公开(公告)号：US09140739B2

公开(公告)日：2015-09-22

申请号：US13929706

申请日：2013-06-27

Applicant: Broadcom Corporation

Inventor： Alireza Zolfaghari ,  Chin-Ming Chien ,  Bojko Marholev

IPC: G01R27/28 ,  G01R35/00 ,  G01R27/26 ,  G01R27/14 ,  G01R31/28

CPC classification number: G01R27/2605 ,  G01R27/14 ,  G01R31/2882 ,  G01R31/2884

Abstract: According to one disclosed embodiment, an on-chip resistor calibration circuit includes an RC oscillator having a test resistor and a precision capacitor as elements, a counter, and a reference clock. In one embodiment, an RC oscillator generates a waveform having a period dependent upon the resistance of the test resistor and the capacitance of the precision capacitor. In such an embodiment, a counter and a reference clock may be configured to measure the period of the waveform. Using a pre-determined capacitance of the precision capacitor, a resistance of the test resistor may be determined. In another embodiment, an RC oscillator generates first and second waveforms through use of an additional capacitor that can be switched in and out of the RC oscillator circuit. Using a pre-determined capacitance of the precision capacitor, an RC product of the test resistor and the additional capacitor may be determined.

Abstract translation: 根据一个公开的实施例，片上电阻校准电路包括具有测试电阻器和精密电容器作为元件的RC振荡器，计数器和参考时钟。 在一个实施例中，RC振荡器产生具有取决于测试电阻器的电阻和精密电容器的电容的周期的波形。 在这种实施例中，计数器和参考时钟可被配置为测量波形的周期。 使用精密电容器的预定电容，可以确定测试电阻器的电阻。 在另一个实施例中，RC振荡器通过使用可以进入和离开RC振荡器电路的附加电容器产生第一和第二波形。 使用精密电容器的预定电容，可以确定测试电阻器的RC乘积和附加电容器。

公开(公告)号：US20130225084A1

公开(公告)日：2013-08-29

申请号：US13859189

申请日：2013-04-09

Applicant: Broadcom Corporation

Inventor： Steven Deane Hall ,  Brima Babatunde Ibrahim ,  Hea Joung Kim ,  Yuan Zhuang ,  Langford Wasada ,  Bojko Marholev ,  Shawn Ding ,  Latha Roy (Caliaperoumal) ,  Satya Prasad Srinivas

IPC: H04W8/00

CPC classification number: H04W8/005 ,  H04W16/14 ,  H04W48/16

Abstract: Methods and systems for wireless communication are disclosed and may include controlling one or more scans of a received signal detection frequency across a frequency range and storing a magnitude of the received signal at each frequency where the magnitude exceeds a threshold level. A type of one or more signals in the received signal may be determined based on a bandwidth of the signals. A Bluetooth page/inquiry scan may be initiated if the determined type is a page/inquiry signal, and scans may be continued if the determined type may not be a page/inquiry signal. The scans may be repeated on a periodic basis and may be controlled utilizing a voltage controlled oscillator. Each of the scans may include a plurality of discrete frequency steps or a continuous frequency ramp. The controlling may include a start frequency, an end frequency and a frequency step size for the scans.

公开(公告)号：US20130285679A1

公开(公告)日：2013-10-31

申请号：US13929706

申请日：2013-06-27

Applicant: Broadcom Corporation

Inventor： Alireza Zolfaghari ,  Chin-Ming Chien ,  Bojko Marholev

IPC: G01R27/26 ,  G01R27/14

CPC classification number: G01R27/2605 ,  G01R27/14 ,  G01R31/2882 ,  G01R31/2884

Abstract: According to one disclosed embodiment, an on-chip resistor calibration circuit includes an RC oscillator having a test resistor and a precision capacitor as elements, a counter, and a reference clock. In one embodiment, an RC oscillator generates a waveform having a period dependent upon the resistance of the test resistor and the capacitance of the precision capacitor. In such an embodiment, a counter and a reference clock may be configured to measure the period of the waveform. Using a pre-determined capacitance of the precision capacitor, a resistance of the test resistor may be determined. In another embodiment, an RC oscillator generates first and second waveforms through use of an additional capacitor that can be switched in and out of the RC oscillator circuit. Using a pre-determined capacitance of the precision capacitor, an RC product of the test resistor and the additional capacitor may be determined.

Abstract translation: 根据一个公开的实施例，片上电阻校准电路包括具有测试电阻器和精密电容器作为元件的RC振荡器，计数器和参考时钟。 在一个实施例中，RC振荡器产生具有取决于测试电阻器的电阻和精密电容器的电容的周期的波形。 在这种实施例中，计数器和参考时钟可被配置为测量波形的周期。 使用精密电容器的预定电容，可以确定测试电阻器的电阻。 在另一个实施例中，RC振荡器通过使用可以进入和离开RC振荡器电路的附加电容器产生第一和第二波形。 使用精密电容器的预定电容，可以确定测试电阻器的RC乘积和附加电容器。