公开(公告)号：US10930818B2

公开(公告)日：2021-02-23

申请号：US16028657

申请日：2018-07-06

Applicant: EPISTAR CORPORATION

Inventor： Chien Cheng Huang ,  Kuo-Wei Yen ,  Yu-Wei Kuo ,  Yao-Wei Yang ,  Pei-Hsiang Tseng

IPC: H01L33/14 ,  H01L33/42 ,  H01L33/44 ,  H01L33/38 ,  H01L33/00 ,  H01L33/24 ,  H01L33/32

Abstract: A light emitting device includes: a plurality of light emitting stacked layers, including a first surface and a second surface, wherein the second surface is electrically opposite to the first surface; a mesa structure; and a current blocking (CB) layer disposed on the first surface; a transparent conductive layer disposed on or above the first surface; and a first pad electrode, disposed on the transparent conductive layer and on the first surface; wherein a sidewall of the CB layer comprises a first surface section and a second surface section having different slopes.

公开(公告)号：US08749773B2

公开(公告)日：2014-06-10

申请号：US13741561

申请日：2013-01-15

Applicant: Epistar Corporation

Inventor： Tang-Chung Chao ,  Pei-Hsiang Tseng ,  Jia-Kuan Kuo ,  Guan-Hung Wu ,  Yuan-Hao Su ,  Chi-Hsin Ho ,  Chia-Liang Hsu ,  Chih-Chiang Lu

IPC: G01J1/04

CPC classification number: G01J1/0474 ,  G01J1/4228 ,  G01J2001/0481 ,  G01J2001/4252 ,  G01R31/2635

Abstract: Disclosed is a method for testing a light-emitting device comprising the steps of: providing an integrating sphere comprising an inlet port and a first exit port; disposing the light-emitting device close to the inlet port of the integrating sphere; providing a current source to drive the light-emitting device to form an image of the light-emitting device in driven state; providing an image receiving device and to receive the image of the light-emitting device, wherein the image receiving device is connected to the first exit port of the integrating sphere; and determining a luminous intensity of the light-emitting device according to the image. An apparatus for testing a light-emitting device is also disclosed. The apparatus for testing a light-emitting device comprises: an integrating sphere comprising an inlet port and a first exit port, wherein the light-emitting device is disposed close to the inlet port of the integrating sphere; an image receiving device connected to the first exit port of the integrating sphere for receiving an image of the light-emitting device; and a processing unit coupled to image receiving device for determining a luminous intensity of the light-emitting device.

Abstract translation: 公开了一种用于测试发光器件的方法，包括以下步骤：提供包括入口和第一出口的积分球; 将发光装置配置在靠近积分球的入口的位置; 提供电流源以驱动所述发光器件以在驱动状态下形成所述发光器件的图像; 提供图像接收装置并且接收所述发光装置的图像，其中所述图像接收装置连接到所述积分球的所述第一出口; 以及根据图像确定发光装置的发光强度。 还公开了一种用于测试发光器件的装置。 用于测试发光装置的装置包括：积分球，包括入口和第一出口，其中所述发光装置设置成靠近所述积分球的入口; 连接到积分球的第一出口的图像接收装置，用于接收发光装置的图像; 以及耦合到图像接收装置的处理单元，用于确定发光装置的发光强度。

公开(公告)号：US10043945B2

公开(公告)日：2018-08-07

申请号：US15626170

申请日：2017-06-18

Applicant: EPISTAR CORPORATION

Inventor： Chien Cheng Huang ,  Kuo-Wei Yen ,  Yu-Wei Kuo ,  Yao-Wei Yang ,  Pei-Hsiang Tseng

IPC: H01L33/14 ,  H01L33/00 ,  H01L33/42 ,  H01L33/44 ,  H01L33/38 ,  H01L33/32 ,  H01L33/24

Abstract: A method for fabricating a light emitting device, comprising: forming a plurality of light emitting stacked layers above a substrate; forming and patterning a current blocking (CB) layer on the light emitting stacked layers; forming a transparent conductive layer covering the light emitting stacked layers and the current blocking layer; etching the transparent conductive layer and exposing a reserved region for a first pad electrode and a mesa structure, respectively; and etching an exposed portion of the light emitting stacked layers and a portion of the current blocking layer to form a remaining current blocking layer, the mesa structure and a first opening.

公开(公告)号：US09705035B1

公开(公告)日：2017-07-11

申请号：US14985165

申请日：2015-12-30

Applicant: EPISTAR CORPORATION

Inventor： Chien Cheng Huang ,  Kuo-Wei Yen ,  Yu-Wei Kuo ,  Yao-Wei Yang ,  Pei-Hsiang Tseng

IPC: H01L33/14 ,  H01L33/00 ,  H01L33/24 ,  H01L33/32 ,  H01L33/38 ,  H01L33/42 ,  H01L33/44 ,  H01L27/15

CPC classification number: H01L33/145 ,  H01L33/0075 ,  H01L33/24 ,  H01L33/32 ,  H01L33/38 ,  H01L33/42 ,  H01L33/44 ,  H01L2933/0016 ,  H01L2933/0025

Abstract: A light emitting device, includes a substrate; a plurality of light emitting stacked layers, comprising a first surface and a second surface; a mesa structure; a current blocking (CB) layer; a transparent conductive layer; a first pad electrode and a second pad electrode; and a passivation layer, wherein the second surface is electrically opposite to the first surface, the transparent conductive layer is disposed on or above the first surface, the first pad electrode is disposed on the transparent conductive layer and on the first surface, and the second pad electrode is disposed on the second surface and on the mesa structure, the CB layer is disposed on the first surface, surrounded by the transparent conductive layer, and at a lower region of the first pad electrode, a portion of the first pad electrode is filling a first opening of the transparent conductive layer and the CB layer.

公开(公告)号：US11557694B2

公开(公告)日：2023-01-17

申请号：US17179729

申请日：2021-02-19

Applicant: EPISTAR CORPORATION

Inventor： Chien Cheng Huang ,  Kuo-Wei Yen ,  Yu-Wei Kuo ,  Yao-Wei Yang ,  Pei-Hsiang Tseng

IPC: H01L33/14 ,  H01L33/42 ,  H01L33/44 ,  H01L33/38 ,  H01L33/00 ,  H01L33/24 ,  H01L33/32

Abstract: A light emitting device includes: a plurality of light emitting stacked layers, including a first surface and a second surface, wherein the second surface is electrically opposite to the first surface; a mesa structure; a current blocking layer disposed on the first surface, including a sidewall; and a transparent conductive layer disposed on the first surface; and a first pad electrode, disposed on the transparent conductive layer and on the first surface; wherein a retract distance of the transparent conductive layer with respect to an edge of the mesa structure is less than 3 μm; and wherein a retract distance of the transparent conductive layer with respect to an edge of the sidewall of the current blocking layer is less than 3 μm.

公开(公告)号：US09404962B2

公开(公告)日：2016-08-02

申请号：US14038696

申请日：2013-09-26

Applicant: EPISTAR CORPORATION

Inventor： Ming-Hong Huang ,  Pei-Hsiang Tseng ,  Pei-Hsiu Shih ,  Chia-Hung Yu ,  Min-Shun Huang

IPC: G01R31/26 ,  G01J1/04 ,  G01J1/42

CPC classification number: G01R31/2635 ,  G01J1/0422 ,  G01J1/42 ,  G01J2001/0481 ,  G01J2001/4252

Abstract: An apparatus for measuring the optoelectronic characteristics of a light-emitting diode includes: a container including a light input port and a light output port; a measurement module connected to the light output port of the container; a sample holder under the container for holding a light-emitting diode under test, wherein a surface of the measurement module reflects more than 50% of the luminous flux generated by the light-emitting diode under test; and a light gathering unit between the container and the sample holder, wherein an interior wall of the light gathering unit reflects more than 50% of the luminous flux generated by the light-emitting diode under test.

Abstract translation: 一种用于测量发光二极管的光电特性的装置，包括：包括光输入端口和光输出端口的容器; 连接到容器的光输出端口的测量模块; 用于保持被测试的发光二极管的容器下面的样品保持器，其中测量模块的表面反映了由被测发光二极管产生的光通量的50％以上; 以及在所述容器和所述样品保持器之间的聚光单元，其中所述聚光单元的内壁反射由被测试的发光二极管产生的光通量的50％以上。

公开(公告)号：US20130201321A1

公开(公告)日：2013-08-08

申请号：US13741561

申请日：2013-01-15

Applicant: Epistar Corporation

Inventor： Tang-Chung Chao ,  Pei-Hsiang Tseng ,  Jia-Kuan Kuo ,  Guan-Hung Wu ,  Yuan-Hao Su ,  Chi-Hsin Ho ,  Chia-Liang Hsu ,  Chih-Chiang Lu

IPC: G01J1/04

CPC classification number: G01J1/0474 ,  G01J1/4228 ,  G01J2001/0481 ,  G01J2001/4252 ,  G01R31/2635

Abstract: Disclosed is a method for testing a light-emitting device comprising the steps of: providing an integrating sphere comprising an inlet port and a first exit port; disposing the light-emitting device close to the inlet port of the integrating sphere; providing a current source to drive the light-emitting device to form an image of the light-emitting device in driven state; providing an image receiving device and to receive the image of the light-emitting device, wherein the image receiving device is connected to the first exit port of the integrating sphere; and determining a luminous intensity of the light-emitting device according to the image. An apparatus for testing a light-emitting device is also disclosed. The apparatus for testing a light-emitting device comprises: an integrating sphere comprising an inlet port and a first exit port, wherein the light-emitting device is disposed close to the inlet port of the integrating sphere; an image receiving device connected to the first exit port of the integrating sphere for receiving an image of the light-emitting device; and a processing unit coupled to image receiving device for determining a luminous intensity of the light-emitting device.

Abstract translation: 公开了一种用于测试发光器件的方法，包括以下步骤：提供包括入口和第一出口的积分球; 将发光装置配置在靠近积分球的入口的位置; 提供电流源以驱动所述发光器件以在驱动状态下形成所述发光器件的图像; 提供图像接收装置并且接收所述发光装置的图像，其中所述图像接收装置连接到所述积分球的所述第一出口; 以及根据图像确定发光装置的发光强度。 还公开了一种用于测试发光器件的装置。 用于测试发光装置的装置包括：积分球，包括入口和第一出口，其中所述发光装置设置成靠近所述积分球的入口; 连接到积分球的第一出口的图像接收装置，用于接收发光装置的图像; 以及耦合到图像接收装置的处理单元，用于确定发光装置的发光强度。