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公开(公告)号:US20240061393A1
公开(公告)日:2024-02-22
申请号:US18386099
申请日:2023-11-01
发明人: Kishore Lankalapalli , Kenneth Steffey , Keith G. Macfarlane , Paul C. Atwell , Dragos M. Stanescu , John Lucas Creachbaum , Brent Bailey , Matthew Mogensen
IPC分类号: G05B19/401 , G01B11/00 , G01B21/04
CPC分类号: G05B19/401 , G01B11/007 , G01B21/047 , G05B2219/45061 , G05B2219/40233 , G05B2219/40596 , G05B2219/37193
摘要: According to some aspects of the invention, auxiliary axis measurement systems for determining three-dimensional coordinates of an object are provided as shown and described herein. According to some aspects of the invention, methods for operating auxiliary axis measurement systems for determining three-dimensional coordinates of an object are provided as shown and described herein.
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公开(公告)号:US11930155B2
公开(公告)日:2024-03-12
申请号:US17556120
申请日:2021-12-20
IPC分类号: H04N13/254 , G01B11/25 , H04N13/239
CPC分类号: H04N13/254 , G01B11/2513 , H04N13/239
摘要: A 3D measuring system includes a first projector that projects a first line onto an object at a first wavelength, a second projector that projects a second line onto the object at a second wavelength, a first illuminator that emits a third light onto some markers, a second illuminator that emits a fourth light onto some markers, a first camera having a first lens and a first image sensor, a second camera having a second lens and a second image sensor, the first lens operable to pass the first wavelength, block the second wavelength, and pass the third light to a first image sensor, the second lens operable to pass the second wavelength, block the first wavelength, and pass the fourth light. The system further includes one or more processors operable to determine 3D coordinates based on images captured by the first image sensor and the second image sensor.
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公开(公告)号:US20220201269A1
公开(公告)日:2022-06-23
申请号:US17556120
申请日:2021-12-20
IPC分类号: H04N13/254 , G01B11/25 , H04N13/239
摘要: A 3D measuring system includes a first projector that projects a first line onto an object at a first wavelength, a second projector that projects a second line onto the object at a second wavelength, a first illuminator that emits a third light onto some markers, a second illuminator that emits a fourth light onto some markers, a first camera having a first lens and a first image sensor, a second camera having a second lens and a second image sensor, the first lens operable to pass the first wavelength, block the second wavelength, and pass the third light to a first image sensor, the second lens operable to pass the second wavelength, block the first wavelength, and pass the fourth light. The system further includes one or more processors operable to determine 3D coordinates based on images captured by the first image sensor and the second image sensor.
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公开(公告)号:US10663274B2
公开(公告)日:2020-05-26
申请号:US15873474
申请日:2018-01-17
发明人: John Lucas Creachbaum , Brent Bailey , Matthew Mogensen , William E. Schoenfeldt , Keith G. MacFarlane
摘要: An articulated arm coordinate measuring machine includes a first end that clamps to a first extension element of a first measurement probe.
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公开(公告)号:US11853028B2
公开(公告)日:2023-12-26
申请号:US17171183
申请日:2021-02-09
发明人: Kishore Lankalapalli , Kenneth Steffey , Keith G. Macfarlane , Paul C. Atwell , Dragos M. Stanescu , John Lucas Creachbaum , Brent Bailey , Matthew Mogensen
IPC分类号: G05B19/401 , G01B21/04 , G01B11/00
CPC分类号: G05B19/401 , G01B11/007 , G01B21/047 , G05B2219/37193 , G05B2219/40233 , G05B2219/40596 , G05B2219/45061
摘要: According to some aspects of the invention, auxiliary axis measurement systems for determining three-dimensional coordinates of an object are provided as shown and described herein. According to some aspects of the invention, methods for operating auxiliary axis measurement systems for determining three-dimensional coordinates of an object are provided as shown and described herein.
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公开(公告)号:US20220143812A1
公开(公告)日:2022-05-12
申请号:US17452587
申请日:2021-10-28
发明人: John Lucas Creachbaum , Brent Bailey , William E. Schoenfeldt , Fabiano Kovalski , Eduardo Laranjeira , Chad Crisostomo , Michael Bartel , Kishore Lankalapalli , Christopher M. Riehl , Matthew Mogensen
摘要: An articulated arm coordinate measuring machine includes an arm having multiple segments and an end assembly. The end assembly has multiple accessory interfaces that allow multiple accessories to be coupled to the end assembly. The accessory interfaces are configured to allow the accessories to be repeatably interchanged between the accessory interfaces.
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公开(公告)号:US20180216923A1
公开(公告)日:2018-08-02
申请号:US15873474
申请日:2018-01-17
发明人: John Lucas Creachbaum , Brent Bailey , Matthew Mogensen , William E. Schoenfeldt , Keith G. MacFarlane
IPC分类号: G01B5/008
摘要: An articulated arm coordinate measuring machine includes a first end that clamps to a first extension element of a first measurement probe.
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