公开(公告)号：US20240302286A1

公开(公告)日：2024-09-12

申请号：US18661222

申请日：2024-05-10

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： Vivek R. Dave ,  Mark J. Cola ,  R. Bruce Madigan ,  Alberto Castro ,  Glenn Wikle ,  Lars Jacquemetton ,  Peter Campbell

IPC: G01N21/71 ,  B33Y30/00 ,  B33Y50/00 ,  G01N21/00 ,  G01N21/84 ,  G06N20/00 ,  H01L21/66

CPC classification number: G01N21/71 ,  B33Y30/00 ,  B33Y50/00 ,  G01N21/00 ,  H01L22/12 ,  G01N2021/8411 ,  G06N20/00

Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.

公开(公告)号：US12019026B2

公开(公告)日：2024-06-25

申请号：US18136750

申请日：2023-04-19

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： Vivek R. Dave ,  Mark J. Cola ,  R. Bruce Madigan ,  Alberto Castro ,  Glenn Wikle ,  Lars Jacquemetton ,  Peter Campbell

IPC: G01N21/71 ,  B33Y30/00 ,  B33Y50/00 ,  G01N21/00 ,  H01L21/66 ,  G01N21/84 ,  G06N20/00

CPC classification number: G01N21/71 ,  B33Y30/00 ,  B33Y50/00 ,  G01N21/00 ,  H01L22/12 ,  G01N2021/8411 ,  G06N20/00

Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.