Method For Determining Wave-Front Aberration Data Of A To-Be-Tested Optical System
    6.
    发明申请
    Method For Determining Wave-Front Aberration Data Of A To-Be-Tested Optical System 审中-公开
    用于确定待测试光学系统的波前畸变数据的方法

    公开(公告)号:US20160135678A1

    公开(公告)日:2016-05-19

    申请号:US14897205

    申请日:2014-06-09

    IPC分类号: A61B3/10 A61B3/00

    CPC分类号: A61B3/1015 A61B3/0025

    摘要: A method for determining wave-front aberration data of a to-be-tested optical system comprising the steps of: a) providing a wave-front sensing image of light received from the tested optical system; b) providing a model representative of the optical system with at least an optical parameter representative of said model; and c) optimizing a set of wave-front coefficient data and said at least optical parameter of said model according to a merit function calculating the merit function comprises the steps of generating a wave-front sensing modeled image of light received from said model by the at least optical parameter and the set of wave-front coefficient data, and calculating a criteria based on shape parameter data of the wave-front sensing image and shape parameter data of the wave-front sensing modeled image, so as to obtain wave-front aberration data of the tested optical system.

    摘要翻译: 一种用于确定待测光学系统的波前像差数据的方法,包括以下步骤:a)提供从所测试的光学系统接收的光的波前感测图像; b)提供具有表示所述模型的至少一个光学参数的代表该光学系统的模型; 以及c)根据计算所述优值函数的优值函数来优化一组波前系数数据和所述至少所述模型的光学参数,包括以下步骤:通过所述模型生成从所述模型接收的光的波前感测建模图像 至少光学参数和波前系数数据集,并根据波前感测图像的形状参数数据和波前感应建模图像的形状参数数据计算标准,以获得波前 测试光学系统的像差数据。