公开(公告)号：US20240310243A1

公开(公告)日：2024-09-19

申请号：US18398607

申请日：2023-12-28

Applicant: BEIJING INSTITUTE OF TECHNOLOGY

Inventor： Mingfeng LU ,  Tianshan ZHANG ,  Peihang LI ,  Chenchen JI ,  Jinmin WU ,  Yao HU ,  Weidong HU ,  Feng ZHANG ,  Ran TAO

IPC: G01M11/00 ,  G06T7/60

CPC classification number: G01M11/30 ,  G06T7/60 ,  G06T2207/20081 ,  G06T2207/20084 ,  G06T2207/20132

Abstract: The present application relates to an interferogram phase estimation method. The interferogram phase estimation method includes: obtaining an interferogram for estimation of a measured object; and inputting the interferogram for estimation to a neural network model trained based on a method for training a neural network model for interferogram phase estimation, to obtain a phase image corresponding to the interferogram for estimation. In the interferogram phase estimation method of the present application, features of different scales of an interferogram are learned based on a Unet++ neural network model to obtain an accurately estimated phase image corresponding to the interferogram.

公开(公告)号：US20180051976A1

公开(公告)日：2018-02-22

申请号：US15447307

申请日：2017-03-02

Applicant: Beijing Institute of Technology

Inventor： Mingfeng LU ,  Jinmin WU ,  Feng ZHANG ,  Ran TAO

IPC: G01B9/02

CPC classification number: G01B9/02 ,  G01B11/2441

Abstract: A physical parameter estimating method, a physical parameter estimating device, and electronic apparatus are disclosed. The method includes: reading a Newton's rings fringe pattern of a unit to be measured; calculating a magnitude spectrum of an intensity distribution signal of at least one first-direction pixel set in the Newton's rings fringe pattern under each fractional Fourier transform (FRFT) order in a searching range of FRFT orders; determining a matched order of the intensity distribution signal according to the calculated magnitude spectrums; and estimating a physical parameter involved in the interferometric measurement according to at least the matched order. Therefore, physical parameters of the unit to be measured can be estimated with high accuracy even in presence of noise and obstacles in the fringe pattern.