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    DEVICE FOR COOLING LOCALLY
    3.
    发明申请
    DEVICE FOR COOLING LOCALLY 审中-公开

    公开(公告)号：US20200244033A1

    公开(公告)日：2020-07-30

    申请号：US16774131

    申请日：2020-01-28

    申请人： Commissariat a l'energie atomique et aux energies alternatives

    发明人： Quentin MERMILLOD-ANSLEME ,  Nicolas AUBERT ,  Claude CHABROL ,  Mathieu DUPOY

    IPC分类号： H01S3/16 ,  A61F7/00 ,  H01S3/04

    摘要： A device for cooling locally, including a cooling member, a crystal having the capacity to cool via absorption of a near-infrared exciting light signal, an illuminating system intended to deliver an exciting light signal, the crystal having an elongate shape about a longitudinal axis between a near end and a far end and having a closed constant outside cross section and containing a central channel formed, from its far end, over at least some of its length, the cooling member including a rod embedded via a first end into the central channel of the crystal and including a protruding second end that forms a cooling finger.

    OPTICAL PARTICLE DETECTOR
    4.
    发明申请
    OPTICAL PARTICLE DETECTOR 审中-公开

    公开(公告)号：US20200049617A1

    公开(公告)日：2020-02-13

    申请号：US16486732

    申请日：2018-02-20

    申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

    发明人： Salim BOUTAMI ,  Mathieu DUPOY ,  Jean-Marc FEDELI

    IPC分类号： G01N15/14 ,  G01N15/02

    摘要： A particle detector is provided, including at least one channel configured to receive at least one fluid including particles; one optical inlet configured to receive at least one incident luminous radiation; one first plurality of reflecting surfaces arranged between the optical inlet and the channel; one matrix of photo detectors arranged facing the channel; and one second plurality of reflecting surfaces arranged between the channel and the matrix of photo detectors such that the channel is disposed between the first and the second pluralities of reflecting surfaces.

    LENS-FREE INFRARED MULTISPECTRAL IMAGING DEVICE AND MANUFACTURING METHOD
    5.
    发明申请
    LENS-FREE INFRARED MULTISPECTRAL IMAGING DEVICE AND MANUFACTURING METHOD 有权

    公开(公告)号：US20230021956A1

    公开(公告)日：2023-01-26

    申请号：US17786099

    申请日：2020-12-16

    申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

    发明人： Mathieu DUPOY ,  Emerick LORENT

    IPC分类号： G01N21/3563

    摘要： The invention provides a lens-free infrared imaging device (1) intended to image a sample (2), comprising at least one light source (3, 3a, 3b) configured to emit a light according to several wavelengths of the infrared range, and at least one sensor (4) configured to detect some of the light emitted having interacted with the sample, said sensor comprising a plurality of pixels (41), the device being characterised in that the sensor (4) is configured to detect a reflective part of the light emitted. The invention also provides a method for manufacturing this device.

    OPTICAL COMPONENT FOR AN INTERFEROMETRIC IMAGING DEVICE
    6.
    发明申请
    OPTICAL COMPONENT FOR AN INTERFEROMETRIC IMAGING DEVICE 有权

    公开(公告)号：US20220196901A1

    公开(公告)日：2022-06-23

    申请号：US17645154

    申请日：2021-12-20

    申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

    发明人： Cyrielle MONPEURT ,  Marine BEURRIER-BOUSQUET ,  Mathieu DUPOY ,  Gabriel JOBERT

    IPC分类号： F21V8/00 ,  G01N21/35 ,  G01J5/0818 ,  G01N21/45

    摘要： An optical component for an interferometric imaging device, which comprises: an object arm, including a first planar waveguide and a first diffraction grating formed in the first planar waveguide and capable of extracting light from the object arm; a reference arm, comprising a second planar waveguide and a second diffraction grating formed in the second planar waveguide and capable of extracting light from the reference arm; wherein the optical component is configured such that, in use with an optically reflective surface extending parallel to the plane of the optical component between the object arm and the reference arm, at least part of the light extracted from the object arm interferes with at least part of the light extracted from the reference arm.

    Method for Observing Organisms and Associated System
    8.
    发明申请
    Method for Observing Organisms and Associated System 审中-公开
    观察生物和相关系统的方法

    公开(公告)号：US20160103064A1

    公开(公告)日：2016-04-14

    申请号：US14891820

    申请日：2014-05-19

    申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES ,  bIOMerieux

    发明人： Pierre MARCOUX ,  Mathieu DUPOY

    IPC分类号： G01N21/47 ,  C12Q1/02

    CPC分类号： G01N21/4788 ,  C12Q1/02 ,  C12Q1/18

    摘要： The invention relates to a method for observing a sample (12), the sample (12) comprising a set of organisms (14), a solid substrate (16) supporting the set of organisms (14). The method being characterized in that the method includes steps for illuminating at least one portion of the sample (12) with a light beam, for acquiring a first diffraction pattern corresponding to an image of waves from the diffraction of the light beam by at least one portion of the set of organisms (14), for acquiring a second diffraction pattern corresponding to an image of waves from the diffraction of the light beam by at least one portion of the sample (12), for comparing the second diffraction pattern with the first diffraction pattern, for determining at least one characteristic relating to the set of organisms (14) from the result of the comparison step.

    摘要翻译： 本发明涉及一种用于观察样品（12）的方法，所述样品（12）包括一组生物体（14），固体基质（16），其支撑所述一组生物体（14）。 该方法的特征在于，该方法包括用光束照射样品（12）的至少一部分的步骤，用于从光束的衍射获得与波束的图像相对应的第一衍射图案至少一个 用于从所述样品（12）的至少一部分的所述光束的衍射获得对应于波的图像的第二衍射图案，用于将所述第二衍射图案与所述第一衍射图案进行比较 衍射图案，用于根据比较步骤的结果来确定与生物体集合（14）有关的至少一个特性。

    OPTICAL COMPONENT FOR AN ATR IMAGING DEVICE
    9.
    发明申请
    OPTICAL COMPONENT FOR AN ATR IMAGING DEVICE 有权

    公开(公告)号：US20220196895A1

    公开(公告)日：2022-06-23

    申请号：US17644639

    申请日：2021-12-16

    申请人： Commissariat a L'Energie Atomique Et Aux Energies Alternatives

    发明人： Cyrielle MONPEURT ,  Mathieu DUPOY

    IPC分类号： G02B5/18 ,  F21V8/00

    摘要： An optical component for an attenuated total reflection multispectral imaging device, which includes a support substrate and at least two planar waveguides, and wherein the planar waveguides and the support substrate are superimposed together, with the support substrate which covers the planar waveguides; each of the planar waveguides includes at least one diffraction grating; and at least two of the planar waveguides have their diffraction gratings which have values of the average pattern distribution pitch which are distinct from each other; the support substrate includes, on one side opposite the planar waveguides, a face forming an exchange interface with a sample; and an exit face of the optical component corresponds to a lateral face of the support substrate.

    DEVICE AND METHOD FOR DETECTING PARTICLES AND METHOD FOR MANUFACTURING SAME
    10.
    发明申请
    DEVICE AND METHOD FOR DETECTING PARTICLES AND METHOD FOR MANUFACTURING SAME 有权

    公开(公告)号：US20210181083A1

    公开(公告)日：2021-06-17

    申请号：US17247352

    申请日：2020-12-08

    申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

    发明人： Mathieu DUPOY ,  Laurent FREY ,  Serge GIDON

    IPC分类号： G01N15/14

    摘要： A device for detecting (D) at least one predetermined particle (P) includes an interferometric element (EI) arranged so as to be illuminated by an incident radiation (Lin) and comprising at least one so-called thin layer (CM) disposed on top of a so-called substrate layer (Sub), the particle being attached to a surface (Sm) of the thin layer, the interferometric element (EI) forming a Fabry-Pérot cavity with or without attached particle P; a matrix sensor (Det) adapted to detect an image comprising a first portion (P1) deriving from the detection of the incident radiation transmitted (LTBG) by the interferometric element alone and a second portion (P2) deriving from the detection of the incident radiation transmitted (LTP) by the interferometric element and any particle (O, P) attached to a surface (Sm) of the thin layer; a processor (UT) linked to the sensor and configured: to calculate, as a function of wavelengths of the incident radiation λi i∈[1,m], the variation of intensity of at least one first pixel of the first portion, called first variation (FBG) and of at least one second pixel of the second portion, called second variation (FP), to determine a trend, as a function of the wavelengths of the incident radiation λi i∈[1,m], of a phase shift ϕi between the first variation and the second variation; to detect the attached particle when the phase shift ϕi is not constant as a function of the wavelengths of the incident radiation λi i∈[1,m].