Abstract:
An X-ray imaging apparatus comprises a grating configured to form an interference pattern by diffracting X-rays from an X-ray source, a amplitude grating configured to partly shield X-rays forming the interference pattern, and an X-ray detector configured to detect an intensity distribution of X-rays from the amplitude grating. The amplitude grating is comprised of a central area and a peripheral area and the peripheral area shows an X-ray transmittance higher than the central area relative to X-rays perpendicularly entering the amplitude grating.
Abstract:
An X-ray imaging apparatus includes a phase grating, an absorption grating, a detector, and an arithmetic unit. The arithmetic unit executes a Fourier transform step of performing Fourier transform for an intensity distribution of a Moiré acquired by the detector, and acquiring a spatial frequency spectrum. Also, the arithmetic unit executes a phase retrieval step of separating a spectrum corresponding to a carrier frequency from a spatial frequency spectrum acquired in the Fourier transform step, performing inverse Fourier transform for the separated spectrum, and acquiring a differential phase image.
Abstract:
An X-ray imaging apparatus includes a phase grating, an absorption grating, a detector, and an arithmetic unit. The arithmetic unit executes a Fourier transform step of performing Fourier transform for an intensity distribution of a Moiré acquired by the detector, and acquiring a spatial frequency spectrum. Also, the arithmetic unit executes a phase retrieval step of separating a spectrum corresponding to a carrier frequency from a spatial frequency spectrum acquired in the Fourier transform step, performing inverse Fourier transform for the separated spectrum, and acquiring a differential phase image.
Abstract:
An X-ray Talbot interferometer includes a source grating configured to spatially split X-rays emitted from an X-ray source, a diffraction grating configured to form an interference pattern with the X-rays from the source grating, and an X-ray detector configured to detect the X-rays from the diffraction grating. The X-ray Talbot interferometer further includes an angle varying unit configured to vary an angle formed by an optical axis, which is the center of a flux of the X-rays from the X-ray source, and the source grating. The angle varying unit varies the angle formed by the optical axis and the source grating from a first angle to a second angle. The X-ray detector detects the X-rays at least when the optical axis and the source grating form the first angle and when the optical axis and the source grating form the second angle.