TALBOT INTERFEROMETER, TALBOT INTERFERENCE SYSTEM, AND FRINGE SCANNING METHOD
    1.
    发明申请
    TALBOT INTERFEROMETER, TALBOT INTERFERENCE SYSTEM, AND FRINGE SCANNING METHOD 审中-公开
    TALBOT干涉仪,TALBOT干涉系统和FRINGE扫描方法

    公开(公告)号:US20160035450A1

    公开(公告)日:2016-02-04

    申请号:US14811671

    申请日:2015-07-28

    CPC classification number: G21K1/067

    Abstract: In a Talbot interferometer including a diffractive grating which forms a first intensity distribution, a shield grating which forms a second intensity distribution, a detector which acquires information on the intensity distributions, and a moving unit which moves the first intensity distribution or the shield grating, fringe scanning in the x-axis and y-axis directions is performed in response to a change in relative positions of the first intensity distribution and the shield grating in the respective directions, and the detection before or after a change in the relative positions in the respective directions. The number of movements of the first intensity distribution or the shield grating with the fringe scanning in the directions is lower than Dx×(Dy+1)−2, where Dx and Dy are the numbers of detections with the fringe scanning in the respective directions and are integers equal to or higher than 3.

    Abstract translation: 在包括形成第一强度分布的衍射光栅的Talbot干涉仪中,形成第二强度分布的屏蔽光栅,获取关于强度分布的信息的检测器和移动第一强度分布或屏蔽光栅的移动单元, 响应于第一强度分布和屏蔽光栅在各个方向上的相对位置的变化而执行沿x轴方向和y轴方向的边缘扫描,以及在相对位置上的变化之前或之后的检测 各自的方向。 第一强度分布或屏蔽光栅沿着方向扫描的移动次数低于Dx×(Dy + 1)-2,其中Dx和Dy是在各个方向上进行条纹扫描的检测次数 并且是等于或高于3的整数。

    X-RAY TALBOT INTERFEROMETER AND X-RAY TALBOT IMAGING SYSTEM
    2.
    发明申请
    X-RAY TALBOT INTERFEROMETER AND X-RAY TALBOT IMAGING SYSTEM 审中-公开
    X-RAY TALBOT干涉仪和X射线TALBOT成像系统

    公开(公告)号:US20140270060A1

    公开(公告)日:2014-09-18

    申请号:US14203279

    申请日:2014-03-10

    CPC classification number: G01N23/20075 A61B6/4291 A61B6/484

    Abstract: An X-ray Talbot interferometer includes a source grating configured to spatially split X-rays emitted from an X-ray source, a diffraction grating configured to form an interference pattern with the X-rays from the source grating, and an X-ray detector configured to detect the X-rays from the diffraction grating. The X-ray Talbot interferometer further includes an angle varying unit configured to vary an angle formed by an optical axis, which is the center of a flux of the X-rays from the X-ray source, and the source grating. The angle varying unit varies the angle formed by the optical axis and the source grating from a first angle to a second angle. The X-ray detector detects the X-rays at least when the optical axis and the source grating form the first angle and when the optical axis and the source grating form the second angle.

    Abstract translation: X射线Talbot干涉仪包括被配置为空间分割从X射线源发射的X射线的源光栅,被配置为与来自光栅光栅的X射线形成干涉图案的衍射光栅以及X射线检测器 被配置为检测来自衍射光栅的X射线。 X射线Talbot干涉仪还包括角度变化单元,其被配置为改变由作为来自X射线源的X射线的通量的中心的光轴和源光栅所形成的角度。 角度变化单元将由光轴和源光栅形成的角度从第一角度改变为第二角度。 至少当光轴和源光栅形成第一角度时以及当光轴和源光栅形成第二角度时,X射线检测器检测X射线。

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