公开(公告)号：US20240367269A1

公开(公告)日：2024-11-07

申请号：US18776885

申请日：2024-07-18

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： Vivek R. Dave ,  Mark J. Cola

IPC: B23K31/12 ,  B22F10/28 ,  B22F10/31 ,  B22F10/366 ,  B22F10/38 ,  B22F12/41 ,  B22F12/49 ,  B22F12/90 ,  B23K26/03 ,  B23K26/342 ,  B33Y10/00 ,  B33Y50/02 ,  B41M5/26 ,  G01J5/00 ,  G01J5/04 ,  G01J5/07 ,  G01J5/48 ,  G01J5/80 ,  G01K11/00 ,  G01N25/72

Abstract: The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.

公开(公告)号：US12053841B2

公开(公告)日：2024-08-06

申请号：US17375983

申请日：2021-07-14

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： Vivek R. Dave ,  Mark J. Cola

IPC: B23K31/12 ,  B22F10/28 ,  B22F10/31 ,  B22F10/366 ,  B22F10/38 ,  B22F12/41 ,  B22F12/49 ,  B22F12/90 ,  B23K26/03 ,  B23K26/342 ,  B33Y10/00 ,  B33Y50/02 ,  B41M5/26 ,  G01J5/00 ,  G01J5/04 ,  G01J5/07 ,  G01J5/48 ,  G01J5/80 ,  G01K11/00 ,  G01N25/72

CPC classification number: B23K31/125 ,  B22F10/28 ,  B22F10/366 ,  B22F10/38 ,  B22F12/41 ,  B22F12/90 ,  B23K26/034 ,  B23K26/342 ,  B33Y10/00 ,  B33Y50/02 ,  B41M5/262 ,  G01J5/04 ,  G01J5/07 ,  G01K11/00 ,  G01N25/72 ,  B22F10/31 ,  B22F12/49 ,  G01J2005/0077 ,  G01J5/48 ,  G01J5/80 ,  Y02P10/25

Abstract: The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.

公开(公告)号：US12019026B2

公开(公告)日：2024-06-25

申请号：US18136750

申请日：2023-04-19

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： Vivek R. Dave ,  Mark J. Cola ,  R. Bruce Madigan ,  Alberto Castro ,  Glenn Wikle ,  Lars Jacquemetton ,  Peter Campbell

IPC: G01N21/71 ,  B33Y30/00 ,  B33Y50/00 ,  G01N21/00 ,  H01L21/66 ,  G01N21/84 ,  G06N20/00

CPC classification number: G01N21/71 ,  B33Y30/00 ,  B33Y50/00 ,  G01N21/00 ,  H01L22/12 ,  G01N2021/8411 ,  G06N20/00

Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.

公开(公告)号：US20240302286A1

公开(公告)日：2024-09-12

申请号：US18661222

申请日：2024-05-10

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： Vivek R. Dave ,  Mark J. Cola ,  R. Bruce Madigan ,  Alberto Castro ,  Glenn Wikle ,  Lars Jacquemetton ,  Peter Campbell

IPC: G01N21/71 ,  B33Y30/00 ,  B33Y50/00 ,  G01N21/00 ,  G01N21/84 ,  G06N20/00 ,  H01L21/66

CPC classification number: G01N21/71 ,  B33Y30/00 ,  B33Y50/00 ,  G01N21/00 ,  H01L22/12 ,  G01N2021/8411 ,  G06N20/00

Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.

公开(公告)号：US12172371B2

公开(公告)日：2024-12-24

申请号：US18512691

申请日：2023-11-17

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： Vivek R. Dave ,  R. Bruce Madigan ,  Mark J. Cola ,  Martin S. Piltch

IPC: B29C64/153 ,  B22F10/28 ,  B22F10/31 ,  B22F10/38 ,  B22F12/44 ,  B22F12/49 ,  B22F12/90 ,  B29C64/393 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y40/00 ,  B33Y50/02 ,  B22F3/24 ,  B22F10/12 ,  B22F10/18 ,  B22F10/25 ,  B22F10/368

Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.

公开(公告)号：US12151316B2

公开(公告)日：2024-11-26

申请号：US17895904

申请日：2022-08-25

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： Lars Jacquemetton ,  Vivek R. Dave ,  Mark J. Cola ,  Glenn Wikle ,  R. Bruce Madigan

IPC: B23K31/12 ,  B23K26/342 ,  B33Y10/00

Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.

公开(公告)号：US20240326326A1

公开(公告)日：2024-10-03

申请号：US18440868

申请日：2024-02-13

Applicant: Divergent Technologies, Inc.

Inventor： Vivek R. Dave ,  David D. Clark ,  Matias Roybal ,  Mark J. Cola ,  Martin S. Piltch ,  R. Bruce Madigan ,  Alberto Castro

IPC: B29C64/153 ,  B22F10/00 ,  B22F10/10 ,  B22F10/20 ,  B22F10/28 ,  B22F10/30 ,  B22F10/31 ,  B22F10/36 ,  B22F10/366 ,  B22F10/368 ,  B22F10/38 ,  B22F10/85 ,  B22F12/41 ,  B22F12/44 ,  B22F12/49 ,  B22F12/90 ,  B29C64/386 ,  B29C64/393 ,  B33Y50/02 ,  G05B19/418

CPC classification number: B29C64/153 ,  B22F10/00 ,  B22F10/20 ,  B22F10/28 ,  B22F10/31 ,  B22F10/36 ,  B22F10/368 ,  B22F12/90 ,  B29C64/386 ,  B33Y50/02 ,  G05B19/41875 ,  B22F10/10 ,  B22F10/30 ,  B22F10/366 ,  B22F10/38 ,  B22F10/85 ,  B22F12/41 ,  B22F12/44 ,  B22F12/49 ,  B22F2999/00 ,  B29C64/393 ,  G05B2219/32194 ,  Y02P10/25

Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.

公开(公告)号：US20240207971A1

公开(公告)日：2024-06-27

申请号：US18601859

申请日：2024-03-11

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： R. Bruce Madigan ,  Lars Jacquemetton ,  Glenn Wikle ,  Mark J. Cola ,  Vivek R. Dave ,  Darren Beckett ,  Alberto M. Castro

IPC: B23K26/03 ,  B22F10/28 ,  B22F10/31 ,  B22F12/90 ,  B23K15/00 ,  B23K26/342 ,  B23K26/70 ,  B23K31/12 ,  B23K101/00 ,  B29C64/393 ,  B33Y10/00 ,  B33Y50/00 ,  B33Y50/02

CPC classification number: B23K26/032 ,  B22F12/90 ,  B23K15/0086 ,  B23K26/342 ,  B23K26/70 ,  B23K31/125 ,  B29C64/393 ,  B33Y10/00 ,  B33Y50/00 ,  B33Y50/02 ,  B22F10/28 ,  B22F10/31 ,  B22F2203/11 ,  B23K2101/001

Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.

公开(公告)号：US20250041976A1

公开(公告)日：2025-02-06

申请号：US18922224

申请日：2024-10-29

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： Lars Jacquemetton ,  Vivek R. Dave ,  Mark J. Cola ,  Glenn Wikle ,  R. Bruce Madigan

IPC: B23K31/12 ,  B23K26/342 ,  B33Y10/00

Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.

公开(公告)号：US20240326158A1

公开(公告)日：2024-10-03

申请号：US18601845

申请日：2024-03-11

Applicant: DIVERGENT TECHNOLOGIES, INC.

Inventor： R. Bruce Madigan ,  Lars Jacquemetton ,  Glenn Wikle ,  Mark J. Cola ,  Vivek R. Dave ,  Darren Beckett ,  Alberto M. Castro

IPC: B23K26/03 ,  B22F10/28 ,  B22F10/31 ,  B22F12/90 ,  B23K15/00 ,  B23K26/342 ,  B23K26/70 ,  B23K31/12 ,  B23K101/00 ,  B29C64/393 ,  B33Y10/00 ,  B33Y50/00 ,  B33Y50/02

CPC classification number: B23K26/032 ,  B22F12/90 ,  B23K15/0086 ,  B23K26/342 ,  B23K26/70 ,  B23K31/125 ,  B29C64/393 ,  B33Y10/00 ,  B33Y50/00 ,  B33Y50/02 ,  B22F10/28 ,  B22F10/31 ,  B22F2203/11 ,  B23K2101/001

Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.