Crystal for an X-ray analysis apparatus
    1.
    发明授权
    Crystal for an X-ray analysis apparatus 失效
    晶体用于X射线分析仪

    公开(公告)号:US4780899A

    公开(公告)日:1988-10-25

    申请号:US852051

    申请日:1986-04-15

    IPC分类号: G01N23/22 G21K1/06

    摘要: A crystal for an X-ray analysis apparatus is mounted on a carrier of an amorphous material whose bonding surface preferably obtains its desired geometry by grinding and polishing. Using a suitably transparent carrier, use can be made of a UV-curable type of adhesive which is irradiated through the carrier. The thickness of the layer of glue can be checked, if desired, via the same path. Because no disturbing background radiation is generated by an amorphous carrier, local irregularities are avoided, and better thermal adaptation of carrier and crystal material is feasible, such a crystal will contribute to a substantially higher resolution when used in an X-ray analysis apparatus.

    摘要翻译: 用于X射线分析装置的晶体安装在非晶材料的载体上,其结合面优选通过研磨和抛光获得所需的几何形状。 使用适当透明的载体,可以使用通过载体照射的可UV固化型粘合剂。 如果需要,可以通过相同的路径检查胶层的厚度。 由于无定形载体不产生干扰背景辐射,因此避免了局部不规则,并且载体和晶体材料的热适应性更好,这样的晶体在X射线分析装置中使用时会有更高的分辨率。