Dual-threshold-voltage two-port sub-threshold SRAM cell apparatus
    3.
    发明授权
    Dual-threshold-voltage two-port sub-threshold SRAM cell apparatus 有权
    双阈值电压双端口子阈值SRAM单元设备

    公开(公告)号:US08072818B2

    公开(公告)日:2011-12-06

    申请号:US12654730

    申请日:2009-12-30

    IPC分类号: G11C7/00 G11C8/16

    CPC分类号: G11C8/16 G11C11/412

    摘要: The invention relates to a dual-threshold-voltage two-port sub-threshold SRAM cell apparatus. The above-mentioned apparatus comprises a first inverter, a second inverter, an access transistor and a read buffer. The first inverter and the second inverter include a plurality of first operating elements and a plurality of second operating elements for storing data. The access transistor is coupled to the first inverter and the second inverter, wherein the first operating elements and the second operating elements are high threshold voltage operating elements and the access transistor is low threshold voltage operating transistor. The read buffer is used for performing a read operation.

    摘要翻译: 本发明涉及双阈值电压双端口子阈值SRAM单元装置。 上述装置包括第一反相器,第二反相器,存取晶体管和读缓冲器。 第一反相器和第二反相器包括用于存储数据的多个第一操作元件和多个第二操作元件。 存取晶体管耦合到第一反相器和第二反相器,其中第一操作元件和第二操作元件是高阈值电压操作元件,并且存取晶体管是低阈值电压操作晶体管。 读缓冲器用于执行读操作。

    Dual-threshold-voltage two-port sub-threshold SRAM cell apparatus
    4.
    发明申请
    Dual-threshold-voltage two-port sub-threshold SRAM cell apparatus 有权
    双阈值电压双端口子阈值SRAM单元设备

    公开(公告)号:US20100172194A1

    公开(公告)日:2010-07-08

    申请号:US12654730

    申请日:2009-12-30

    IPC分类号: G11C7/00 G11C8/16

    CPC分类号: G11C8/16 G11C11/412

    摘要: The invention relates to a dual-threshold-voltage two-port sub-threshold SRAM cell apparatus. The above-mentioned apparatus comprises a first inverter, a second inverter, an access transistor and a read buffer. The first inverter and the second inverter include a plurality of first operating elements and a plurality of second operating elements for storing data. The access transistor is coupled to the first inverter and the second inverter, wherein the first operating elements and the second operating elements are high threshold voltage operating elements and the access transistor is low threshold voltage operating transistor. The read buffer is used for performing a read operation.

    摘要翻译: 本发明涉及双阈值电压双端口子阈值SRAM单元装置。 上述装置包括第一反相器,第二反相器,存取晶体管和读缓冲器。 第一反相器和第二反相器包括用于存储数据的多个第一操作元件和多个第二操作元件。 存取晶体管耦合到第一反相器和第二反相器,其中第一操作元件和第二操作元件是高阈值电压操作元件,并且存取晶体管是低阈值电压操作晶体管。 读缓冲器用于执行读操作。