THZ SENSOR AND THZ METHOD FOR MEASURING AN OBJECT TO BE MEASURED

    公开(公告)号:US20240003676A1

    公开(公告)日:2024-01-04

    申请号:US18039072

    申请日:2021-12-02

    CPC classification number: G01B11/06 G01B9/02017

    Abstract: The invention relates to a THz sensor (2) for measuring an object to be measured (6), in particular, a pipe, the THz sensor (2) comprising:



    a THz transceiver (10) for emitting and receiving THz radiation,
    a lens (14) for bundling the THz radiation emitted by the THz transceiver (10) and emitting a THz transmission beam (8) along the optical axis (A) and for receiving a THz reflection beam (15),
    a support device (11), on which the lens (14) and/or the THz transceiver (10) is accommodated or fastened.




    Hereby, it is provided that



    a THz radiation-influencing compensation formation for modifying and/or reducing incident THz radiation is provided in a compensation area between the lens and the support device (11).

    METHOD FOR CALIBRATING A THZ MEASURING APPARATUS, THZ MEASURING METHOD AND CORRESPONDING THZ MEASURING APPARATUS

    公开(公告)号:US20220178677A1

    公开(公告)日:2022-06-09

    申请号:US17602578

    申请日:2020-04-09

    Inventor: Roland BÖHM

    Abstract: The invention relates to a method for calibrating a THz measuring apparatus (8), in particular a pipe, on a measurement object (10), comprising at least the following steps: providing a THz measuring apparatus (8) having a plurality of pivotable THz sensors (1), arranged in a circumferential direction around a measuring chamber (9), for outputting one THz transmitted beam (12) each along a sensor axis (B) (provision step); orienting the THz sensors (1) into a starting position in the measuring chamber (9) in which the measurement object (10) is received (orientation step in starting position); allocating the THz sensors (1) to at least one first and one second sensor group (group formation step); first calibration adjustment step, in which the second sensor group is adjusted as an adjustment group by means of the first sensor group as a starting group, and corresponding second calibration adjustment step, in which the first sensor group is adjusted as an adjustment group by means of the previously calibration-adjusted second sensor group as a starting group; wherein, in each of the calibration adjustment steps=by means of the THz sensors (S1, S3, S5, S7) of the starting group, spacing points on a surface (10a) of the measurement object (10) are determined, =sensor correction angles of the THz sensors (1; S2, S4, S6, S8) of the adjustment group are determined by means of the spacing points determined by the starting group, and =the THz sensors of the adjustment group are calibration-adjusted about the determined sensor correction angles (a).

    SUCTION CONVEYING APPARATUS AND METHOD FOR SUCTION CONVEYING OF BULK MATERIAL

    公开(公告)号:US20230013229A1

    公开(公告)日:2023-01-19

    申请号:US17867078

    申请日:2022-07-18

    Abstract: The present disclosure relates to a pneumatic suction conveying apparatus for conveying granulated bulk materials and a corresponding method, comprising a pump unit with a vacuum pump and a suction volume, at least two suction lines, which is connected to the suction volume and extends towards storage containers for receiving bulk materials, the suction lines each comprising a conveying hopper for separating the bulk material and a stop valve for blocking the suction line. Hereby, in the suction line there is each provided a closed control loop comprising an adjustable throttle valve and a flow sensor provided in the suction line, the control loop being adapted and designed to adjust the throttle valve depending on a measurement of the flow sensor.

    VIBRATION FEEDER DEVICE AND METHOD FOR VIBRATION FEEDING OF BULK MATERIAL

    公开(公告)号:US20220017312A1

    公开(公告)日:2022-01-20

    申请号:US17375416

    申请日:2021-07-14

    Inventor: Roland BÖHM

    Abstract: The present disclosure relates to a method for vibration feeding of bulk material and a vibration feeder device provided for such purposes, comprising a material feed, a charging hopper including a hopper discharge, a feeder tray, a height adjustment means for adjusting a level height between the hopper discharge and the feeder tray, and a vibration driver for driving the feeder tray at an oscillation amplitude and an oscillation frequency, where a target material throughput and material specific parameters of the bulk material are input, initial parameters for the level height, oscillation amplitude and oscillation frequency are determined from these inputs, and subsequently the level height is adjusted by controlling the height adjustment means.

    THZ MEASUREMENT METHOD AND THZ MEASUREMENT DEVICE FOR SURVEYING A MEASUREMENT OBJECT, IN PARTICULAR A PIPE

    公开(公告)号:US20230251083A1

    公开(公告)日:2023-08-10

    申请号:US18011235

    申请日:2021-06-25

    Inventor: Roland BÖHM

    CPC classification number: G01B15/02 B29C48/92 B29C48/09

    Abstract: The invention relates to a THz measuring method for measuring a measured object (6), for example, a pipe made of a plastics or rubber, comprising



    a calibrating step for measuring an empty time of flight of at least one THz transmission beam through an empty path between a first measuring position (MP1) and a second measuring position (MP2) of a measuring region (4) without the measured object (6) and determining the empty path (s0),
    positioning a measured object (6) in the measuring region (4) between measuring positions (MP1, MP2),
    carrying out a first THz-measurement from the first measuring position (MP1) using a THz transmission beam (20-1) along a first optical axis (A) while measuring a first exterior time of flight (tL1) up to an exterior surface (6a) of the measured object (6), a first wall time of flight (tR1) through a first wall region of the measured object (6) and an interior time of flight (tL2, tL2_1) through an interior space (6c) of the measured object,
    carrying out a second THz-measurement from the second measuring position (MP1) along a second optical axis (A) while measuring a second exterior time of flight (tL3) between the second measuring position (MP2) and the exterior surface (6a) of the measured object (6) and a second wall time of flight (tR2) through a second wall region of the measured object (6)
    determining a total time of flight (tges_R) through the measuring region (4) with the measured object, and
    determining a first wall thickness (sR1) of the first wall region and a second wall thickness (sR2) of the second wall region from the measured times of flight (St7).

    THZ MEASURING DEVICE AND THZ MEASURING METHOD FOR DETERMINING A LAYER THICKNESS OR A DISTANCE OF A MEASUREMENT OBJECT

    公开(公告)号:US20220146251A1

    公开(公告)日:2022-05-12

    申请号:US17440459

    申请日:2020-03-13

    Inventor: Roland BÖHM

    Abstract: The invention relates to a THz measuring device for measuring a layer thickness of a wall (4a) of a measurement object (4) and/or of a distance (18) between boundary surfaces (4a, 4b) of a measurement object (4), comprising a transmitter and receiver unit (2) including a Terahertz-Sender and a Terahertz receiver, a controller means configured to determine the layer thickness of the wall (4a) of the measurement object (4) and/or a distance (18) between boundary surfaces (4b, 4c) of the measurement object (4) from a time-of-flight difference of the Terahertz radiation reflected on a first boundary surface (4b, 4c) of the wall (4a) of the measurement object (4) and the Terahertz radiation reflected on a second boundary surface (4b, 4c) of the wall (4a), where in the beam path (5) of the at least one transmitter and receiver unit (2) an adjustable optical unit (7) including a reflector is arranged, where a surface of the reflector is designed to deflect the irradiated Terahertz radiation and/or the Terahertz radiation reflected from the respective boundary surface (4b, 4c) for adjusting the optical axis (C) of the transmitter and receiver unit (2).
    Hereby, according to the invention, it is provided that the reflector is designed to be deformable so that a beam cross-section of the irradiated Terahertz radiation can be modified in a focusing plane (17) lying downstream from the reflector in the radiation direction of the irradiated Terahertz radiation, the focusing plane being adjustable by deforming the reflector.

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