SYSTEMS AND METHODS FOR CHARACTERIZING REFRACTION WITH OPHTHALMIC IMAGING SYSTEMS

    公开(公告)号:US20200085294A1

    公开(公告)日:2020-03-19

    申请号:US16494016

    申请日:2018-03-29

    摘要: Ophthalmic imaging systems, particularly slit-scanning ophthalmo-scopes, are capable of characterizing refraction over the entire field of view of the system. Light from the light source of the system illuminates a region of the eye and the returning light is measured on a detector. The deviation of the location of the returning light from a predetermined location on the detector is measured. The deviation corresponds to the mismatch between the refractions of the imaging system and the eye. The light can be scanned across the full field of view to characterize the entire field. A second illumination source traveling along a second illumination path can be used to improve the characterization. The characterization can be of use for optimizing the focus of the instrument and for assessing the condition of the eye, including assessing myopia and astigmatism in the periphery.

    ALIGNMENT IMPROVEMENTS FOR OPHTHALMIC DIAGNOSTIC SYSTEMS

    公开(公告)号:US20210052158A1

    公开(公告)日:2021-02-25

    申请号:US17082714

    申请日:2020-10-28

    摘要: The present application describes the addition of various feedback mechanisms including visual and audio feedback mechanisms to an ophthalmic diagnostic device to assist a subject to elf align to the device. The device may use the visual and non-visual feedback mechanisms independently or in combination with one another. The device may provide a means for a subject to provide feedback to the device to confirm that an alignment condition has been met. Alternatively, the device may have a means for sensing when Acceptable alignment has been achieved. The device may capture diagnostic information during the alignment process or may capture after the alignment condition has been met.