Abstract:
An integrated gateway apparatus includes a policy storage for storing therein a first information on message filtering and switching policies for messages received from heterogeneous devices in lower networks via network interfaces; a device management unit for extracting a second information on the messages, the devices and the network interfaces; a layer-basis filter unit for performing, based on the first and the second information, the message filtering and switching on the messages on a layer basis; and an integrated switch management unit for providing the first information to the layer-basis filter unit and controlling the layer-basis filtering unit. The layer-basis filter unit includes a switch filter unit, a route filter unit and a gateway filter unit for performing the message filtering and switching in a MAC layer, in a network layer and a transport layer and in an application layer, respectively.
Abstract:
A system for fault prediction in a home network includes: a context generator for generating context information based on status data collected in real time about components of the home network; a specification interpreter for generating knowledge rules for fault detection by using specifications of the components of the home network; a context analyzer for analyzing if the context information meet the knowledge rules to classify the context information into normal situation contexts and abnormal situation contexts; a context pattern learner for generating new knowledge rules based on the abnormal situation contexts and fault rules corresponding to the abnormal situation contexts; a knowledge rule database for storing and managing the knowledge rules and the new knowledge rules; and a fault predictor for analyzing a correlation between the knowledge rules or the new knowledge rules and the generated context information, thereby predicting faults to be generated.
Abstract:
A semiconductor device and a method of manufacturing the same are disclosed. The semiconductor device includes a first insulation layer on or over a semiconductor substrate, metal patterns on or over the first insulation layer, a thin film resistor pattern disposed on or over the metal patterns, and an anti-reflection layer between the thin film resistor pattern and the metal patterns.
Abstract:
A plurality of swarm intelligence-based mobile robots, each having multiple legs and multiple joints, the mobile robot includes: an environment recognition sensor for collecting sensed data about the surrounding environment of the mobile robot; a communication unit for performing communication with a remote controller, a parent robot managing at least one mobile robot, or the other mobile robots located within a predefined area; and a control unit for controlling the motions of the multiple legs and multiple joints to control movement of the mobile robot to a given destination based on control data transmitted from the remote controller through the communication unit or based on communication with the other mobile robots within the predefined area or based on the sensed data collected by the environment recognition sensor.
Abstract:
A ship-borne device managing method includes allocating IP address information to a device when a device configuration information request message is received from the device through a network in a ship system; performing an overlapping test of checking whether the allocated IP address information is currently used in the device; allocating service session information necessary for provision of an application service regarding the device in case where the overlapping test determines that the allocated IP address information is not currently used by the device; and generating a device configuration information response message based on the allocated IP address information and service session information and transmitting the device configuration information response message to the device. The device configuration information request message may include information regarding the device in the form of text or binary.
Abstract:
A system achieves seamless localization for a plurality of robots when first some robots moves to a shadow area where GPS signals are not received while remaining second robots receives the GPS signals, by performing an absolute localization for the second robots using the GPS signals; and performing an absolute localization for the second robots using the GPS signals; performing a relative localization for the first robots based on the second robots, thereby determining an absolute location of the first robots. Further, when the second robots move to the shadow area where the first robots have been moved, the system performs the seamless localization by determining a relative location of the second robots based on the first robots on which the relative localization has been performed, thereby determining an absolute location of the second robots based on the relative location of the second robots.
Abstract:
An apparatus for integrally managing a ship includes a device manager for integrally managing different types of local ship devices in the ship by using a standardized protocol message; a local device manager for managing local ship devices in a legacy environment on the basis of an independent local protocol; and an inter-working framework (IWF) for performing translation of a protocol for compatibility between the standardized protocol and the independent local protocol to manage the different types of local ship devices between the device manager and the local device manager. The device manager receives a remote control instruction for remotely maintaining and repairing the local ship device from a remote server connected through a wired/wireless communication network.
Abstract:
A CMOS image sensor and method the same are disclosed. The method comprises forming an insulating interlayer including a plurality of photodiodes on a semiconductor substrate, forming a plurality of metal lines within the insulating interlayer, sequentially forming an oxide layer and a passivation layer on the insulating interlayer, forming a TEOS layer on the passivation layer, forming a planarization layer on a portion of the TEOS layer, and forming a microlens on the planarization layer.
Abstract:
A semiconductor device having a test pattern for measuring epitaxial pattern shift is provided. The test pattern includes a semiconductor substrate having a first pattern formed therein; a first impurity region formed in the semiconductor substrate; an epitaxial layer formed on the semiconductor substrate, the epitaxial layer having a second pattern formed therein, wherein the second pattern corresponds to the first pattern; and a second impurity region formed in the epitaxial layer, the second impurity region in electrical contact with the first impurity region.