公开(公告)号：US10074057B2

公开(公告)日：2018-09-11

申请号：US11134137

申请日：2005-05-20

申请人： Don W. Cochran ,  Fredrick F. Awig, II ,  Kevin E. Batty ,  Jesse C. Booher ,  David W. Cochran ,  Patrick Gilliland ,  Noel E. Morgan, Jr. ,  Thomas H. Palombo ,  Timothy SirLouis ,  Michael L. Yoder

发明人： Don W. Cochran ,  Fredrick F. Awig, II ,  Kevin E. Batty ,  Jesse C. Booher ,  David W. Cochran ,  Patrick Gilliland ,  Noel E. Morgan, Jr. ,  Thomas H. Palombo ,  Timothy SirLouis ,  Michael L. Yoder

IPC分类号： G06F3/00 ,  G06Q10/06 ,  G05B19/418

CPC分类号： G06Q10/06 ,  G05B19/41875 ,  G05B2219/31472 ,  Y02P90/22 ,  Y02P90/86

摘要： The invention provides for a graphical user interface which provides for very simple and intuitive ways of changing single or multiple inspection parameters. The graphical display immediately shows what the monitoring or inspection result would have been if the effected change had been in place during the inspection of the last “N” parts. This retrospective graphical “look-back” invokes immediate re-inspection facilitating an estimation of what the future inspection or process monitoring results will be if future production looks similar to the recent past production. The re-inspection results are immediately shown with a combination of visualization for ease of understanding and settings optimization. The visualization also shows selected other associated data to each specific inspection for ease of tracking and optimizing production processes.

公开(公告)号：US08598557B2

公开(公告)日：2013-12-03

申请号：US10519180

申请日：2003-06-20

申请人： Don W. Cochran ,  Steven D. Cech ,  Thomas H. Palombo ,  Michael L. Yoder ,  Jesse C. Booher ,  Terry L. Graves

发明人： Don W. Cochran ,  Steven D. Cech ,  Thomas H. Palombo ,  Michael L. Yoder ,  Jesse C. Booher ,  Terry L. Graves

IPC分类号： G01N21/86 ,  G01N21/00

CPC分类号： G01N21/8806

摘要： This application relates to an apparatus and method for providing patterned illumination fields for use within process control and article inspection applications. More specifically, it pertains to the use of patterned illuminators to enable visual surface inspection of polished objects such as ball bearings. The use of patterned illuminators properly disposed in relation to a polished part under inspection allows small surface imperfections such as scratches and pits to become visible against the normal surface background. The use of carefully engineered illuminators facilitates advantageous defect-site scattering from generally dark field sources. The patterned nature of the illuminators defined by this invention allows the complete surface of three-dimensional parts to be effectively highlighted using dark field illumination fields.

摘要翻译： 本申请涉及一种用于提供在过程控制和物品检查应用中使用的图案化照明场的装置和方法。 更具体地说，它涉及图案化照明器的使用以使得诸如球轴承之类的抛光物体的视觉表面检查。 相对于被检查的抛光部分适当地设置的图案照明器的使用允许诸如划痕和凹坑的小表面缺陷对于正常表面背景变得可见。 使用精心设计的照明器有助于从一般暗场光源获得有利的缺陷点散射。 由本发明限定的照明器的图案性质允许使用暗场照明场有效地突出显示三维部分的完整表面。