Hardmask compositions for resist underlayer films
    1.
    发明授权
    Hardmask compositions for resist underlayer films 有权
    用于抗蚀剂底层膜的硬掩模组合物

    公开(公告)号:US07879526B2

    公开(公告)日:2011-02-01

    申请号:US11508074

    申请日:2006-08-22

    CPC分类号: H01L21/0273 G03F7/11

    摘要: Provided herein are hardmask compositions for resist underlayer films, wherein according to some embodiments of the invention, hardmask compositions include a polymer prepared by the reaction of a compound of Formula 1 with a compound of Formula 2 (R)m—Si—(OCH3)4-m  (2) in the presence of a catalyst, wherein R is a monovalent organic group, n is an integer from 3 to 20, and m is 1 or 2; and an organic solvent. Also provided herein are methods for producing a semiconductor integrated circuit device using a hardmask composition according to an embodiment of the invention. Further provided are semiconductor integrated circuit devices produced by a method embodiment of the invention.

    摘要翻译: 本文提供了用于抗蚀剂下层膜的硬掩模组合物,其中根据本发明的一些实施方案,硬掩模组合物包括通过式1的化合物与式2(R)m-Si-(OCH 3)的化合物反应制备的聚合物, (2)在催化剂存在下,其中R为一价有机基团,n为3至20的整数,m为1或2; 和有机溶剂。 本文还提供了使用根据本发明实施例的硬掩模组合物制造半导体集成电路器件的方法。 还提供了通过本发明的方法实施例制造的半导体集成电路器件。

    Antireflective hardmask composition and methods for using same
    2.
    发明授权
    Antireflective hardmask composition and methods for using same 有权
    防反射硬掩模组​​合物及其使用方法

    公开(公告)号:US07405029B2

    公开(公告)日:2008-07-29

    申请号:US11325281

    申请日:2006-01-04

    IPC分类号: G03C1/73 G03C1/76 G03F7/095

    CPC分类号: G03F7/091

    摘要: Hardmask compositions having antireflective properties useful in lithographic processes, methods of using the same, and semiconductor devices fabricated by such methods, are provided. Antireflective hardmask compositions of the invention include: (a) a polymer component including at least one polymer having a monomeric unit of Formula (I) wherein R1 and R2 may each independently be hydrogen, hydroxyl, C1-10 alkyl, C6-10 aryl, allyl, or halo; R3 and R4 may be each independently be hydrogen, a crosslinking functionality, or a chromophore; R5 and R6 may each independently be hydrogen or an alkoxysiloxane having the structure of Formula (II), wherein at least one of R5 and R6 is an alkoxysilane; wherein R8, R9, and R10 may each independently be a hydrogen, alkyl, or aryl; and x is 0 or a positive integer; R7 may be hydrogen, C1-10 alkyl, C6-10 aryl, or allyl; and n is a positive integer; (b) a crosslinking component; and (c) an acid catalyst.

    摘要翻译: 提供了具有抗平滑印刷工艺中有用的抗反射性能的硬掩模组合物,其使用方法以及通过这些方法制造的半导体器件。 本发明的抗反射硬掩模组​​合物包括:(a)包含至少一种具有式(I)的单体单元的聚合物的聚合物组分,其中R 1和R 2各自 独立地是氢,羟基,C 1-10烷基,C 6-10芳基,烯丙基或卤素; R 3和R 4可以各自独立地为氢,交联官能团或发色团; R 5和R 6可各自独立地为氢或具有式(II)结构的烷氧基硅氧烷,其中R 5和 和R 6是烷氧基硅烷; 其中R 8,R 9和R 10可各自独立地为氢,烷基或芳基; x为0或正整数; R 7可以是氢,C 1-10烷基,C 6-10芳基或烯丙基; 并且n是正整数; (b)交联组分; 和(c)酸催化剂。

    Hardmask compositions for resist underlayer films
    3.
    发明申请
    Hardmask compositions for resist underlayer films 有权
    用于抗蚀剂底层膜的硬掩模组合物

    公开(公告)号:US20070148974A1

    公开(公告)日:2007-06-28

    申请号:US11508074

    申请日:2006-08-22

    IPC分类号: C23F1/00 H01L21/302

    CPC分类号: H01L21/0273 G03F7/11

    摘要: Provided herein are hardmask compositions for resist underlayer films, wherein according to some embodiments of the invention, hardmask compositions include a polymer prepared by the reaction of a compound of Formula 1 with a compound of Formula 2 (R)m—Si—(OCH3)4-m   (2) in the presence of a catalyst, wherein R is a monovalent organic group, n is an integer from 3 to 20, and m is 1 or 2; and an organic solvent.Also provided herein are methods for producing a semiconductor integrated circuit device using a hardmask composition according to an embodiment of the invention. Further provided are semiconductor integrated circuit devices produced by a method embodiment of the invention.

    摘要翻译: 本文提供了用于抗蚀剂下层膜的硬掩模组合物,其中根据本发明的一些实施方案,硬掩模组合物包括通过式1的化合物与式2化合物的反应制备的聚合物, (2)(2)式(2)所示的化合物,其中R 1,R 2,R 3, 在存在催化剂的情况下,<?in-line-formula description =“In-line Formulas”end =“tail”?>,其中R为一价有机基团,n为3至20的整数,m为1 或2; 和有机溶剂。 本文还提供了使用根据本发明实施例的硬掩模组合物制造半导体集成电路器件的方法。 还提供了通过本发明的方法实施例生产的半导体集成电路器件。

    Hardmask compositions for resist underlayer film and method for producing semiconductor integrated circuit device using the same
    4.
    发明申请
    Hardmask compositions for resist underlayer film and method for producing semiconductor integrated circuit device using the same 有权
    用于抗蚀剂下层膜的硬掩模组合物和使用其的半导体集成电路器件的制造方法

    公开(公告)号:US20070148586A1

    公开(公告)日:2007-06-28

    申请号:US11507701

    申请日:2006-08-22

    IPC分类号: G03C1/00

    摘要: Provided herein are hardmask compositions for resist underlayer films, wherein in some embodiments, the hardmask compositions include(a) a first polymer prepared by the reaction of a compound of Formula 1 wherein n is a number of 3 to 20, with a compound of Formula 2 (R)m—Si—(OCH3)4-m   (2) wherein R is a monovalent organic group and m is 0, 1 or 2;(b) a second polymer that includes at least one of the structures represented by Formulae 3-6;(c) an acid or base catalyst; and(d) an organic solvent.Further provided herein are methods for producing a semiconductor integrated circuit device using a hardmask composition according to an embodiment of the present invention.In addition, provided herein are semiconductor integrated circiut devices produced by a method embodiment of the invention.

    摘要翻译: 本文提供了用于抗蚀剂下层膜的硬掩模组合物,其中在一些实施方案中,硬掩模组合物包括(a)通过其中n为3至20数的式1化合物与式1化合物的反应制备的第一聚合物 2 <?in-line-formula description =“In-line Formulas”end =“lead”?(R) -Si-(OCH 3 3)其中R是一价有机基团,m是0,1或2; (b)第二聚合物,其包含由式3-6表示的至少一种结构; (c)酸或碱催化剂; 和(d)有机溶剂。 本文还提供了使用根据本发明实施例的硬掩模组合物制造半导体集成电路器件的方法。 此外,本发明提供了通过本发明的方法实施例制造的半导体集成循环装置。

    Hardmask compositions for resist underlayer film and method for producing semiconductor integrated circuit device using the same
    5.
    发明授权
    Hardmask compositions for resist underlayer film and method for producing semiconductor integrated circuit device using the same 有权
    用于抗蚀剂下层膜的硬掩模组合物和使用其的半导体集成电路器件的制造方法

    公开(公告)号:US07514199B2

    公开(公告)日:2009-04-07

    申请号:US11507701

    申请日:2006-08-22

    IPC分类号: G03F7/004 G03F7/30

    摘要: Provided herein are hardmask compositions for resist underlayer films, wherein in some embodiments, the hardmask compositions include (a) a first polymer prepared by the reaction of a compound of Formula 1  wherein n is a number of 3 to 20, with a compound of Formula 2 (R)m—Si—(OCH3)4-m  (2)  wherein R is a monovalent organic group and m is 0, 1 or 2; (b) a second polymer that includes at least one of the structures represented by Formulae 3-6; (c) an acid or base catalyst; and (d) an organic solvent. Further provided herein are methods for producing a semiconductor integrated circuit device using a hardmask composition according to an embodiment of the present invention. In addition, provided herein are semiconductor integrated circuit devices produced by a method embodiment of the invention.

    摘要翻译: 本文提供了用于抗蚀剂下层膜的硬掩模组合物,其中在一些实施方案中,硬掩模组合物包括(a)通过其中n为3至20数的式1化合物与式1化合物的反应制备的第一聚合物 2 <?in-line-formula description =“In-line Formulas”end =“lead”?(R)m-Si-(OCH3)4-m(2)<?in-line-formula description =“In 线式“end =”tail“?>其中R是一价有机基团,m是0,1或2; (b)第二聚合物,其包含由式3-6表示的至少一种结构; (c)酸或碱催化剂; 和(d)有机溶剂。 本文还提供了使用根据本发明实施例的硬掩模组合物制造半导体集成电路器件的方法。 此外,本发明提供了通过本发明的方法实施例制造的半导体集成电路器件。

    Antireflective hardmask composition and methods for using same
    6.
    发明授权
    Antireflective hardmask composition and methods for using same 有权
    防反射硬掩模组​​合物及其使用方法

    公开(公告)号:US07378217B2

    公开(公告)日:2008-05-27

    申请号:US11324950

    申请日:2006-01-04

    IPC分类号: G03C1/73 G03C1/76 G03F7/095

    CPC分类号: G03F7/091

    摘要: Hardmask compositions having antireflective properties useful in lithographic processes, methods of using the same, and semiconductor devices fabricated by such methods, are provided. Antireflective hardmask compositions of the invention include: (a) a polymer component including at least one polymer having a monomeric unit of Formula (I) wherein R1 and R2 may each independently be hydrogen, hydroxyl, alkyl, aryl, allyl, halo, or any combination thereof; R3 and R4 may each independently be hydrogen, a crosslinking functionality, a chromophore, or any combination thereof; R5 and R6 may each independently be hydrogen or an alkoxysilane group; R7 may each independently be hydrogen, alkyl, aryl, allyl, or any combination thereof; and n may be a positive integer; (b) a crosslinking component; and (c) an acid catalyst.

    摘要翻译: 提供了具有抗平滑印刷工艺中有用的抗反射性能的硬掩模组合物,其使用方法以及通过这些方法制造的半导体器件。 本发明的抗反射硬掩模组​​合物包括:(a)包含至少一种具有式(I)的单体单元的聚合物的聚合物组分,其中R 1和R 2各自 独立地是氢,羟基,烷基,芳基,烯丙基,卤素或其任何组合; R 3和R 4可各自独立地为氢,交联官能团,发色团或其任何组合; R 5和R 6可各自独立地为氢或烷氧基硅烷基; R 7可各自独立地为氢,烷基,芳基,烯丙基或其任何组合; n可以是正整数; (b)交联组分; 和(c)酸催化剂。

    ORGANOSILANE POLYMERS, HARDMASK COMPOSITIONS INCLUDING THE SAME AND METHODS OF PRODUCING SEMICONDUCTOR DEVICES USING ORGANOSILANE HARDMASK COMPOSITIONS
    7.
    发明申请
    ORGANOSILANE POLYMERS, HARDMASK COMPOSITIONS INCLUDING THE SAME AND METHODS OF PRODUCING SEMICONDUCTOR DEVICES USING ORGANOSILANE HARDMASK COMPOSITIONS 审中-公开
    有机聚合物,包括它们的HARDMASK组合物和使用有机硅复合材料制备半导体器件的方法

    公开(公告)号:US20070212886A1

    公开(公告)日:2007-09-13

    申请号:US11610786

    申请日:2006-12-14

    IPC分类号: H01L21/461 H01L21/302

    摘要: Provided herein, according to some embodiments of the invention, are organosilane polymers prepared by reacting organosilane compounds including (a) at least one compound of Formula I Si(OR1)(OR2)(OR3)R4   (I) wherein R1, R2 and R3 may each independently be an alkyl group, and R4 may be —(CH2)nR5, wherein R5 may be an aryl or a substituted aryl, and n may be 0 or a positive integer; and (b) at least one compound of Formula II Si(OR6)(OR7)(OR8)R9   (II) wherein R6, R7 and R8 may each independently an alkyl group or an aryl group; and R9 may be an alkyl group.Also provided are hardmask compositions including an organosilane compound according to an embodiment of the invention, or a hydrolysis product thereof.Methods of producing semiconductor devices using a hardmask compostion according to an embodiment of the invention, and semiconductor devices produced therefrom, are also provided.

    摘要翻译: 本文提供的根据本发明的一些实施方案是通过有机硅烷化合物制备的有机硅烷聚合物,所述有机硅烷化合物包括(a)至少一种式I的化合物<?in-line-formula description =“In-line Formulas”end =“lead” (OR 1)2(OR 3)(OR 3)R 4(I)其中R 1,R 2和R 3 可以各自独立地为烷基,并且R 4可以是 - (CH 2)n R 5, 其中R 5可以是芳基或取代的芳基,n可以是0或正整数; 和(b)至少一种式II的化合物<?在线公式描述=“In-line Formula”end =“lead”→Si(OR 6) (OR 8)R 9(II)<?in-line-formula description =“In-line Formulas”end =“tail”? >其中R 6,R 7和R 8可各自独立地为烷基或芳基; R 9可以是烷基。 还提供了包含根据本发明实施方案的有机硅烷化合物或其水解产物的硬掩模组合物。 还提供了使用根据本发明的实施例的硬掩模组合的半导体器件的制造方法以及由其制造的半导体器件。