate.

公开(公告)号：US20170328838A1

公开(公告)日：2017-11-16

申请号：US15499123

申请日：2017-04-27

申请人： JTEKT CORPORATION

发明人： Jiro UMEHARA

IPC分类号： G01N21/88

CPC分类号： G01N21/8803 ,  G01N21/8806 ,  G01N21/95 ,  G01N2021/8812

摘要： A visual inspection device is an inspection device using an image obtained by shooting an inspection surface of an object to be inspected with a camera disposed so as to face the inspection surface. The object to be inspected is a rolling bearing and the inspection surface is a surface included in an outer ring of the rolling bearing. A lighting device emits light from a light source as diffused light to the inspection surface in a direction different from a direction in which the camera shoots the inspection surface, and the camera shoots the inspection surface irradiated with the diffused light.

公开(公告)号：US09746423B2

公开(公告)日：2017-08-29

申请号：US14278712

申请日：2014-05-15

申请人： ETS-Lindgren Inc.

发明人： Bryan Howard Sayler ,  Michael David Foegelle ,  Garth Anthony D'Abreu

IPC分类号： G01N21/88 ,  G01R29/08 ,  G01N29/00 ,  G01N21/47

CPC分类号： G01N21/8806 ,  G01N21/474 ,  G01N29/00 ,  G01N2021/8812 ,  G01N2201/0631 ,  G01R29/0821 ,  Y10T29/49716

摘要： A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.

公开(公告)号：US09518918B2

公开(公告)日：2016-12-13

申请号：US14770159

申请日：2013-09-23

申请人： SubTeraNDT Limited

发明人： Christopher Mark Mann ,  Joseph Peter Dunne

IPC分类号： G01J5/02 ,  G01N21/3581 ,  G01N17/00 ,  G01N21/47 ,  G01N21/952 ,  G01N17/04 ,  G01N21/55 ,  G01N22/04 ,  G01N21/84 ,  G01N21/88

CPC分类号： G01N21/3581 ,  G01N17/006 ,  G01N17/04 ,  G01N21/3563 ,  G01N21/4738 ,  G01N21/55 ,  G01N21/952 ,  G01N22/02 ,  G01N22/04 ,  G01N2021/4764 ,  G01N2021/8427 ,  G01N2021/8812

摘要： Incoherent millimeter wave, sub-millimeter wave and terahertz test signals are used to probe metal substrates that are covered by a protective coating or outer layer, such as paint or thermal insulation, obscuring direct assessment of the substrate. The incoherent test signals, which may be from a naturally occurring passive source (such as the sky) and/or from an active noise source, provide signal dispersion and angular variation of the test signals with respect to angular incidence to the substrate. Illumination of the substrate permits differentiation between un-corroded and corroded sections of the sample because reflectivity (and emissivity) from a metal-based substrate is heavily dependent on the surface resistivity which in turn is dependent on the corroded state. A detector/camera is arranged to pick up reflections from the substrate and an associated control system identifies regions of the sample that reflect the test signal illumination differently or otherwise indicate a variation from a reference value. The differences therefore signify the presence or lack of corrosion or, indeed, the presence of other abnormalities within or on the substrate.

摘要翻译： 不相干毫米波，亚毫米波和太赫兹测试信号用于探测由保护涂层或外层覆盖的金属基底，例如油漆或隔热层，掩盖了对基底的直接评估。 可能来自天然存在的被动源（例如天空）和/或来自有源噪声源的非相干测试信号相对于基底的角入射提供了测试信号的信号色散和角度变化。 衬底的照明允许在样品的未腐蚀和腐蚀部分之间进行区分，因为来自金属基底层的反射率（和发射率）严重依赖于表面电阻率，反过来依赖于腐蚀状态。 检测器/照相机布置成从衬底拾取反射，并且相关联的控制系统识别反映测试信号照明的区域的区域不同或以其他方式指示与参考值的变化。 因此，这些差异意味着存在或缺乏腐蚀，或者确实存在底物内或基底上的其他异常现象。

公开(公告)号：US08746924B2

公开(公告)日：2014-06-10

申请号：US13416770

申请日：2012-03-09

申请人： Amir Shirkhodaie ,  Robert Moriarty ,  Kong Ma

发明人： Amir Shirkhodaie ,  Robert Moriarty ,  Kong Ma

IPC分类号： F21V5/00

CPC分类号： G01N21/8806 ,  G01N2021/8812

摘要： An apparatus for an illumination system including a concentric light source providing a quantity of light; a diffusion shield to diffuse the light and produce a diffused illumination where the diffused illumination is provided to a component positioned in an interior portion of the diffusion shield; a support structure where the diffusion shield is mechanically coupled with the support structure at a first base portion of the diffusion shield and where the concentric light sources are mechanically coupled with the support structure and positioned radially outward from the first base portion of the diffusion shield; and a harvesting shield where the harvesting shield is mechanically coupled with the support structure and positioned radially outward from the concentric light sources and where the harvesting shield redirects at least a portion of the quantity of light from the concentric light sources towards the diffusion shield.

摘要翻译： 一种照明系统的装置，包括提供一定量的光的同心光源; 扩散屏蔽，用于漫射光并产生扩散照明，其中扩散照明被提供给位于扩散屏蔽的内部中的部件; 支撑结构，其中所述扩散屏蔽在所述扩散屏蔽的第一基部处与所述支撑结构机械耦合，并且所述同心光源与所述支撑结构机械耦合并且从所述扩散屏蔽的所述第一基部径向向外定位; 收割罩与采收屏蔽机构与支撑结构机械耦合并且从同心光源径向向外定位，并且收集屏蔽将至少一部分来自同心光源的光重新定向到扩散屏蔽。

公开(公告)号：US20100128261A1

公开(公告)日：2010-05-27

申请号：US12593981

申请日：2007-12-28

申请人： Carlos Gonzalez Spinola ,  Francisco Garcia Vacas ,  Manuel Jesus Martin Vazquez ,  Julio Vizoso Laporte ,  Servando Espejo Meana ,  Juan Miguel Canero Nieto ,  Sergio Morillas Castillo ,  Domingo Guinea Diaz ,  Eugenio Villanueva Martinez ,  David Martin Gomez ,  José Maria D. Bonello Sánchez

发明人： Carlos Gonzalez Spinola ,  Francisco Garcia Vacas ,  Manuel Jesus Martin Vazquez ,  Julio Vizoso Laporte ,  Servando Espejo Meana ,  Juan Miguel Canero Nieto ,  Sergio Morillas Castillo ,  Domingo Guinea Diaz ,  Eugenio Villanueva Martinez ,  David Martin Gomez ,  José Maria D. Bonello Sánchez

IPC分类号： G01N21/892 ,  G01N21/86

CPC分类号： B65H26/02 ,  B07C5/10 ,  B07C5/3422 ,  B21C51/00 ,  B65H2553/30 ,  B65H2553/42 ,  B65H2701/173 ,  G01N21/8901 ,  G01N21/8903 ,  G01N21/8914 ,  G01N2021/8812 ,  G01N2021/8838 ,  G01N2021/8918

摘要： Specially designed for the fully automated detection of residual oxide stains (residual scale) and classification thereof in metal sheet production lines, with no to stop the line, the invention consists of a framework or box (4) equipped with means for movement (8) over the surface of the metal sheet (2) to be examined, containing a high-resolution CCD camera (1), a high-power lighting unit (6-7) and a diffuse light generator; the video signal of the camera is sent to a PC (3) equipped with software for processing the images obtained, so that the residual oxide stains may be detected and classified. The movement of said box or framework (4) is controlled by a programmable automaton (14), also connected to said PC (3).

摘要翻译： 本发明专门设计用于在金属片材生产线中完全自动检测残余氧化物污渍（残余刻度）及其分类，而不会停止生产线，本发明由装备有移动装置（8）的框架或箱体（4）组成， 在包含高分辨率CCD照相机（1），大功率照明单元（6-7）和漫射光发生器的被检查金属片（2）的表面上; 相机的视频信号被发送到配备有用于处理所获得的图像的软件的PC（3），使得可以检测和分类残留的氧化物污渍。 所述盒或框架（4）的移动由也可连接到所述PC（3）的可编程自动机（14）控制。

公开(公告)号：US07599727B2

公开(公告)日：2009-10-06

申请号：US11227767

申请日：2005-09-15

申请人： Eyal Teichman ,  Avner Schrift

发明人： Eyal Teichman ,  Avner Schrift

IPC分类号： A61B5/05 ,  G06K9/00 ,  G01N21/47

CPC分类号： G01N21/8806 ,  A61F2/82 ,  G01N21/95 ,  G01N21/9515 ,  G01N21/952 ,  G01N21/954 ,  G01N21/956 ,  G01N2021/8812 ,  G01N2021/8825 ,  G01N2021/8832 ,  G01N2021/8887 ,  G01N2201/021 ,  G01N2201/0633 ,  G01N2201/0634 ,  G01N2201/0636

摘要： A system for lighting a stent, i.e., providing an illumination source, to facilitate the capturing of an image of the stent. The lighting is provided so that an image capturing device, e.g., a digital camera or system, will capture an image that distinctly shows the difference between the stent and any surface upon which the stent is mounted, in addition to sharply defining the edges of the stent struts.

摘要翻译： 一种用于照明支架的系统，即提供照明源，以便于捕获支架的图像。 提供照明，使得诸如数字照相机或系统的图像捕获装置将捕获明显地显示支架和安装支架的任何表面之间的差异的图像，除了明确地限定 支架支柱

公开(公告)号：US20080085940A1

公开(公告)日：2008-04-10

申请号：US11926637

申请日：2007-10-29

申请人： Jeffrey Schuster ,  Sudarsan Srinivasan ,  Thor Wilbanks

发明人： Jeffrey Schuster ,  Sudarsan Srinivasan ,  Thor Wilbanks

IPC分类号： A61K47/30 ,  G01B11/24 ,  G01N21/00 ,  G01J3/00

CPC分类号： G01N21/894 ,  B01D67/0034 ,  B01D2323/34 ,  B01D2323/50 ,  G01N2021/8812

摘要： Method for fabricating and inspecting small holes in a material are disclosed. The method includes directing light onto the material and through the holes formed in the material, and then collecting the light passing through the holes in the material onto a detector. The methods further include analyzing the light for properties of the holes, and modifying the process based these detected properties.

摘要翻译： 公开了一种用于制造和检查材料中的小孔的方法。 该方法包括将光引导到材料上并穿过形成在材料中的孔，然后将通过材料中的孔的光聚集到检测器上。 所述方法还包括分析光的孔的性质，以及基于这些检测到的特性修改过程。

公开(公告)号：US20050004956A1

公开(公告)日：2005-01-06

申请号：US10612790

申请日：2003-07-02

申请人： Behnam Pourdeyhimi

发明人： Behnam Pourdeyhimi

IPC分类号： D21G9/00 ,  G01N20060101 ,  G01N21/86 ,  G01N21/89 ,  G01N21/898 ,  G06E1/04 ,  G06F9/00 ,  G06F15/00 ,  G06K9/00 ,  G06T7/00 ,  G06T7/40

CPC分类号： G01N21/8983 ,  D21G9/0009 ,  G01N21/86 ,  G01N21/8914 ,  G01N21/8915 ,  G01N33/346 ,  G01N33/365 ,  G01N2021/8681 ,  G01N2021/869 ,  G01N2021/8812 ,  G01N2021/8822 ,  G01N2021/8917 ,  G01N2201/0634 ,  G06T7/0004 ,  G06T7/42 ,  G06T2207/30124

摘要： Optical methods for evaluating various surface and physical optical properties of structures made wholly or partially from fibers, polymers, films or a combination thereof. Such methods are comprised of special illumination, special software algorithms and controls that provide a unique solution for evaluating such properties as fiber orientation distribution function, basis weight uniformity, fuzz and pilling, texture, and other physical and surface properties.

摘要翻译： 用于评估由纤维，聚合物，膜或其组合完全或部分制成的结构的各种表面和物理光学性质的光学方法。 这些方法由特殊照明，特殊软件算法和控制组成，为评估纤维取向分布函数，基重均匀性，绒毛和起球，质地和其他物理和表面性质等特性提供了独特的解决方案。

公开(公告)号：US20040218040A1

公开(公告)日：2004-11-04

申请号：US10764098

申请日：2004-01-23

发明人： Yoshihiro Akiyama

IPC分类号： H04N007/18 ,  H04N009/47

CPC分类号： G01N21/95684 ,  G01J2003/2866 ,  G01N21/8806 ,  G01N2021/8812 ,  G01N2021/8816 ,  G01N2021/8825 ,  G01N2021/8908 ,  G01N2021/95646 ,  G01N2201/101 ,  H04N7/18

摘要： The present invention is an appearance inspection apparatus and method utilizing multiple light sources in a lighting unit 30 to alternately irradiate, line by line, side light from a side light source and slit light from a slit light source onto board 1 to be inspected. A correction value memory unit stores digital correction values required for correcting shadings for the side light source and the slit light source and an analysis unit utilizes these digital correction values to correct shadings on the image data. A highly accurate image is thus obtained.

摘要翻译： 本发明是一种在照明单元30中利用多个光源将来自侧光源的侧光和来自狭缝光源的狭缝光交替地照射到待检查的基板1上的外观检查装置和方法。 校正值存储单元存储用于校正侧光源和狭缝光源的阴影所需的数字校正值，分析单元利用这些数字校正值来校正图像数据上的阴影。 因此获得高精度的图像。