Light Shielding Structure and Laser Device
    1.
    发明申请

    公开(公告)号:US20190113814A1

    公开(公告)日:2019-04-18

    申请号:US16027689

    申请日:2018-07-05

    摘要: The present disclosure relates to the field of display technology, and in particular relates to a light shielding structure and a laser device. The light shielding structure comprises a first light shielding plate group and a second light shielding plate group, each of the first light shielding plate group and the second light shielding plate group comprises at least one light shielding plate, and the at least one light shielding plate can be moved relatively for forming at least two light transmitting regions. The light shielding structure can realize partial scanning of multiple target regions at a time, thereby saving production time, increasing production efficiency, saving water and electricity and other resources, and prolonging the laser lifetime.

    DEVICE AND SYSTEM FOR TESTING FLATNESS

    公开(公告)号:US20220238391A1

    公开(公告)日:2022-07-28

    申请号:US17483613

    申请日:2021-09-23

    IPC分类号: H01L21/66 G01B11/30

    摘要: The present disclosure relates to a device and a system for testing flatness. The device for testing flatness includes a base, a testing platform, and a ranging sensor. The testing platform is assembled on the base. The testing platform includes a supporting structure. The supporting structure is disposed on the side of the testing platform away from the base and is used to support a to-be-tested board. The structure matches the structure of the to-be-tested board. The ranging sensor is disposed on the side of the testing platform away from the base. After the to-be-tested board is placed on the testing platform, the ranging sensor is used to test distances between a number N of to-be-tested positions on the to-be-tested board and the ranging sensor, to obtain N pieces of distance information, and the N pieces of distance information are used to determine the flatness of the to-be-tested board, where N is an integer greater than 2. According to the embodiments of the present disclosure, the flatness of the glass substrate can be tested to improve the manufacturing process to reduce the flatness of the glass substrate, and avoid the problem that the glass substrate is easily broken when entering the subsequent process equipment and the process equipment is down.

    TRANSFER APPARATUS AND LASER ANNEALING APPARATUS
    5.
    发明申请
    TRANSFER APPARATUS AND LASER ANNEALING APPARATUS 有权
    转移装置和激光退火装置

    公开(公告)号:US20170010230A1

    公开(公告)日:2017-01-12

    申请号:US15182953

    申请日:2016-06-15

    IPC分类号: G01N27/02 H01L21/67

    CPC分类号: H01L21/6838 H01L21/67288

    摘要: A transfer apparatus includes a supporting member, a free electron excitation device and a detection device; the free electrons excitation device is configured to excite semiconductor material of an object to be transferred to generate free electrons, and the detection device is configured to detect whether material of a surface of the transferred object in contact with the support surface of the supporting member is conductive under excitation by the free electron excitation device. A laser annealing apparatus comprising the transfer apparatus is further provided.

    摘要翻译: 传送装置包括支撑构件,自由电子激发装置和检测装置; 自由电子激发装置被配置为激发要转移的物体的半导体材料以产生自由电子,并且检测装置被配置为检测与支撑构件的支撑表面接触的被转移物体的表面的材料是否为 通过自由电子激发装置在激发下导电。 还提供了包括转印装置的激光退火装置。