DEVICE FOR MOUNTING OPTICAL ELEMENT AND SAMPLE PROCESSING INSTRUMENT

    公开(公告)号:US20240012220A1

    公开(公告)日:2024-01-11

    申请号:US18348250

    申请日:2023-07-06

    IPC分类号: G02B7/02 G01N15/14 G02B7/04

    摘要: The present disclosure relates to a device for mounting an optical element and a sample processing instrument including the device for mounting an optical element. The device for mounting the optical element includes: a frame; a mount fitted in the frame in a translatable but non-rotatable manner and having a mounting portion for accommodating the optical element; and an adjusting nut attached to the frame in a rotatable but non-translatable manner. The adjusting nut has a screw and a head located at an end of the screw for operation, and the mount has a threaded portion engaged threadedly with the screw, such that when the adjusting nut rotates, the mount translates relative to the frame. The device and the sample processing instrument according to the disclosure can allow adjustment of an optical element while preventing the latter from being off-center.

    CUVETTE ASSEMBLY, FLOW CELL COMPRISING THE CUVETTE ASSEMBLY, AND SAMPLE PROCESSOR CONTAINING THE CUVETTE ASSEMBLY OR THE FLOW CELL

    公开(公告)号:US20240094113A1

    公开(公告)日:2024-03-21

    申请号:US18262555

    申请日:2021-11-01

    IPC分类号: G01N21/03 G01N21/05

    CPC分类号: G01N21/0303 G01N21/05

    摘要: The invention relates to a cuvette assembly for a sample processor, a flow cell for a sample processor comprising the cuvette assembly, and a sample processor comprising the cuvette assembly or the flow cell. The cuvette assembly comprises a cuvette body and a reflector. The cuvette body is in the shape of a rectangular parallelepiped and comprises a sample detection channel vertically penetrating the cuvette body. The cuvette body has long sides and short sides in a horizontal section. The reflector has a flat surface attached to a first side surface extending along one of the long sides of the cuvette body and a spherical surface that is opposite to the flat surface and has a truncated lower half. The reflector is positioned so that it is flush with a lower surface of the cuvette body and a center of sphere of the spherical surface falls into the sample detection channel, and the reflector extends along the long side and exceeds the short side.

    BEAM MEASURING DEVICE, SAMPLE PROCESSOR AND METHOD OF MEASURING BEAM

    公开(公告)号:US20240125592A1

    公开(公告)日:2024-04-18

    申请号:US18356674

    申请日:2023-07-21

    IPC分类号: G01B11/24 G01B11/26

    CPC分类号: G01B11/2433 G01B11/26

    摘要: The present disclosure relates to a beam measuring device, a sample processor including the beam measuring device, and a method of measuring a beam using the beam measuring device. The beam measuring device includes a detection unit and a light impediment unit. The light impediment unit is located between the detection unit and a light source, and is configured to generate a shadow area on the detection unit by blocking transmission of part of a beam coming from the light source. The detection unit is configured to measure the shadow area, and to determine whether the beam is divergent or inclined with respect to a predetermined optical axis based on the measurement of the shadow area. The beam measuring device may shorten the optical detection channel and ensure the detection accuracy, thereby having a compact structure. In addition, the beam measuring device may measure divergence angle and directionality, respectively.