摘要:
Apparatus for scanning a rotating information carrier having mutually substantially parallel tracks for the recording of information. The apparatus includes a transducer for scanning the information carrier and for generating a position signal which indicates a position of a scanning point scanned by the transducer. The apparatus further includes means for rotating the information carrier about an axis and means for moving the scanning point in a radial direction with respect to the axis. The apparatus has a scanning mode in which the scanning point jumps both from one track to another in a first radial direction and from one track to another in an opposite second direction during reading or writing of a file.
摘要:
An electro-optical measurement device for the sampling of an electric signal (SI) in an electronic component by means of a radiation beam. Special embodiments of the electro-optic measurement device are described. An electro-optic sensor element is provided with an electrically conductive tip at one side and with an electrode at the other side, so that an absolute and calibrated measurement is possible. The measurement beam can be high-frequency pulsed with a pulse (Lp) per period of the test signal (SI). The pulse series is low-frequency modulated and the pulses exhibit, relative to the test signal, a constant phase relationship during the first half periods of the modulation signal and a varying phase relationship during the second half periods so that accurate and reliable measurement is possible.
摘要:
A probe apparatus includes a probe contact connected to a storage capacitance via a photoconductive switch. The photoconductive switch can be operated at high speed by means of a pulsed laser. The laser pulses (L) are synchronized with a moment in the operation cycle of the circuit at which moment the voltage at the point under test is to be measured. After a number of pulses and operation cycles the storage capacitance is charged to the voltage value (V) to be measured. Then, the capacitance does not form a load on the point under test and the voltage (V) can be determined accurately.