Placement of conductive stripes in electronic circuits to satisfy metal density requirements
    2.
    发明授权
    Placement of conductive stripes in electronic circuits to satisfy metal density requirements 有权
    在电子电路中放置导电条以满足金属密度要求

    公开(公告)号:US06305000B1

    公开(公告)日:2001-10-16

    申请号:US09334171

    申请日:1999-06-15

    IPC分类号: G06F1750

    摘要: An electronic circuit and a method of designing the electronic circuit having conductive fill stripes which are electrically attached to the power distribution or to the signal routing of the circuit. Preferably, the conductive fill stripes are electrically attached to the power distribution and are interspersed between the power buses and signal wires on the various metal layers to satisfy the metal density requirements of integrated circuit and chip manufacturing. The conductive fill stripes are added during the design process after the placement of the power distribution and signal routing so that electrical continuity between the conductive fill stripes and the connecting bus, metal density requirements, other design rules and logic verification can be completed as the rest of the chip is designed.

    摘要翻译: 一种电子电路和一种设计具有导电填充条的电子电路的方法,所述导电填充条电连接到电力分配或电路的信号路由。 优选地,导电填充条电连接到功率分布并且散布在各种金属层上的电源总线和信号线之间,以满足集成电路和芯片制造的金属密度要求。 在布置配电和信号路由之后,在设计过程中添加导电填充条,使得导电填充条和连接总线之间的电连续性,金属密度要求,其他设计规则和逻辑验证可以作为其余部分完成 的芯片设计。

    Method and apparatus to make a semiconductor chip susceptible to radiation failure
    3.
    发明授权
    Method and apparatus to make a semiconductor chip susceptible to radiation failure 有权
    使半导体芯片易受辐射破坏的方法和装置

    公开(公告)号:US06909159B2

    公开(公告)日:2005-06-21

    申请号:US10176233

    申请日:2002-06-20

    摘要: Methods and apparatus are provided for reducing the overall radiation hardness of a semiconductor chip. A radiation detector and a failure memory are provided. A disable signal or signals is produced by the failure memory. The disable signal is a required input to a user logic function, such as an off chip driver, an off chip receiver, a clock, or a static random access memory. When the radiation detector detects radiation, that detection is stored in the failure memory. The disable signal, when active, causes some or all of the user function to be inoperative. This invention is particularly important when the semiconductor chip is produced in a silicon on insulator (SOI) Complementary Metal Oxide Semiconductor (CMOS) process, which is naturally radiation resistant.

    摘要翻译: 提供了用于降低半导体芯片的整体辐射硬度的方法和装置。 提供了辐射检测器和故障存储器。 故障存储器产生禁用信号或信号。 禁用信号是用户逻辑功能的必需输入,例如片外驱动器,芯片外接收器,时钟或静态随机存取存储器。 当辐射检测器检测到辐射时,该检测被存储在故障存储器中。 禁用信号在有效时会导致部分或全部用户功能不起作用。 当半导体芯片在绝缘体上绝缘体(SOI)互补金属氧化物半导体(CMOS)工艺制造时,本发明是特别重要的,其是自然辐射的。