公开(公告)号：US10060976B1

公开(公告)日：2018-08-28

申请号：US15151263

申请日：2016-05-10

Applicant: Cadence Design Systems, Inc.

Inventor： Sharjinder Singh ,  Sameer Chakravarthy Chillarige ,  Robert Jordan Asher ,  Sonam Kathpalia ,  Patrick Wayne Gallagher ,  Joseph Michael Swenton

IPC: G01R31/3173 ,  G01R31/317 ,  G01R31/3177 ,  G01R31/327

CPC classification number: G01R31/31703 ,  G01R31/31704 ,  G01R31/3177 ,  G01R31/318364 ,  G01R31/318371

Abstract: Systems and methods disclosed herein provide for automatically diagnosing mis-compares detected during simulation of Automatic Test Pattern Generation (“ATPG”) generated test patterns. Embodiments of the systems and methods provide for determining the origin of a mis-compare based on an analysis of the generated test patterns with a structural simulator and a behavioral simulator.