公开(公告)号：US20200020095A1

公开(公告)日：2020-01-16

申请号：US16581683

申请日：2019-09-24

Applicant: Apple Inc.

Inventor： Patrick J. Czarnota ,  Paul Argus Parks ,  Nile A. Light ,  Stephen P. Bathurst ,  John H. Higginson ,  Stephen R. Deming ,  Robert B. Martin ,  Tsan Y. Chan ,  Andreas Bibl

IPC: G06T7/00

Abstract: An optical verification method and mass transfer system described. In an embodiments, a mass transfer sequence may be accompanied by optical imaging and inspection to detect pick and place errors. The optical imaging and inspection techniques may be performed in-situ.

公开(公告)号：US12131922B1

公开(公告)日：2024-10-29

申请号：US17089585

申请日：2020-11-04

Applicant: Apple Inc.

Inventor： Andreas Bibl ,  John A. Higginson ,  Patrick J. Czarnota ,  Paul A. Parks ,  Nile A. Light

IPC: H01L21/68 ,  B65G47/90 ,  H01L21/67 ,  H01L21/683 ,  B25J7/00 ,  B25J9/00 ,  B25J15/00

CPC classification number: H01L21/67144 ,  B65G47/90 ,  H01L21/68 ,  H01L21/681 ,  H01L21/6831 ,  B25J7/00 ,  B25J9/0015 ,  B25J15/0085

Abstract: A micro device transfer tool and methods of operation in which the micro device transfer tool includes an articulating transfer head assembly capable of six degrees of motion. A miniatured camera assembly may be secured near the point of contact for the articulating transfer head assembly to aid in system alignment. In an embodiment, an encoder system is included for alignment of a micro pick up array and target substrate using complementary concentric grating patterns. In an embodiment a miniaturized position sensor design is included for sensing position of various system components during alignment or pick and place processes.

公开(公告)号：US11107208B2

公开(公告)日：2021-08-31

申请号：US16581683

申请日：2019-09-24

Applicant: Apple Inc.

Inventor： Patrick J. Czarnota ,  Paul Argus Parks ,  Nile A. Light ,  Stephen P. Bathurst ,  John H. Higginson ,  Stephen R. Deming ,  Robert B. Martin ,  Tsan Y. Chan ,  Andreas Bibl

IPC: G06K9/00 ,  G06T7/00

Abstract: An optical verification method and mass transfer system described. In an embodiments, a mass transfer sequence may be accompanied by optical imaging and inspection to detect pick and place errors. The optical imaging and inspection techniques may be performed in-situ.

公开(公告)号：US10438339B1

公开(公告)日：2019-10-08

申请号：US15695953

申请日：2017-09-05

Applicant: Apple Inc.

Inventor： Patrick J. Czarnota ,  Paul Argus Parks ,  Nile A. Light ,  Stephen P. Bathurst ,  John H. Higginson ,  Stephen R. Deming ,  Robert B. Martin ,  Tsan Y. Chan ,  Andreas Bibl

IPC: G06K9/00 ,  G06T7/00

Abstract: An optical verification method and mass transfer system described. In an embodiments, a mass transfer sequence may be accompanied by optical imaging and inspection to detect pick and place errors. The optical imaging and inspection techniques may be performed in-situ.