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公开(公告)号:US20150095733A1
公开(公告)日:2015-04-02
申请号:US14478824
申请日:2014-09-05
Inventor: Hong Beom Pyeon , Young-Goan Kim
IPC: G01R31/317 , G01R31/3181
CPC classification number: G01R31/31713 , G01R31/31701 , G01R31/31813 , G11C16/00 , G11C29/1201 , G11C29/56 , G11C2029/2602 , G11C2029/5602
Abstract: An apparatus comprising a plurality of devices connected in series with one another, each of the devices comprising a test enable pin for receiving a test enable signal that indicates enablement of a test mode, and a test output pin for outputting a test output signal in the test mode, and a controller coupled to the devices and comprising an additional test output pin for outputting a test channel output signal, wherein a failure of at least one of the test output signals and the test channel output signal indicates the existence of one or more potential defects associated with the plurality of devices and the controller.
Abstract translation: 一种装置,包括彼此串联连接的多个装置,每个装置包括用于接收指示启用测试模式的测试使能信号的测试使能引脚和用于输出测试输出信号的测试输出引脚 测试模式和耦合到所述设备的控制器,并且包括用于输出测试通道输出信号的附加测试输出引脚,其中所述测试输出信号和测试通道输出信号中的至少一个的故障指示存在一个或多个 与多个设备和控制器相关联的潜在缺陷。