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公开(公告)号:US20060105100A1
公开(公告)日:2006-05-18
申请号:US11304046
申请日:2005-12-15
申请人: Daniel Diana , Hitesh Windlass , William Hicks , Timothy Lanfri , Michael Deangelis , Ebrahim Andideh
发明人: Daniel Diana , Hitesh Windlass , William Hicks , Timothy Lanfri , Michael Deangelis , Ebrahim Andideh
IPC分类号: B05D5/12
CPC分类号: H01L27/285 , B82Y10/00 , G11C13/0014 , G11C13/0016 , H01L51/0021
摘要: An electrode layer for a polymer memory may be implanted to increase the number of defects in the material. As a result, that same material may be utilized for the upper and lower electrodes. In particular, defects may be introduced into a TiOx layer within the electrode to match the work functions of the upper and lower electrodes.
摘要翻译: 可以植入用于聚合物存储器的电极层以增加材料中的缺陷数量。 结果,可以使用相同的材料用于上电极和下电极。 特别地,可以将缺陷引入电极内的TiO 2层以匹配上电极和下电极的功函数。
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公开(公告)号:US20050139879A1
公开(公告)日:2005-06-30
申请号:US10746073
申请日:2003-12-24
申请人: Daniel Diana , Hitesh Windlass , William Hicks , Timothy Lanfri , Michael Deangelis , Ebrahim Andideh
发明人: Daniel Diana , Hitesh Windlass , William Hicks , Timothy Lanfri , Michael Deangelis , Ebrahim Andideh
CPC分类号: H01L27/285 , B82Y10/00 , G11C13/0014 , G11C13/0016 , H01L51/0021
摘要: An electrode layer for a polymer memory may be implanted to increase the number of defects in the material. As a result, that same material may be utilized for the upper and lower electrodes. In particular, defects may be introduced into a TiOx layer within the electrode to match the work functions of the upper and lower electrodes.
摘要翻译: 可以植入用于聚合物存储器的电极层以增加材料中的缺陷数量。 结果,可以使用相同的材料用于上电极和下电极。 特别地,可以将缺陷引入电极内的TiO 2层以匹配上电极和下电极的功函数。
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公开(公告)号:US20050146923A1
公开(公告)日:2005-07-07
申请号:US10746173
申请日:2003-12-24
申请人: Daniel Diana , Douglas Janousek , Ebrahim Andideh , Mark Richards , Hitesh Windlass , Michael Deangelis
发明人: Daniel Diana , Douglas Janousek , Ebrahim Andideh , Mark Richards , Hitesh Windlass , Michael Deangelis
CPC分类号: G11C11/22
摘要: By using a plurality of relatively thin stacked diffusion layers interposed between a conductive line and a polymer layer, the diffusion of contaminates into a polymer layer from the conductive line may be reduced. This may reduce part failure during fatigue or disturb testing, for example, in ferroelectric polymer memories.
摘要翻译: 通过使用介于导电线和聚合物层之间的多个相对薄的堆叠扩散层,可以减少污染物从导电线扩散到聚合物层中。 这可以减少疲劳或干扰测试中的部件故障,例如在铁电聚合物存储器中。
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