Abstract:
A device for detecting electromagnetic radiation includes at least one thermal detector, placed on a substrate; an encapsulating structure forming a cavity housing the thermal detector, including at least one thin encapsulating layer; and at least one Fabry-Perot interference filter, formed by first and second semi-reflective mirrors that are separated from each other by a structured layer. A high-index layer of one of the semi-reflective mirrors is at least partially formed from the thin encapsulating layer.
Abstract:
A coherent LIDAR imaging system includes a laser source; an optical splitter/recombiner designed to split the laser radiation into a reference beam and into an object beam and to superpose the reference beam on a reflected object beam reflected by the scene; and an optical imager creating an image of the scene on a detector. The detector includes an array of pixels designed for detecting the reflected object beam and the reference beam which together form a recombined beam having a beat frequency representative of a range of the illuminated scene. The optical splitter/recombiner is configured to form an intermediate image of the reference beam in an intermediate image plane perpendicular to the optical axis.
Abstract:
A device for detecting (D) at least one predetermined particle (P) includes an interferometric element (EI) arranged so as to be illuminated by an incident radiation (Lin) and comprising at least one so-called thin layer (CM) disposed on top of a so-called substrate layer (Sub), the particle being attached to a surface (Sm) of the thin layer, the interferometric element (EI) forming a Fabry-Pérot cavity with or without attached particle P; a matrix sensor (Det) adapted to detect an image comprising a first portion (P1) deriving from the detection of the incident radiation transmitted (LTBG) by the interferometric element alone and a second portion (P2) deriving from the detection of the incident radiation transmitted (LTP) by the interferometric element and any particle (O, P) attached to a surface (Sm) of the thin layer; a processor (UT) linked to the sensor and configured: to calculate, as a function of wavelengths of the incident radiation λi i∈[1,m], the variation of intensity of at least one first pixel of the first portion, called first variation (FBG) and of at least one second pixel of the second portion, called second variation (FP), to determine a trend, as a function of the wavelengths of the incident radiation λi i∈[1,m], of a phase shift ϕi between the first variation and the second variation; to detect the attached particle when the phase shift ϕi is not constant as a function of the wavelengths of the incident radiation λi i∈[1,m].
Abstract:
The invention relates to a SPAD photodiode (100) having a layer made of semiconductor material (110), including an N doped zone (111) and a P doped zone (112) separated by an avalanche zone (113).The semiconductor material layer (110) is intercalated between a periodic structure (120) and a low index layer (130) having a refractive index less than that of the semiconductor material layer and than that of the periodic structure. The periodic structure (120) is deposited directly on the semiconductor material layer.The photodiode thus offers low temporal dispersion and high quantum efficiency, without requiring a strong charge acceleration voltage.
Abstract:
A reflector device that includes a support, a light source arranged to emit a principal light beam, N mirrors, partially transparent, assembled on the support, and delimited by a partially reflective front face, and a rear face, the mirrors are arranged from a first position to an Nth position, so that the principal light beam is incident on the front face of the mirror in the first position, and interacts successively, in the order, with each mirror to form a beam reflected by the front face and a beam transmitted by the rear face, the beam reflected by the front face of a mirror in a position i resulting from the reflection of the beam transmitted by the rear face of the mirror in position i−1.
Abstract:
A method of manufacturing a detector capable of detecting a wavelength range [λ8; λ14] centered on a wavelength λ10, including: forming said device on a substrate by depositing a sacrificial layer totally embedding said device; forming, on the sacrificial layer, a cap including first, second, and third optical structures transparent in said range [Δ8; λ14], the second and third optical structures having equivalent refraction indexes at wavelength λ10 respectively greater than or equal to 3.4 and smaller than or equal to 2.3; forming a vent of access to the sacrificial layer through a portion of the cap, and then applying, through the vent, an etching to totally remove the sacrificial layer.
Abstract:
A filtering device comprising first and second interference filters each comprising a Fabry-Perot cavity formed by semi-reflective layers between which a structured layer is arranged, wherein the structured layer belongs conjointly to the two filters, has a substantially constant thickness, is substantially planar and comprises two materials with different refractive indices arranged in each of the cavities, forming vertical structurings, the cavity of the second filter comprises a spacer arranged between one of the semi-reflective layers and the structured layer so that a distance between the semi-reflective layers of the cavity of the second filter is greater than a distance between the semi-reflective layers of the cavity of the first filter, and the filters comprise a second structured layer arranged in the cavities of the filters, and/or each filter comprises a second Fabry-Perot cavity comprising a third structured layer.
Abstract:
An optical scanner (100) which comprises: a mirror (200), pivotally mounted about a first pivot axis and is partially transparent from its front face (210) towards its rear face (220) to the light radiation; a light source (300) intended to emit an incident light radiation on the front face (210) of the mirror (200); the scanner is characterised in that the rear face (220) comprises a structuration formed by at least one facet essentially planar and inclined with respect to the front face (210) so that a light radiation, incident on the front face (210), and transmitted by the at least one facet (220i) undergoes a deflection with respect to the angle of incidence of said light radiation on the front face (210).
Abstract:
A detection device for a coherent lidar imaging system includes an integrated detector comprising a matrix array of pixels distributed over N columns and M rows and comprising an optical guide, called reference guide, configured so as to receive a laser beam, called reference beam, N optical guides, called column guides, coupled to the reference guide, each column guide being coupled to M optical guides, called row guides, the M row guides being configured so as to route part of the reference beam into each pixel of the column, called pixel reference beam, each pixel of the integrated detector comprising: a guided photodiode coupled to an optical detection guide, a diffraction grating, called pixel grating, configured so as to couple a portion of a beam illuminating the pixel into the guided photodiode, a coupler, called pixel coupler, configured so as to couple the pixel coupled beam and at least a fraction of the pixel reference beam into the detection guide, an electronic readout and preprocessing circuit.
Abstract:
A reflector device reflects luminous radiation of wavelength λ. The device is provided with a supporting base whereon are assembled a partially transparent mirror having a partially reflective front face and luminous radiation scattering and/or absorption structure to scatter and/or absorb luminous radiation liable to be transmitted by a rear face, opposite the front face.