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公开(公告)号：US12019026B2
公开(公告)日：2024-06-25
申请号：US18136750
申请日：2023-04-19
发明人： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Alberto Castro , Glenn Wikle , Lars Jacquemetton , Peter Campbell
摘要： This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
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公开(公告)号：US20240302286A1
公开(公告)日：2024-09-12
申请号：US18661222
申请日：2024-05-10
发明人： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Alberto Castro , Glenn Wikle , Lars Jacquemetton , Peter Campbell
摘要： This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
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3.发明公开公开(公告)号：US20240326158A1
公开(公告)日：2024-10-03
申请号：US18601845
申请日：2024-03-11
发明人： R. Bruce Madigan , Lars Jacquemetton , Glenn Wikle , Mark J. Cola , Vivek R. Dave , Darren Beckett , Alberto M. Castro
IPC分类号： B23K26/03 , B22F10/28 , B22F10/31 , B22F12/90 , B23K15/00 , B23K26/342 , B23K26/70 , B23K31/12 , B23K101/00 , B29C64/393 , B33Y10/00 , B33Y50/00 , B33Y50/02
CPC分类号： B23K26/032 , B22F12/90 , B23K15/0086 , B23K26/342 , B23K26/70 , B23K31/125 , B29C64/393 , B33Y10/00 , B33Y50/00 , B33Y50/02 , B22F10/28 , B22F10/31 , B22F2203/11 , B23K2101/001
摘要： This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
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公开(公告)号：US20240326326A1
公开(公告)日：2024-10-03
申请号：US18440868
申请日：2024-02-13
发明人： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC分类号： B29C64/153 , B22F10/00 , B22F10/10 , B22F10/20 , B22F10/28 , B22F10/30 , B22F10/31 , B22F10/36 , B22F10/366 , B22F10/368 , B22F10/38 , B22F10/85 , B22F12/41 , B22F12/44 , B22F12/49 , B22F12/90 , B29C64/386 , B29C64/393 , B33Y50/02 , G05B19/418
CPC分类号： B29C64/153 , B22F10/00 , B22F10/20 , B22F10/28 , B22F10/31 , B22F10/36 , B22F10/368 , B22F12/90 , B29C64/386 , B33Y50/02 , G05B19/41875 , B22F10/10 , B22F10/30 , B22F10/366 , B22F10/38 , B22F10/85 , B22F12/41 , B22F12/44 , B22F12/49 , B22F2999/00 , B29C64/393 , G05B2219/32194 , Y02P10/25
摘要： This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
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5.发明公开公开(公告)号：US20240207971A1
公开(公告)日：2024-06-27
申请号：US18601859
申请日：2024-03-11
发明人： R. Bruce Madigan , Lars Jacquemetton , Glenn Wikle , Mark J. Cola , Vivek R. Dave , Darren Beckett , Alberto M. Castro
IPC分类号： B23K26/03 , B22F10/28 , B22F10/31 , B22F12/90 , B23K15/00 , B23K26/342 , B23K26/70 , B23K31/12 , B23K101/00 , B29C64/393 , B33Y10/00 , B33Y50/00 , B33Y50/02
CPC分类号： B23K26/032 , B22F12/90 , B23K15/0086 , B23K26/342 , B23K26/70 , B23K31/125 , B29C64/393 , B33Y10/00 , B33Y50/00 , B33Y50/02 , B22F10/28 , B22F10/31 , B22F2203/11 , B23K2101/001
摘要： This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
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