公开(公告)号：US09140739B2

公开(公告)日：2015-09-22

申请号：US13929706

申请日：2013-06-27

Applicant: Broadcom Corporation

Inventor： Alireza Zolfaghari ,  Chin-Ming Chien ,  Bojko Marholev

IPC: G01R27/28 ,  G01R35/00 ,  G01R27/26 ,  G01R27/14 ,  G01R31/28

CPC classification number: G01R27/2605 ,  G01R27/14 ,  G01R31/2882 ,  G01R31/2884

Abstract: According to one disclosed embodiment, an on-chip resistor calibration circuit includes an RC oscillator having a test resistor and a precision capacitor as elements, a counter, and a reference clock. In one embodiment, an RC oscillator generates a waveform having a period dependent upon the resistance of the test resistor and the capacitance of the precision capacitor. In such an embodiment, a counter and a reference clock may be configured to measure the period of the waveform. Using a pre-determined capacitance of the precision capacitor, a resistance of the test resistor may be determined. In another embodiment, an RC oscillator generates first and second waveforms through use of an additional capacitor that can be switched in and out of the RC oscillator circuit. Using a pre-determined capacitance of the precision capacitor, an RC product of the test resistor and the additional capacitor may be determined.

Abstract translation: 根据一个公开的实施例，片上电阻校准电路包括具有测试电阻器和精密电容器作为元件的RC振荡器，计数器和参考时钟。 在一个实施例中，RC振荡器产生具有取决于测试电阻器的电阻和精密电容器的电容的周期的波形。 在这种实施例中，计数器和参考时钟可被配置为测量波形的周期。 使用精密电容器的预定电容，可以确定测试电阻器的电阻。 在另一个实施例中，RC振荡器通过使用可以进入和离开RC振荡器电路的附加电容器产生第一和第二波形。 使用精密电容器的预定电容，可以确定测试电阻器的RC乘积和附加电容器。

公开(公告)号：US20150222281A1

公开(公告)日：2015-08-06

申请号：US14191533

申请日：2014-02-27

Applicant: Broadcom Corporation

Inventor： Igal Kushnir ,  Hung-Ming Chien ,  Wei-Hong Chen ,  Theodoros Chalvatzis ,  Seunghwan Yoon ,  Chin-Ming Chien ,  Tirdad Sowlati ,  Moche Cohen ,  Kobi Sturkovich ,  Shaul Klein

IPC: H03L7/18 ,  H03L7/099

CPC classification number: H03L7/18 ,  H03B19/00 ,  H03B21/00 ,  H03L7/099 ,  H03L7/23

Abstract: A stacked synthesizer for wide local oscillator (LO) generation using a dynamic divider. The phase locked loop can include a plurality of voltage controlled oscillators (VCOs), and a selector that can be configured to select an output of one of the plurality of VCOs. The selected output of one of the plurality of VCOs can be provided to an on-chip dynamic divider and to an off-chip dynamic divider for LO sharing. The dynamic dividers can be configured to generate synthesizer outputs based on a multiplication of the selected output of one of the plurality of VCOs by a factor (1+1/M), where M is a variable number.

Abstract translation: 一种用于使用动态分频器进行宽本地振荡器（LO）生成的堆叠合成器。 锁相环可以包括多个压控振荡器（VCO），以及可被配置为选择多个VCO之一的输出的选择器。 可以将多个VCO中的一个VCO的所选择的输出提供给片上动态分频器和用于LO共享的片外动态分频器。 动态分频器可以被配置为基于多个VCO中的一个VCO的所选择的输出乘以因子（1 + 1 / M）来生成合成器输出，其中M是可变数。

公开(公告)号：US20130285679A1

公开(公告)日：2013-10-31

申请号：US13929706

申请日：2013-06-27

Applicant: Broadcom Corporation

Inventor： Alireza Zolfaghari ,  Chin-Ming Chien ,  Bojko Marholev

IPC: G01R27/26 ,  G01R27/14

CPC classification number: G01R27/2605 ,  G01R27/14 ,  G01R31/2882 ,  G01R31/2884

Abstract: According to one disclosed embodiment, an on-chip resistor calibration circuit includes an RC oscillator having a test resistor and a precision capacitor as elements, a counter, and a reference clock. In one embodiment, an RC oscillator generates a waveform having a period dependent upon the resistance of the test resistor and the capacitance of the precision capacitor. In such an embodiment, a counter and a reference clock may be configured to measure the period of the waveform. Using a pre-determined capacitance of the precision capacitor, a resistance of the test resistor may be determined. In another embodiment, an RC oscillator generates first and second waveforms through use of an additional capacitor that can be switched in and out of the RC oscillator circuit. Using a pre-determined capacitance of the precision capacitor, an RC product of the test resistor and the additional capacitor may be determined.

Abstract translation: 根据一个公开的实施例，片上电阻校准电路包括具有测试电阻器和精密电容器作为元件的RC振荡器，计数器和参考时钟。 在一个实施例中，RC振荡器产生具有取决于测试电阻器的电阻和精密电容器的电容的周期的波形。 在这种实施例中，计数器和参考时钟可被配置为测量波形的周期。 使用精密电容器的预定电容，可以确定测试电阻器的电阻。 在另一个实施例中，RC振荡器通过使用可以进入和离开RC振荡器电路的附加电容器产生第一和第二波形。 使用精密电容器的预定电容，可以确定测试电阻器的RC乘积和附加电容器。