Technique for fabricating high quality optical components
    3.
    发明授权
    Technique for fabricating high quality optical components 失效
    制造高品质光学元件的技术

    公开(公告)号:US06819438B2

    公开(公告)日:2004-11-16

    申请号:US10137662

    申请日:2002-05-03

    IPC分类号: G01B1106

    CPC分类号: G01B11/0625

    摘要: To determine the uniformity of an optical component, a light beam is directed to impinge on a surface of an optical component at each of multiple points. A characteristic of the light beam impinging on the optical component surface at each of the multiple points is modified so as to have multiple different values. Light from the impinging light beam that passes through the optical component at each of the multiple points, with the light beam characteristic at each of the multiple different values, is detected. The non-uniformity of the optical component is determined based on the detected passing light.

    摘要翻译: 为了确定光学部件的均匀性,在多个点处指向光束以撞击在光学部件的表面上。 在多个点处的每一个处照射在光学部件表面上的光束的特性被修改为具有多个不同的值。 检测在多个不同点处的每一个上通过光学部件的入射光束的光,其中在多个不同值的每一个处具有光束特性。 基于检测到的通过光来确定光学部件的不均匀性。

    System of fabricating plane parallel substrates with uniform optical paths
    4.
    发明授权
    System of fabricating plane parallel substrates with uniform optical paths 失效
    制造具有均匀光路的平面平行基板的系统

    公开(公告)号:US06639682B2

    公开(公告)日:2003-10-28

    申请号:US09872303

    申请日:2001-06-01

    IPC分类号: G01B1106

    CPC分类号: G01B11/0625

    摘要: Process and apparatus for automated production of optical devices comprising two plane parallel optical surfaces of a desired optical performance for transmitted light, by measuring and quantifying the spectral response of intensity versus wavelength across the working surface area of a starter optical device as compared to an acceptable computer model, as a three dimensional contour map of optical thickness based on the assumption of a constant index of refraction, then reducing the high spots by automated means such as polishing, and measuring the spectral response again.

    摘要翻译: 用于自动生产光学装置的方法和装置包括通过测量和量化起始光学装置的工作表面积上的强度对波长的光谱响应,与可接受的光学装置相比,包括具有期望的透射光的光学性能的两个平面平行光学表面 计算机模型,作为基于假定常数折射率的光学厚度的三维轮廓图,然后通过诸如抛光的自动化手段减少高点,并再次测量光谱响应。