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1.
公开(公告)号:US20070042551A1
公开(公告)日:2007-02-22
申请号:US11503506
申请日:2006-08-10
申请人: Brian Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Probst
发明人: Brian Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Probst
IPC分类号: H01L21/336
CPC分类号: H01L29/7813 , H01L29/0619 , H01L29/0696 , H01L29/0869 , H01L29/1095 , H01L29/407 , H01L29/4236 , H01L29/66734 , H01L29/7811
摘要: A trenched field effect transistor is provided that includes (a) a semiconductor substrate, (b) a trench extending a predetermined depth into the semiconductor substrate, (c) a pair of doped source junctions, positioned on opposite sides of the trench, (d) a doped heavy body positioned adjacent each source junction on the opposite side of the source junction from the trench, the deepest portion of the heavy body extending less deeply into said semiconductor substrate than the predetermined depth of the trench, and (e) a doped well surrounding the heavy body beneath the heavy body.
摘要翻译: 提供了沟槽场效应晶体管,其包括(a)半导体衬底,(b)在半导体衬底中延伸预定深度的沟槽,(c)位于沟槽相对侧上的一对掺杂源极结(d )掺杂的重体,其位于与沟槽的源极结的相对侧上的每个源极结附近,重体的最深部分比沟槽的预定深度更深地延伸到所述半导体衬底中,以及(e)掺杂 很好地围着沉重的身体下面的沉重的身体。
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2.
公开(公告)号:US20050079676A1
公开(公告)日:2005-04-14
申请号:US10927788
申请日:2004-08-27
申请人: Brian Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Probst
发明人: Brian Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Probst
IPC分类号: H01L21/336 , H01L29/06 , H01L29/10 , H01L29/78
CPC分类号: H01L29/7813 , H01L29/0619 , H01L29/0696 , H01L29/0869 , H01L29/1095 , H01L29/407 , H01L29/4236 , H01L29/66734 , H01L29/7811
摘要: A trenched field effect transistor is provided that includes (a) a semiconductor substrate, (b) a trench extending a predetermined depth into the semiconductor substrate, (c) a pair of doped source junctions, positioned on opposite sides of the trench, (d) a doped heavy body positioned adjacent each source junction on the opposite side of the source junction from the trench, the deepest portion of the heavy body extending less deeply into said semiconductor substrate than the predetermined depth of the trench, and (e) a doped well surrounding the heavy body beneath the heavy body.
摘要翻译: 提供了沟槽场效应晶体管,其包括(a)半导体衬底,(b)在半导体衬底中延伸预定深度的沟槽,(c)位于沟槽相对侧上的一对掺杂源极结(d )掺杂的重体,其位于与沟槽的源极结的相对侧上的每个源极结附近,重体的最深部分比沟槽的预定深度更深地延伸到所述半导体衬底中,以及(e)掺杂 很好地围着沉重的身体下面的沉重的身体。
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3.
公开(公告)号:US20090134458A1
公开(公告)日:2009-05-28
申请号:US12329509
申请日:2008-12-05
申请人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Edward Probst
发明人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Edward Probst
IPC分类号: H01L29/10
CPC分类号: H01L29/7813 , H01L29/0619 , H01L29/0696 , H01L29/0869 , H01L29/1095 , H01L29/407 , H01L29/4236 , H01L29/66734 , H01L29/7811
摘要: A trenched field effect transistor is provided that includes (a) a semiconductor substrate, (b) a trench extending a predetermined depth into the semiconductor substrate, (c) a pair of doped source junctions, positioned on opposite sides of the trench, (d) a doped heavy body positioned adjacent each source junction on the opposite side of the source junction from the trench, the deepest portion of the heavy body extending less deeply into said semiconductor substrate than the predetermined depth of the trench, and (e) a doped well surrounding the heavy body beneath the heavy body.
摘要翻译: 提供了沟槽场效应晶体管,其包括(a)半导体衬底,(b)在半导体衬底中延伸预定深度的沟槽,(c)位于沟槽相对侧上的一对掺杂源极结(d )掺杂的重体,其位于与沟槽的源极结的相对侧上的每个源极结附近,重体的最深部分比沟槽的预定深度更深地延伸到所述半导体衬底中,以及(e)掺杂 很好地围着沉重的身体下面的沉重的身体。
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4.
公开(公告)号:US06828195B2
公开(公告)日:2004-12-07
申请号:US10347254
申请日:2003-01-17
申请人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Edward Probst
发明人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Edward Probst
IPC分类号: H01L21336
CPC分类号: H01L29/7813 , H01L29/0619 , H01L29/0696 , H01L29/0869 , H01L29/1095 , H01L29/407 , H01L29/4236 , H01L29/66734 , H01L29/7811
摘要: A trenched field effect transistor is provided that includes (a) a semiconductor substrate, (b) a trench extending a predetermined depth into the semiconductor substrate, (c) a pair of doped source junctions, positioned on opposite sides of the trench, (d) a doped heavy body positioned adjacent each source junction on the opposite side of the source junction from the trench, the deepest portion of the heavy body extending less deeply into said semiconductor substrate than the predetermined depth of the trench, and (e) a doped well surrounding the heavy body beneath the heavy body.
摘要翻译: 提供了沟槽场效应晶体管,其包括(a)半导体衬底,(b)在半导体衬底中延伸预定深度的沟槽,(c)位于沟槽相对侧上的一对掺杂源极结(d )掺杂的重体,其位于与沟槽的源极结的相对侧上的每个源极结附近,重体的最深部分比沟槽的预定深度更深地延伸到所述半导体衬底中,以及(e)掺杂 很好地围着沉重的身体下面的沉重的身体。
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公开(公告)号:US06429481B1
公开(公告)日:2002-08-06
申请号:US08970221
申请日:1997-11-14
申请人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Edward Probst
发明人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Edward Probst
IPC分类号: H01L2978
CPC分类号: H01L29/7813 , H01L29/0619 , H01L29/0696 , H01L29/0869 , H01L29/1095 , H01L29/407 , H01L29/4236 , H01L29/66734 , H01L29/7811
摘要: A trenched field effect transistor is provided that includes (a) a semiconductor substrate, (b) a trench extending a predetermined depth into the semiconductor substrate, (c) a pair of doped source junctions, positioned on opposite sides of the trench, (d) a doped heavy body positioned adjacent each source junction on the opposite side of the source junction from the trench, the deepest portion of the heavy body extending less deeply into said semiconductor substrate than the predetermined depth of the trench, and (e) a doped well surrounding the heavy body beneath the heavy body.
摘要翻译: 提供了沟槽场效应晶体管,其包括(a)半导体衬底,(b)在半导体衬底中延伸预定深度的沟槽,(c)位于沟槽相对侧上的一对掺杂源极结(d )掺杂的重体,其位于与沟槽的源极结的相对侧上的每个源极结附近,重体的最深部分比沟槽的预定深度更深地延伸到所述半导体衬底中,以及(e)掺杂 很好地围着沉重的身体下面的沉重的身体。
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6.
公开(公告)号:US08044463B2
公开(公告)日:2011-10-25
申请号:US12755966
申请日:2010-04-07
申请人: Brian S. Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean E. Probst
发明人: Brian S. Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean E. Probst
IPC分类号: H01L29/76
CPC分类号: H01L29/7813 , H01L29/0619 , H01L29/0696 , H01L29/0869 , H01L29/1095 , H01L29/407 , H01L29/4236 , H01L29/66734 , H01L29/7811
摘要: A trenched field effect transistor is provided that includes (a) a semiconductor substrate, (b) a trench extending a predetermined depth into the semiconductor substrate, (c) a pair of doped source junctions, positioned on opposite sides of the trench, (d) a doped heavy body positioned adjacent each source junction on the opposite side of the source junction from the trench, the deepest portion of the heavy body extending less deeply into said semiconductor substrate than the predetermined depth of the trench, and (e) a doped well surrounding the heavy body beneath the heavy body.
摘要翻译: 提供了沟槽场效应晶体管,其包括(a)半导体衬底,(b)在半导体衬底中延伸预定深度的沟槽,(c)位于沟槽相对侧上的一对掺杂源极结(d )掺杂的重体,其位于与沟槽的源极结的相对侧上的每个源极结附近,重体的最深部分比沟槽的预定深度更深地延伸到所述半导体衬底中,以及(e)掺杂 很好地围着沉重的身体下面的沉重的身体。
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7.
公开(公告)号:US20100264487A1
公开(公告)日:2010-10-21
申请号:US12755966
申请日:2010-04-07
申请人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Edward Probst
发明人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Edward Probst
IPC分类号: H01L29/78
CPC分类号: H01L29/7813 , H01L29/0619 , H01L29/0696 , H01L29/0869 , H01L29/1095 , H01L29/407 , H01L29/4236 , H01L29/66734 , H01L29/7811
摘要: A trenched field effect transistor is provided that includes (a) a semiconductor substrate, (b) a trench extending a predetermined depth into the semiconductor substrate, (c) a pair of doped source junctions, positioned on opposite sides of the trench, (d) a doped heavy body positioned adjacent each source junction on the opposite side of the source junction from the trench, the deepest portion of the heavy body extending less deeply into said semiconductor substrate than the predetermined depth of the trench, and (e) a doped well surrounding the heavy body beneath the heavy body.
摘要翻译: 提供了沟槽场效应晶体管,其包括(a)半导体衬底,(b)在半导体衬底中延伸预定深度的沟槽,(c)位于沟槽相对侧上的一对掺杂源极结(d )掺杂的重体,其位于与沟槽的源极结的相对侧上的每个源极结附近,重体的最深部分比沟槽的预定深度更深地延伸到所述半导体衬底中,以及(e)掺杂 很好地围着沉重的身体下面的沉重的身体。
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公开(公告)号:US07511339B2
公开(公告)日:2009-03-31
申请号:US10630249
申请日:2003-07-30
申请人: Brian S. Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean E. Probst
发明人: Brian S. Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean E. Probst
IPC分类号: H01L29/78
CPC分类号: H01L29/7813 , H01L29/0619 , H01L29/0696 , H01L29/0869 , H01L29/1095 , H01L29/407 , H01L29/4236 , H01L29/66734 , H01L29/7811
摘要: A trenched field effect transistor is provided that includes (a) a semiconductor substrate, (b) a trench extending a predetermined depth into the semiconductor substrate, (c) a pair of doped source junctions, positioned on opposite sides of the trench, (d) a doped heavy body positioned adjacent each source junction on the opposite side of the source junction from the trench, the deepest portion of the heavy body extending less deeply into said semiconductor substrate than the predetermined depth of the trench, and (e) a doped well surrounding the heavy body beneath the heavy body.
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9.
公开(公告)号:US07148111B2
公开(公告)日:2006-12-12
申请号:US10927788
申请日:2004-08-27
申请人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean E. Probst
发明人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean E. Probst
IPC分类号: H01L21/336
CPC分类号: H01L29/7813 , H01L29/0619 , H01L29/0696 , H01L29/0869 , H01L29/1095 , H01L29/407 , H01L29/4236 , H01L29/66734 , H01L29/7811
摘要: A trenched field effect transistor is provided that includes (a) a semiconductor substrate, (b) a trench extending a predetermined depth into the semiconductor substrate, (c) a pair of doped source junctions, positioned on opposite sides of the trench, (d) a doped heavy body positioned adjacent each source junction on the opposite side of the source junction from the trench, the deepest portion of the heavy body extending less deeply into said semiconductor substrate than the predetermined depth of the trench, and (e) a doped well surrounding the heavy body beneath the heavy body.
摘要翻译: 提供了沟槽场效应晶体管,其包括(a)半导体衬底,(b)在半导体衬底中延伸预定深度的沟槽,(c)位于沟槽相对侧上的一对掺杂源极结(d )掺杂的重体,其位于与沟槽的源极结的相对侧上的每个源极结附近,重体的最深部分比沟槽的预定深度更深地延伸到所述半导体衬底中,以及(e)掺杂 很好地围着沉重的身体下面的沉重的身体。
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公开(公告)号:US20100112767A1
公开(公告)日:2010-05-06
申请号:US12685592
申请日:2010-01-11
申请人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Edward Probst
发明人: Brian Sze-Ki Mo , Duc Chau , Steven Sapp , Izak Bencuya , Dean Edward Probst
IPC分类号: H01L21/8234
CPC分类号: H01L29/7813 , H01L29/0619 , H01L29/0696 , H01L29/0869 , H01L29/1095 , H01L29/407 , H01L29/4236 , H01L29/66734 , H01L29/7811
摘要: A trenched field effect transistor is provided that includes (a) a semiconductor substrate, (b) a trench extending a predetermined depth into the semiconductor substrate, (c) a pair of doped source junctions, positioned on opposite sides of the trench, (d) a doped heavy body positioned adjacent each source junction on the opposite side of the source junction from the trench, the deepest portion of the heavy body extending less deeply into said semiconductor substrate than the predetermined depth of the trench, and (e) a doped well surrounding the heavy body beneath the heavy body.
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